The nanostructure of KL-X samples was analyzed on a JEOL 2100 HRTEM (JEOL, Peabody, MA, USA) using at least 400,000 magnification. The KL-X samples were hand-ground to fine powder in ethanol and then sprayed over a lacey copper grid. Bright-field HRTEM images were analyzed using the methods proposed by previous studies [20 (link),21 (link),22 (link),27 ,32 (link)]. The ImageJ software (available at https://imagej.nih.gov/ij/ ) was used for image processing, and the detailed processing procedures can be found in the dissertation [30 ]. The digitized HRTEM image was first converted to a negative image after contrast enhancement, followed by the filtration procedure of using the Gaussian filter. The filtered image was converted to a skeletonized image to extract carbon lattice layers. The extracted carbon layers were subjected to morphological modification to repair aggregated layers, followed by converting the image to a black-and-white skeletonized image. The average length of carbon layers (La) was calculated from software outputs. Carbon-based materials with their layer lengths less than 0.5 nm were considered as amorphous carbon and discarded from La calculation.
2100 hrtem
Manufactured by JEOL
Sourced in Japan, United States
The JEOL 2100 HRTEM is a high-resolution transmission electron microscope designed for advanced materials characterization. It provides atomic-scale imaging and analysis capabilities, enabling detailed investigation of the structure and composition of a wide range of materials.
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Lab products found in correlation
Ra 100, by Renishaw (2 mentions)
Supra 55, by Zeiss (1 mentions)
Ft ir 4100 spectrophotometer, by Jasco (1 mentions)
Jsm 6490lv, by JEOL (1 mentions)
Ultra plus field emission gun scanning electron microscope, by Zeiss (1 mentions)
Axs d8 diffractometer, by Bruker (1 mentions)
Pyris 6 tga, by PerkinElmer (1 mentions)
Model 2400 series 2 chns o analyzer, by PerkinElmer (1 mentions)
Scanning electron microscope, by Zeiss (1 mentions)
Ultima 3 x ray diffractometer, by Rigaku (1 mentions)
Miniflex 600 xrd, by Rigaku (1 mentions)
Double tilt holder, by Ametek (1 mentions)
Quanta 250 feg sem, by Thermo Fisher Scientific (1 mentions)
Irtracer 100, by Shimadzu (1 mentions)
Field emission scanning electron microscope, by JEOL (1 mentions)
Quantamaster spectrometer, by Horiba (1 mentions)
X pert pro pw3040 60, by Malvern Panalytical (1 mentions)
19 protocols using 2100 hrtem
1
HRTEM Analysis of KL-X Nanostructure
2
FE-SEM and HR-TEM Characterization of LTZ-GA-AuNPs
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Field emission scanning electron microscopy (FE-SEM) (Supra 55, Carl Zeiss, Jena, Germany) was used for observing the morphology of the LTZ-GA-AuNPs. It was equipped with a tungsten filament, which covers the sample, gives high-quality pictures with minute electrical impulses, and has an advantage over high-resolution transmission electron microscopy (HR-TEM).
HR-TEM and selected area electron diffraction (SAED) (JEOL 2100 HRTEM, Seoul, Korea) were used for the morphology study. For this, a drop of the sample was drop cast on a carbon-coated copper grid. It was then air-dried at room temperature and stained with 2% uranyl acetate.
HR-TEM and selected area electron diffraction (SAED) (JEOL 2100 HRTEM, Seoul, Korea) were used for the morphology study. For this, a drop of the sample was drop cast on a carbon-coated copper grid. It was then air-dried at room temperature and stained with 2% uranyl acetate.
3
High-Resolution Transmission Electron Microscopy
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TEM images were obtained at the Marmara Research Institute (MAM) using a JEOL-2100 HR-TEM operating at 200 kV (LaB6 filament).
4
Characterization of Silver Nanoparticles
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A drop of sonicated AgNPs was placed onto carbon-coated copper grids lined with formvar and was allowed to dry by evaporation for 20 min at Rt (23 ± 2 °C). The structural characterization and the selected-area electron diffraction (SAED) patterns of AgNPs were acquired using a JEOL 2100 HRTEM (Tokyo, Japan) with an accelerating voltage of 200 kV [35 (link)]. The size of the nanoparticles was analyzed using iTEM (Soft imaging system, Germany Version 5.0). The elemental composition of the samples was determined using energy dispersive X-ray (EDX) analysis (Inca software coupled with an Oxford X-Max 80 mm detector, Oxford, UK).
5
Characterization of ZnO Nanoparticles
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The ZnO.NPs initially analyzed by using the Rigol ultra-3660 UV-vis spectroscopy within the range 200–800 nm. Then FTIR was used to identify the functional groups and various phytochemical constituents involved in the reduction and stabilization of the synthesized nanoparticles. FTIR was carried out using the attenuated total reflectance (ATR) mode with a Jasco FTIR 4100 spectrophotometer (Japan). The results recorded in the range of 4000–400 cm−1. The powdered sample was subjected to a CuKα1-X Ray diffractometer radiation (λ = 1.5406 A°) operating at 40 kV and 30 mA with 2θ ranging from 30°–140° to confirm the presence of ZnO and analyze the crystallite structure and size. ZnO nanopowder was suspended in ethanol, sonicated then coated onto a copper grid and allowed to dry and examined by JEOL-2100 HR-TEM.
6
Characterization of LTZ-BBR@AA-AuNPs by HR-TEM
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The shape of the LTZ-BBR@AA-AuNPs was investigated by high-resolution transmission electron microscopy (HR-TEM, JEOL 2100 HRTEM, Republic of Korea). To capture a sample drop, a copper grid that had been coated with carbon was used. A 2% uranyl acetate stain was applied after air drying at room temperature.
7
Characterization of FEO-PLGA Nanoparticles
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In order to investigate the architecture and morphology of the FEO–PLGANP, field emission electron microscopes (FESEM; JEOL JSM -6490LV) were applied to analyze the data. The samples were prepared for this by mounting them on copper tubes using double-sided adhesives. After that, each sample was evaluated using a FESEM with gold at a current of 20 mA for a duration of 120 s. The voltage used was 50 kV. For morphological research, HR-TEM (JEOL 2100 HRTEM, Seoul, Korea) was employed. To achieve this goal, a portion of the sample was cast onto a carbon copper mesh. It was then allowed to dry naturally at room temperature before being dyed with 2% uranyl acetate [36 (link),37 (link)].
8
Characterization of ZnO Nanoparticles
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The generated nanoparticles were investigated using conventional procedures. ZnO nanopowders (ZnO-NPs) were suspended in ethanol, sonicated, and then deposited onto a copper grid, before drying and studying with a JEOL-2100 HR-TEM. Powder X-ray diffraction (XRD, Philips, X’pert, Cu K) and zeta potential investigations of the produced ZnO-NPs were conducted. An energy-dispersive X-ray spectrometer (EDX) was also used to determine the elemental composition of the generated particles [15 (link)].
9
Characterization of Ternary Complexes
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Elemental analysis was performed on a PerkinElmer automated model 2400 series II CHNS/O analyzer. TGA of the complexes was carried out at a 10 °C min−1 heating rate using a PerkinElmer Pyris 6 TGA up to 600 °C in a closed perforated aluminum pan under N2 gas flow. Powder diffraction patterns of the ternary systems and the solid solutions were recorded in the high angle 2θ range of 10–80° using a Bruker AXS D8 diffractometer equipped with a nickel-filtered Cu Kα radiation (λ = 1.5418 Å) at 40 kV, 40 mA at room temperature. The scan speed was 0.5 s per step at an increment of 0.01314. TEM analysis of the samples was carried out using a JEOL 1400 TEM, whereas HRTEM analysis was carried out on a JEOL 2100 HRTEM. Samples were prepared by placing a drop of the particles' dilute solution on Formvar-coated grids (150 mesh) for TEM, and holey carbon grids for HRTEM. The samples were allowed to dry completely at room temperature, viewed at accelerating voltages of 120 kV for TEM, and 200 kV for HRTEM. Images were captured digitally using a Megaview III camera; stored and measured using soft imaging systems iTEM software (TEM) and Gatan camera with Gatan software (HRTEM). SEM and EDX analyses were performed on ZEISS-Auriga Cobra SEM and ZEISS ultra plus field emission gun scanning electron microscope respectively.
10
Comprehensive Structural Characterization of CGO-10
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All the synthesized materials were structurally characterized using a Rigaku Ultima-III X-ray diffractometer with Cu-Kα radiation (λ = 1.5406 Å). Morphological and elemental analyses were carried out using a Carl Zeiss-Sigma Scanning Electron Microscope with EDAX provision. HRTEM (high resolution transmission electron microscope) images and SAED (selected area electron diffraction) patterns of CGO-10, before and after cycling, were obtained using a Jeol/JEM 2100 HRTEM. The composition and the oxidation states of different elements in CGO-10 were analyzed by X-ray photoelectron spectroscopy (XPS) with a scan range of 1200 eV. Surface area and pore size analyses of CGO-10 were carried out using N2 adsorption–desorption curves obtained by using the Brunauer–Emmett–Teller method, and the data were obtained on a Micrometrics ASAP 2010 Physisorption & Porosimetry system. Pore size distributions were obtained by employing BJH analysis on the desorption branch.
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