Multi mode nanoscope 4 scanning probe microscope
The Multi-Mode/NanoScope IV Scanning Probe Microscope is a high-performance, versatile instrument used for nanoscale imaging and analysis. It combines multiple scanning probe microscopy techniques, including atomic force microscopy (AFM) and scanning tunneling microscopy (STM), to provide detailed surface characterization at the nanometer scale.
4 protocols using multi mode nanoscope 4 scanning probe microscope
Virus Imaging on Mica by AFM
Chitosan Nanoparticle Characterization by SEM and AFM
Particle size and ζ-potential of the prepared particles were measured at 20 °C using a Malvern Mastersizer 3000HSA, UK. Scanning electron microscopy (SEM) (Zeiss EVO50, Germany) and atomic force microscopy (AFM) (MultiMode/NanoScope IV scanning probe microscope, Santa Barbara, Bruker, USA) were used to characterise the morphology of the prepared particles. AFM experiments were performed, as described elsewhere [5] . The images were then processed and height profiles extracted using NanoScope Analysis software (V 1.4, Bruker, CA, USA). SEMsamples were prepared as follows: One drop of the nanoparticle suspension was placed on a slide cover and left to dry overnight. The slide cover was then attached to an aluminium stud using double-sided adhesive conductive carbon tape. The sample was coated with a layer of gold/ palladium using sputter coating and then analysed under high vacuum at a voltage of 20 kV.
Liposome Characterization by AFM
µm, l = 140-180 µm, w = 48-52 µm, υ0 = 288-338 kHz, k = 12-103 N m -1 , R < 7 nm; model: OTESPA, Bruker, France), and an RMS amplitude of 0.8 V. The images were subsequently processed and dimensions (particle diameters) measured using NanoScope Analysis software (V1.4, Bruker, Santa Barbara, CA, USA).
Atomic Force Microscopy of Membrane Entities
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