Empyrean diffractometer with cu kα radiation
The Empyrean diffractometer with Cu-Kα radiation is a laboratory instrument designed for X-ray diffraction analysis. It utilizes copper-based X-ray radiation to study the structural properties of various materials. The Empyrean diffractometer provides high-resolution data on the atomic arrangement and phase composition of solid samples.
Lab products found in correlation
2 protocols using empyrean diffractometer with cu kα radiation
Comprehensive Characterization of Novel Materials
Characterization of As-Synthesized Powdery Samples
For XRD analysis, an Empyrean diffractometer with CuKα radiation from PANalytical (Almelo, The Netherlands), equipped with a hybrid monochromator for Cu and a PIXcel3D detector, was used. Scans were collected on the mildly ground powder, using Bragg–Brentano geometry between 5–80° diffraction angles, with 0.5° incidence angle, under step scan mode (0.04° scanning step size and 3 s acquisition time per scanning step).
TEM investigation was performed using the TecnaiTM G2 F30 S-TWIN high-resolution equipment from Thermo Fischer Scientific (former FEI, Hillsboro, OR, USA). Data collection was performed in transmission mode, with point and line resolutions of 2 Å and 1 Å, respectively. Before analysis, small amounts of the as-synthesized powdery sample were dispersed in ethanol under sonication for 15 min, then placed onto the carbon-coated copper grid and dried at RT.
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