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Ac240ts r3

Manufactured by Oxford Instruments
Sourced in United States

The AC240TS-R3 is a high-performance AC susceptometer system designed for the measurement of magnetic susceptibility. It features a closed-cycle refrigerator for sample cooling down to 3.5 K and an electromagnet capable of applying a DC field up to 1 T. The system is equipped with a precision lock-in amplifier for accurate measurements of the sample's magnetic response.

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9 protocols using ac240ts r3

1

Nanomaterial Size Characterization by AFM

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Cleaned nanomaterials were diluted to low concentrations in DI water and deposited on graphite substrate for atomic force microscopy (AFM) imaging. Samples were imaged in AC mode in air using an Asylum Cypher ES instrument and an AC mode tip (Asylum Research, silicon probe model AC240TS-R3 with 2 N/m nominal spring constant). The images acquired were analyzed using Gwyddion software. A minimum of 100 individual nanomaterials per sample were analyzed for size calculation.
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2

Tapping Mode AFM Imaging in PBS

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AFM images were acquired in PBS buffer using a MFP3D-SA system (Asylum Research, Santa Barbara, CA) equipped with a medium soft silicon cantilever (model AC240TS-R3, Asylum Research, Santa Barbara, CA) with a spring constant of 2 N/m. Images were recorded in tapping mode AFM with a set point of 250–300 mV and a scan rate of 1.5 Hz. AFM images were analyzed using Gwyddion ver. 2.49.
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3

Characterization of Purified Exosomes by AFM

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Purified exosomes were diluted 1:10 in de-ionized water, added to a clean glass dish, and allowed to air-dry for 2 h before drying under a gentle stream of nitrogen. Exosomes deposited on glass dish were characterized using an Atomic Force Microscope (Model: MFP-3D BIOTM, Asylum Research, Santa Barbara, CA). Images were acquired in AC mode in air using a silicon probe (AC240TS-R3, Asylum Research) with a typical resonance frequency of 70 kHz and spring constant of 2 Nm−1. Height and amplitude images were recorded simultaneously at 512 × 512 pixels with a scan rate of 0.6 Hz. Image processing was performed using Igor Pro 6.34 (WaveMetrics, Portland, OR) and analyzed with Image J.
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4

AFM Characterization of Peptide Morphology

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Atomic force microscope
(AFM) characterization of sample morphology was carried out on a freshly
cleaved mica substrate. The viscous peptide solution (5 μL)
was dropcast on mica and then blotted with filter paper after 2 min.
The samples were dried under a low vacuum overnight. The AFM images
were taken on a Dimension Icon SPM Vecco using a tapping mode under
ambient conditions. Scans were rastered using silicon-coated aluminum
probes (Asylum research AC240TS-R3) with a tip radius of 9 ±
2 nm and 70 kHz resonant frequency.
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5

Soft Cantilevers for AFM Imaging

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Soft cantilevers (AC240TS-R3, Asylum Research) with a nominal force constant of 2 N/m and resonance frequencies of 70 kHz were used. The free-air amplitude of the tip was calibrated with the Asylum Research software, and the spring constant was captured by the thermal vibration method. The sample was imaged with a Cypher ES scanner using intermittent tapping (AC-air topography) mode. Images were analyzed using Asylum research v.16 and Gwyddion v.2.55.
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6

Imaging Biomolecules on Mica Surface

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Samples (50 μl) were applied to a freshly cleaved mica plate. After 1 min, the mica plate was washed gently with water and dried in a stream of argon gas. The samples were imaged in air, at room temperature, under controlled humidity in tapping mode using a MFP-3D-BIO Atomic Force Microscope (Asylum Research, Goleta, CA, USA) equipped with an Olympus AC240TS-R3 (Asylum Research, Goleta, CA) silicon nitride probe (k = ∼1.7 N/m).
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7

AFM Characterization of Nanomaterials

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The AFM measurement in this study was performed using a commercial
AFM system OXFORD INSTRUMENTS Asylum Research Jupiter XR with a Fast
Force Map mode (Set point 100 nN, Points:256, Force Dist:1.50 μm,
Z rate:200 Hz). A cantilever used in this mode was made by Asylum
Research (AC240TS-R3) with a nominal spring constant of 2 N m–1 and a tip radius of 7 nm. Before the measurement,
the actual spring constant of the cantilever was measured by following
Sader’s method.
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8

Atomic Force Microscopy Surface Morphology

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Surface morphology measurements were performed by utilizing a commercial atomic force microscopy (Cypher-ES, Asylum Research, US). The contact mode is chosen in the measurements with a common silicon cantilever (Asylum Research, AC240TS-R3) whose tip radius and force constant are 7 nm and 2 N m−1, respectively.
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9

Atomic Force Microscopy Measurement

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The AFM measurement
in this study was performed using a commercial AFM system OXFORD INSTRUMENTS
Asylum Research Jupiter XR with a Fast Force Map mode (Setpoint 100
nN, Points: 256, ForceDist: 1.50 μm, Z rate:
200 Hz). The cantilever used in this mode was made of Asylum Research
(AC240TS-R3) with a nominal spring constant of 2 N m–1 and a tip radius of 7 nm. Before the measurement, an actual spring
constant of the cantilever was measured by Sader’s method.
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