Nchv model cantilevers
The NCHV model cantilevers are high-performance atomic force microscopy (AFM) probes designed for high-resolution imaging and nanoscale measurements. They feature a sharp silicon nitride tip, a high-aspect-ratio cantilever, and a specialized coating to optimize performance and durability. The core function of these cantilevers is to enable precise topographical and physical property mapping of samples at the nanoscale.
4 protocols using nchv model cantilevers
Free-standing Graphene Oxide Membrane Characterization
Atomic Force Microscopy of Human RBCs
Characterization of Bacterial Cellulose Composites
Characterizing CNF Fibre Morphology
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