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Vertex 70 ftir ft raman spectrometer

Manufactured by Bruker
Sourced in Germany

The Vertex 70 FTIR-FT Raman spectrometer is a versatile laboratory instrument that combines Fourier-transform infrared (FTIR) and Raman spectroscopy capabilities. It is designed to provide high-resolution, accurate, and reliable spectroscopic analysis across a wide range of applications.

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2 protocols using vertex 70 ftir ft raman spectrometer

1

Detailed Characterization of Adsorbent Materials

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X-ray diffractograms were obtained using a PANalytical (Empyrean) X-ray diffractometer employing Cu Kα radiation (wavelength 0.154 cm−1) at an accelerating voltage 40 kV and current of 35 mA, in the 2θ range of 20° to 70° at a scan step of 0.02°. FT-IR spectra were recorded with a Bruker (Vertex 70 FTIR-FT Raman) spectrometer. The microstructures of the adsorbents were examined by high-resolution transmission electron microscopy (HRTEM, JEOL-JEM 2100), and their morphologies were characterized using field-emission scanning electron microscopy (FESEM). The BET specific surface area, specific pore volume, and pore sizes of the adsorbent materials were determined by N2 adsorption isotherms using an automatic surface analyzer (TriStar II 3020, Micromeritics, USA). Hydrodynamic particle sizes and zeta potentials were determined on a Malvern zeta sizer instrument (Malvern Instruments Ltd).
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2

FT-Raman Analysis of Treated Dentin

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The treated dentin was analyzed by FT-Raman. An FT-Raman spectrometer (Bruker VERTEX 70 FTIR/ FT-Raman spectrometer, Bruker Optics Inc., Ettlingen, Karlsruhe, Germany) with a liquid nitrogen-cooled Ge detector was used to collect the data. To excite the spectra, an air-cooled Nd: YAG laser (λ ¼ 1064.1 nm) source was used. The power of the Nd: YAG laser incident was 100 mW at a spectral resolution of 4 cm -1 . The Raman system was calibrated with a silicon semiconductor using a Raman peak of 521 cm -1 . The spectrum of the specimen was obtained and then analyzed by selecting a range from 400 to 4000 cm -1 . Distribution of the organic components was examined using the peak area of the CH stretch band between 2940 and 2880 cm -1 , and this band was used for image analysis. A qualitative spectral analysis of the changes in organic content was performed. The spectra in the region of interest, between 2880 and 2940 cm -1 , were analyzed with analytical software (Microcal Origin ® 5.0 Software, Inc., Westborough, USA). The CH stretching mode (2880 and 2940 cm -1 ) was used in this study to detect the collagen component as a signature of organic content in dentin samples. 18 (link)
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