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Nanoscope iiid

Manufactured by Bruker
Sourced in United States

The Nanoscope IIId is a scanning probe microscope system developed by Bruker. It is designed to perform high-resolution imaging and analysis of surface structures and properties at the nanoscale level. The Nanoscope IIId utilizes the principles of atomic force microscopy (AFM) to generate detailed topographical images and provide information about the physical characteristics of a sample.

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5 protocols using nanoscope iiid

1

Atomic Force Microscopy of Sol-Gel Coatings

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AFM images were acquired in the tapping mode using a Nanoscope IIId scanning probe microscope with Extender Module (Bruker, Billerica, MA, USA) in the dynamic modus. An active vibration isolation platform was applied. Olympus etched silicon cantilevers were used with a typical resonance frequency in the range of 200–400 kHz and a spring constant of 42 N/m. The set-point amplitude of the cantilever was maintained by the feedback circuitry to 80% of the free oscillation amplitude of the cantilever. All samples were measured at room temperature in air. The sample was first adjusted with an optical light microscope (Nanoscope, Optical Viewing System).
For this study, mica plates (Nanowords) were coated by undoped and Photolon doped sol–gel matrices, as well as undoped and Protoporphyrin IX (PPIX) doped sol–gel layers. The distribution of PS molecules on the coating surface was analyzed.
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2

Atomic Force Microscopy of Dendrimer Samples

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AFM images were recorded in air with a Nanoscope IIId scanning probe microscope with Extender Module (Bruker). Standard tapping mode AFM probes (NanoAndMore, Watsonville, California, USA) were used with a resonance frequency in the range of 200–400 kHz, with a typical spring constant of 42 N/m and with a nominal apex radius of silicon tip curvature around 7 nm. The samples with dendrimers were placed on freshly cleaved ultra-clean mica (Nano and More) and incubated at room temperature for 60 sec. The mica discs were then rinsed with purified 18.2 MΩ deionized water and dried using gentle nitrogen gas flow. All samples were measured at room temperature in air. Structural analysis and height measurements of acquired images were performed with Nanoscope v.6.13 software (Watsonville, California, USA).
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3

Tapping Mode Atomic Force Microscopy

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The measurements were carried out using a Nanoscope IIId scanning probe microscope with Extender Module (Bruker, Billerica, MA, USA) in an air atmosphere at room temperature using the tapping mode. Silicon scanning probes with a resonance frequency in the range of 183–192 kHz, elastic constant of 43 N/m and tip diameter of 10 nm were used for the measurements. The set value of the probes’ vibration amplitude was maintained, by the feedback system, up to 80% of the free oscillation amplitude of the probe. The scanning frequency was between 0.500 and 1.500 Hz, the scanning angle was 0°.
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4

Assembly of CdTe/CdS QDs on Au NPs

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Au NPs with different sizes were formed on quartz substrates by ion sputtering in a vacuum chamber and then high temperature rapid thermal annealing (RTA) process. 3-Mercaptopropionic acid (MPA) capped CdTe/CdS QDs were synthesized via a modified reported method [8 (link)]. CdTe/CdS QDs were assembled on Au NPs/quartz substrate by layer-by-layer method [9 ]. Positively charged poly(diallyldimethylammonium chloride) (PDDA) and negatively charged poly(sodium 4-styrenesulfonate) (PSS) bilayer dielectric were served as spacer layer between the Au NPs and QDs. The thickness of spacer layer can be tuned and controlled by the number of PDDA/PSS bilayers.
The absorption spectra were recorded on 3100 UV-visible spectrometer. Room temperature PL spectra were measured by Jobin Yvon Fluolrolog-3 system equipped with a 450 W Xe lamp as the excitation sources. The fluorescence decay curves from time-resolved PL measurements were recorded by an Edinburgh FLS920 fluorescence spectrophotometer based on the time-correlated single photon counting (TCSPC). Topographic images were obtained by tapping mode AFM (Bruker, Nanoscope III-D) under a clean, dry ambient atmosphere.
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5

Peptide Self-Assembly Dynamics Monitored by AFM

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A commercial AFM instrument (Nanoscope IIId, Bruker) equipped with either a J-scanner (125 μm × 125 μm) or a E-scanner (12 μm × 12 μm) and a liquid cell was used. All images were captured with a scan rate at 1–2 Hz. Experiments were performed in tapping mode under liquid phase. Silicon nitride cantilevers with a nominal spring constant of 0.35 N/m (SNL-10, Bruker) were used. HOPG (ZYB grade, 12 mm × 12 mm × 2 mm, Bruker) were freshly cleaved by adhesive tape before each experiment. All the real time imaging process was conducted as the following: (1) the peptide solution was slowly added into the liquid chamber through a connected tube; (2) the final concentration of the peptide in the liquid chamber was calculated by considering the previous volume of the buffer solution. AFM imaging started before adding the peptides into the liquid chamber in order to capture the whole dynamics of the peptide assembly. AFM images were processed by using NanoScope Analysis (version 1.40) that was supplied by the AFM manufacture.
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