The synthesis of ZnO-NP involves the mixing of neem leaf extract (25 ml) and 1 M Zn(CH₃CO₂)₂·2H₂O (25 ml) in 1:1 ratio. The solution was maintained at pH 7.0 by adding sodium hydroxide (0.5 M) dropwise at room temperature. This step leads to precipitate formation. The precipitate obtained was filtered followed by repeated washing with water, followed by ethanol for removing the remaining impurities. The resulting material was put in an oven (60 °C) overnight for drying, grounded to fine powder. Finally, calcination was performed (400 °C) for 1 h in Muffle furnace under standard conditions. JEOL JEM-2100F transmission electron microscope was used to evaluate the size of ZnO-NPs obtained by dropping the nanoparticle solution on carbon-coated copper grids at a 15 kV voltage under normal atmospheric conditions.
Jem 2100f transmission electron microscope
The JEM-2100F is a transmission electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of specimens at the nanoscale level. The JEM-2100F utilizes an accelerated electron beam to interact with the sample, producing magnified images that can reveal detailed structural and compositional information about the specimen.
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Synthesis of ZnO Nanoparticles Using Neem Leaf Extract
The synthesis of ZnO-NP involves the mixing of neem leaf extract (25 ml) and 1 M Zn(CH₃CO₂)₂·2H₂O (25 ml) in 1:1 ratio. The solution was maintained at pH 7.0 by adding sodium hydroxide (0.5 M) dropwise at room temperature. This step leads to precipitate formation. The precipitate obtained was filtered followed by repeated washing with water, followed by ethanol for removing the remaining impurities. The resulting material was put in an oven (60 °C) overnight for drying, grounded to fine powder. Finally, calcination was performed (400 °C) for 1 h in Muffle furnace under standard conditions. JEOL JEM-2100F transmission electron microscope was used to evaluate the size of ZnO-NPs obtained by dropping the nanoparticle solution on carbon-coated copper grids at a 15 kV voltage under normal atmospheric conditions.
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TEM was performed on a JEOL JEM-2100F transmission electron microscope. The suspension was spotted on formvar-coated Ni or Cu grids, and the samples on Ni or Cu grids were then dried under vacuum.
XPS was performed using K-Alpha X-ray photoelectron spectroscopy (Thermo Fisher Scientific, USA). Binding energies were referenced to the C 1s line at 284.8 eV from adventitious carbon. The samples for XPS were re-dissolved with deionized water three times to get rid of the unattached Mb–Cu molecules.
ICP-AES was performed on an Agilent ICP-OES 730 Spectrometer operating with a plasma gas flow of 15 L/min, an auxiliary gas flow of 1.5 L/min, and an atomizing gas pressure of 200 kPa. The sample for ICP-AES was dissolved in double-distilled water and lyophilized.
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