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Multimode 8 afm instrument

Manufactured by Bruker
Sourced in United States

The MultiMode 8 AFM is an atomic force microscope (AFM) instrument designed for high-resolution imaging and analysis of surface topography and properties. It enables the observation and characterization of samples at the nanoscale level.

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5 protocols using multimode 8 afm instrument

1

Atomic Force Microscopy of NHA and polyNIPAM

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A Bruker Multimode 8
AFM instrument (Billerica, Massachusetts, USA) was used to acquire
AFM images to determine the thickness of the NHA (Figure S2) and to investigate the morphology of the polyNIPAM
monolayer on a surface (Figure S7). Cantilevers
for measurements were ScanAsyst Air with a resonance frequency of
70 kHz and a force constant of 0.4 N/m for dry conditions and ScanAsyst
Fluid with a resonance frequency of 150 kHz and a force constant of
0.7 N/m for liquid conditions. All measurements were carried out with
the ScanAsyst tapping mode. For liquid measurements, 20 μL of
H2O was dropped on the sample and the tip was completely
immersed.
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2

Microtome-Enabled Surface Probing

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A microtome (Wetzlar, Hesse, Germany, Leica company) was used to ensure that each blend would have a smooth surface, at room temperature. The surface was probed using a Multimode-8 AFM instrument (Bruker Nano Inc. Company, Billerica, MA, USA) using force taping mode, at a scan rate of 0.401 Hz.
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3

Characterization of Gold Nanoparticles

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UV–vis spectra were recorded
using either Varian Cary 300 (Agilent) (400–900 nm) spectrophotometer
or StellarNet (StellarNet Inc, Florida) (200–1080 nm) systems.
Atomic force microscopy (AFM) measurements were collected using
the amplitude-modulated (peak force tapping) mode of a multimode-8
AFM instrument (Bruker, Santa Barbara, CA). Digital transmission electron
microscopy (TEM) was done with a Thermo Scientific Talos L120C (Experimental
details in Supporting Information). Crystal
sizes of seeds and stars were determined with powder X-ray diffraction
(XRD), using a Bruker D8 ADVANCE with a Lynx-Eye strip detector. The
seeds and stars were prepared and then washed with water to remove
polymers (Experimental details in Supporting Information).
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4

Characterization of Conducting Polymer Films

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The samples
were obtained by spraying PPy@LCNFs (0.4 wt %, 3 mL) on ITO substrates
(7 × 7 mm2, thickness ∼800 nm) at 120–150
°C with a standard airbrush gun. The C-AFM was performed with
a MultiMode 8 AFM instrument equipped with a Nanoscope V controller
(Bruker, Santa Barbara, CA). Images of 2 × 2 μm2 size (resolution 512 × 512 pixels) were obtained using antimony-doped
silicon cantilevers (SCM-PICV2, Bruker) with Pt–Ir coating
at a 1 Hz scan speed, 100 nA V–1 current sensitivity,
and 1 V DC current bias. The resulting images were analyzed by MountainsSPIP
image analysis software with current scale cutoff values ranging from
0 to 100 nA.
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5

Atomic Force Microscopy of PHB-Nanocomposite

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AFM images of PHB and nanocomposite with 5 wt % BC (PHB‒5BC) were captured using a MultiMode 8 AFM instrument (Bruker, Santa Barbara, CA, USA) in peak force QNM mode. Measurements were carried out at room temperature with a scan rate of 0.7–0.8 Hz and a scan angle of 90° using an etched silicon tip (nominal radius 8–10 nm) with a cantilever length of 225 μm and a resonance frequency of about 75 kHz. The data and images were processed with NanoScope software version 1.20.
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