Phase structures of the as-prepared catalyst powders were determined by XRD on Bruker (D8 Focus, Cu Kα radiation). Program FullProf was employed for the diffraction refinement. SEM images were performed on a SU-8010 SEM, whereas high resolution TEM images equipped with EDS were conducted on a Tecnai G2 F20 U-TWIN TEM. XPS measurements of the catalysts were carried out on a Kratos Axis Ultra DLD instrument. The obtained XPS spectra were calibrated by referencing C 1 s to 284.6 eV, and simulated using the XPSPEAK41 software. We analyzed the specific surface areas by Brunauer Emmet Teller (BET) system with N2 as the adsorptive medium. Approximately 2.0 g samples were weighed and degassed at 250 °C for 4 h before nitrogen physisorption at the temperature of liquid nitrogen (77 K). The ability of perovskites to adsorb OH− after exposure to water (100% humidity) at room temperature for 2 h was estimated from the Fourier transform infrared spectra (FTIR, Nicolet iS50, Thermo Scientific America). Oxygen temperature programmed desorption (O2-TPD) measurement was surveyed to analysis the oxygen desorption properties.
D8 focus
Manufactured by Bruker
Sourced in Germany, United States
The D8 Focus is an X-ray diffractometer designed for phase identification and quantification, as well as structural analysis of crystalline materials. It features a fixed-anode X-ray tube and a position-sensitive detector, enabling efficient data collection. The D8 Focus provides high-quality X-ray diffraction data for a wide range of applications in materials science, geology, and related fields.
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Lab products found in correlation
S 4800, by Hitachi (18 mentions)
Jem 2100f, by JEOL (10 mentions)
Su8010, by Hitachi (6 mentions)
Jem 2100, by JEOL (4 mentions)
Escalab 250xi, by Thermo Fisher Scientific (3 mentions)
Uv 2550 pc, by Shimadzu (3 mentions)
F 4600, by Hitachi (3 mentions)
K alpha, by Thermo Fisher Scientific (3 mentions)
Axis ultra dld, by Shimadzu (2 mentions)
Tensor 2, by Bruker (2 mentions)
Jsm 6701f, by JEOL (2 mentions)
Labraw hr800 pl testing system, by Horiba (2 mentions)
Excalibur 3100, by Agilent Technologies (2 mentions)
Cary 7000, by Agilent Technologies (2 mentions)
Regulus 8100, by Hitachi (2 mentions)
S 4800 sem, by Hitachi (2 mentions)
Phi 1600 esca system, by Physical Electronics (2 mentions)
Escalab 250, by Thermo Fisher Scientific (2 mentions)
Multimode 8, by Bruker (2 mentions)
Sta 449c, by Netzsch (2 mentions)
115 protocols using d8 focus
1
Characterization of Perovskite Catalyst Powders
2
Characterization of Pd-Doped Porous Microspheres
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The sizes and shape of TDI droplets, the microspheres PPM and Pd@PPM were examined under optical microscope (OM, BX-51, Olympus). Their size (Dn) and size distribution (Dw/Dn) were obtained by counting at least 200 microspheres. Surface and inner morphology of the microspheres were observed under scanning electronic microscope (SEM, Quanta FEG-250, FEI). Their porous property was examined by BET (Nora 200E, Quantachrome) and mercury intrusion porosimetry (AutoPore IV 9500, Micromeritics). In addition, Pd@PPM was also examined using Inductive Coupled Plasma Optical Emission Spectrometer (ICP-OES, Optima 5300DV, Perkin-Elmer) and EDS (X-Max50, Oxford) analysis to affirm the presence of Pd. Temperature-programmed reduction (TPR) and chemisorption were performed using AutoChem II 2920 for the measurement of Pd dispersion. Powder X-ray diffraction (XRD) was done on a diffractometer (D8 Focus, Bruker).
3
Surface Morphology and Wettability Analysis
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The surface morphology of the sample after the single nanosecond pulse laser processing was investigated by scanning electron microscopy (SEM, Phenom ProX, Phenon World, Eindhoven, The Netherlands). X-ray diffraction (XRD, D8 FOCUS, Bruker, Billerica, MA, USA), point energy-dispersive X-ray spectroscopy (EDS, Phenom ProX, Phenon World, Netherlands), and Fourier-transform infrared (FTIR, Cary 630 FTIR, Agilent Technologies, Santa Clara, CA, USA) were used to evaluate chemical compositions on the surface. The wettability on the laser-treated surface was measured by an optical contact angle and interface tension meter (SL200KB, Kino, Kailua Kona, HI, USA) with a 5-μL volume of deionized (DI) water droplets.
4
Multimodal Characterization of Nanomaterials
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Zeta-potential and dynamic light scattering (DLS) measurements were tested using Zetasizer Nano series (Malvern ZEN3700,UK); SEM images were obtained by the scanning electron microscope (HITACHI S-4800, HITACHI, JAPAN); TEM images were gotten by the transmission electron microscope (HT7700, JEOL, JAPAN); Energy-dispersive spectroscopy was performed by JEM-2100 F transmission scanning electron microscope (JEM-2100 F, JEOL, JAPAN); X-ray diffraction pattern (PXRD) was obtained using the X-ray diffractometer (Bruker, D8 focus, Germany); DCF fluorescence was acquired by fluorescence spectrometer (Cary Eclipse, Shanghai, China); the surface functional group was measured by 3100 Fourier transform infrared spectrometer (FT-IR, Varian, USA); elastic modulus was tested using atomic force microscope (Bruker, Dimension FastscanBio, USA); enzyme standard instrument was used to the absorbance (EPOCH2, BioTek, Germany); the hyperspectral images were from Hyperspectral imager (Cytoviva, USA); fluorescence images of cell were obtained by Inverted fluorescent microscope (Nikon ECLIPSE Ti-S, Japan).
5
Phytosome Crystallinity Assessment by XRD
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The powder X-ray diffraction (XRD) pattern of the phytosome was achieved by an X-ray diffractometer (D8 Focus, Bruker, Germany) equipped with a Cu-Ka radiation source. The experimentation was directed at room temperature in Bragg-Brentano geometry through 2θ ranging from 5° to 80° employing a scanning rate of 0.02°/min. The crystallinity of the phytosome was assessed using origin software.
6
Evaluating CYT Drug Dispersion in BDS
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The drug dispersion state in CYT-loaded BDS was assessed by an X-ray diffractometer suitable for powders (D-8 Focus, Bruker, Billerica, MA, USA). The diffractograms were obtained from 5° to 60° in ⊖/2⊖ at 2°/min, 40 kV voltage and 30 mA current at room temperature. XRD analyses were performed on pure CYT and CYT-loaded powders immediately after their preparation, as well as after one month of sample storage (at room temperature).
7
Crystalline Structure Analysis of CNTs
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The crystalline structure of CNTs was identified by X-ray diffraction using a Bruker D8 Focus (Bruker, Madison, WI, USA), with high-intensity monochromatic Cu Kα radiation (λ = 1.5418 Å), operating at 2 ≤ 2θ/° ≤ 120 and scan rate of 2°/min.
8
Characterization of Perovskite Solar Cells
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A field emission scanning electron microscope (SEM) (SIGMA, Zeiss, Jena, Germany) was used to characterize the perovskite film. An XRD spectrum was obtained using an X-ray diffractometer (D8 Focus, Bruker, Dresden, Germany) from a perovskite film deposited on ITO/LT-TiO2/PC61BM. The absorption spectra of perovskite films were obtained by an ultraviolet (UV) visible absorption spectrometer (Avantes, Apeldoorn, the Netherlands), and the photoemission spectra (PL spectra) of perovskite films were measured by a fluorescence spectrometer (HORIBA Jobin Yvon, Paris, France). Finally, a solar simulator (Sol 3A, Oriel, New port, RI, USA) was used to measure the current–voltage (J–V) characteristic curve of the solar cell under standard AM 1.5 G light.
9
Powder X-ray Diffraction Analysis
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The crystal structure of the sample was analyzed using a powder crystal X-ray diffractometer (D8-Focus, Bruker) with Cu Kα radiation (λ = 1.54056 nm) operated at 40 mA and 40 kV at a scanning rate of 4° min−1 from 10° to 80°.
10
Microencapsulate Structural Analysis
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