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Jem 2100f transmission electron microscope

Manufactured by JEOL
Sourced in Japan, United States

The JEM-2100F is a transmission electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of specimens at the nanoscale level. The JEM-2100F utilizes an accelerated electron beam to interact with the sample, producing magnified images that can reveal detailed structural and compositional information about the specimen.

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99 protocols using jem 2100f transmission electron microscope

1

Synthesis of ZnO Nanoparticles Using Neem Leaf Extract

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The leaves of neem (Azadirachta indica) were washed with distilled water three times. An aqueous extract was obtained by boiling fresh neem leaves (25 g) by boiling in glass beaker (250 ml). The process was extended by boiling the neem leaves at 60 °C in double distilled water (100 ml) for 20 min. The formation of aqueous solution was confirmed by the appearance of brown color. This extract was kept at room temperature for cooling and then filtered by Whatman filter paper 1. This extract was stored in a refrigerator to pursue the subsequent experiments [17 ].
The synthesis of ZnO-NP involves the mixing of neem leaf extract (25 ml) and 1 M Zn(CH₃CO₂)₂·2H₂O (25 ml) in 1:1 ratio. The solution was maintained at pH 7.0 by adding sodium hydroxide (0.5 M) dropwise at room temperature. This step leads to precipitate formation. The precipitate obtained was filtered followed by repeated washing with water, followed by ethanol for removing the remaining impurities. The resulting material was put in an oven (60 °C) overnight for drying, grounded to fine powder. Finally, calcination was performed (400 °C) for 1 h in Muffle furnace under standard conditions. JEOL JEM-2100F transmission electron microscope was used to evaluate the size of ZnO-NPs obtained by dropping the nanoparticle solution on carbon-coated copper grids at a 15 kV voltage under normal atmospheric conditions.
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2

Multimodal Characterization of Nanomaterials

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Transmission electron microscopy (TEM) images were taken with a JEM-2100F transmission electron microscope (JEOL) operating at 200 kV. Energy dispersive X-ray (EDX) mapping images were obtained on a JEM-2100F equipped with an energy dispersive X-ray analyzer. Inductively coupled plasma optical emission spectrometry (ICP-OES) were performed on a Thermo Scientific ICAP 6300 Duo View Spectrometer. Dynamic light scattering (DLS) and zeta potential measurements were performed on a Malvern Zetasizer Nano ZS90. X-ray diffraction (XRD) patterns were recorded on a Philips XPert PRO MPD X-ray diffractometer operated at 35 kV and 45 mA with Cu-Kα radiation. The upconversion luminescent properties were studied using a Horiba Jobin Yvon FluoroLog3 spectrometer equipped with a 980 nm diode laser as excitation. The downconversion luminescent properties were studied using an Acton SP2300i spectrometer equipped with an InGaAs linear array detector (Princetion OMA-V) and using a 980 nm diode laser as excitation. NIR fluorescence images of the downconversion emission were obtained using 2D InGaAs array (Ninox 640, Raptor Photonics) with 640 × 512 pixel using a 980 nm diode laser as excitation. Raman spectra were obtained with polarized incident laser light (λ = 532 nm) on Jobin Yvon T64000.
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3

Characterization of Nanomaterial Properties

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Field emission transmission electron microscopy (FE-TEM) and electron diffraction (ED) pattern images were taken using a JEM-2100F transmission electron microscope (JEOL; Tokyo, Japan). UV-vis absorption spectra were recorded using a UV-visible spectrophotometer (Beckman Coulter; Fullerton, CA, USA). A fiber-coupled continuous-wave diode laser (808 nm, 10 W) was purchased from Changchun New Industries Optoelectronics Technology Co., Ltd. (Changchun, China). Thermographic images and changes of temperature were taken by a FLIR ONE (FLIR Systems, Wilsonville, OR, USA).
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4

TEM Imaging of Samples

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The samples were observed using JEM-2100F Transmission electron microscope (JEOL, USA) at accelerating voltage of 200 kV.
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5

Comprehensive Materials Characterization Protocol

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SEM images were taken by a Leo Supra 35VP field emission scanning electron microscope. A JEOL JEM 2100F transmission electron microscope was used for TEM imaging, acquiring SAED patterns, and HR-TEM analysis. XRD patterns were recorded with a Bruker AXS advance powder diffractometer equipped with a Siemens X-ray gun, using Cu Kα radiation (λ = 1.5406 Å). The investigation of thermal properties was carried out using TGA (DTG-60H, Shimadzu) under air with a ramp rate of 1 °C min−1. Raman spectroscopy measurements were taken using a Renishaw InVia Reflex Raman microscopy system with a 532 nm laser. FT-IR spectra were collected using a Bruker Tensor 27 instrument. The XPS spectra were recorded using a VG Scientific-ESCA Lab 250 XPS spectrometer with a monochromatic Al Kα radiation source (1486.8 eV). The Spectral Data Processor (SDP, V.4.1) software was employed for curve fittings and atomic percent calculations of XPS spectra. The ICP-OES tests were performed using a Varian Vista-Pro Axial. The ICP-OES samples were digested in 2 mL 35% H2O2 and 4 mL 65% HNO3 using a microwave digestion system (MarsXpress, CEM Corp.).
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6

Comprehensive Characterization of Materials

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Powder X-ray diffraction (XRD) patterns of the samples were obtained on a RIGAKU D/max-2550 PC X-ray diffractometer with Cu Kα radiation (λ = 0.15406 nm) at a scan rate of 0.02°/s32 (link). Fourier transform infrared (FTIR) spectra of the samples were obtained between 4000 and 400 cm−1 on a Nicolet Nexus 670 FTIR spectrophotometer using KBr pellets. Scanning electron microscopy (SEM) images were obtained with a JEOL JSM-6360LV scanning electron microscope at an accelerating voltage of 5 kV, which equipped with energy dispersive spectrometer (EDS). Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) were operated with a JEOL JEM-2100F transmission electron microscope at an acceleration voltage of 200 kV42 (link). The N2 adsorption-desorption isotherms were record at 77 K and analyzed using an ASAP 2020 surface area analyzer. X-ray photoelectron spectroscopy (XPS) measurements were performed using an ESCALAB 250 spectrometer. The UV-vis diffuse reflectance spectra (UV-vis DRS) were obtained with a Shimadzu UV2450 UV-vis spectrophotometer, and barium sulfate was used as reference. The photoluminescence (PL) experiment were conducted on a Hitachi F-4500 fluorescence spectrometer using an excitation wavelength of 254 nm3. The contact angles of the samples were measured using the sessile-drop technique using a goniometer (GBX, France).
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7

Characterization of RNase A@ZIF-8 Nanoparticles

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The scanning electron microscopic (SEM) and transmission electron microscopic (TEM) images were observed through XL-30 ESEM FEG scanning electron microscope (FEI Company, USA) and JEM-2100F transmission electron microscope (JEOL, Japan), respectively. The elements mapping of RNase A@ZIF-8 nanoparticles was detected using energy dispersive spectrometer (EDS) attached to XL-30 ESEM FEG scanning electron microscope. Fourier Transform infrared spectroscope (FT-IR) was recorded in the range of 4000 to 600 cm−1 on a Bruker V70 Instrument (Bruker, Germany). The thermogravimetric analysis (TGA) was conducted on a TA Q500 thermal gravimetric analyzer (TA instrument, USA) at a heating rate of 10°C/min. The circular dichroism (CD) analysis was carried out on a JASCO J-810 spectrometer (JASCO Inc., Tokyo, Japan) with a scanning speed of 100 nm/min. The X-ray diffraction (XRD) analysis was performed on a Bruker D8 Advance (Bruker, Germany) with an acceleration voltage of 50 kV (200 mA, λ=1.54184 Å). Nitrogen adsorption and desorption experiments were conducted on a Micromeritics ASAP 2020 adsorptometer (Norcross, GA, USA), and the surface area of ZIF-8 and RNase A@ZIF-8 nanoparticles was determined through the Brunauer-Emmett-Teller (BET) method. The confocal fluorescence images were acquired by LSM 710 confocal laser scanning microscope (Carl Zeiss Microscopy LLC, Jena, Germany).
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8

Optical Characterization of Rare Earth Nanoparticles

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Luminescence spectra of the RENPs were measured following excitation with a 980 nm diode laser (FC-980, Changchun Optics, China) using a phosphorescence spectrometer (FSP920, Edinburgh, UK). Transmission electron microscopy (TEM) measurements were performed on a 200 kV JEM-2100F transmission electron microscope (JEOL, Japan). Nanoparticle hydrodynamic size and zeta potential were measured using dynamic light scattering (DLS) on a Zetasizer Nanoparticle analyzer series (Malvern Instruments Ltd., England).
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9

Glycerol-Induced Morphological Changes in V. alginolyticus

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To observe the morphological changes related to cell growth on glycerol as the carbon source, V. alginolyticus strains LHF01 and LHF02 were cultured in TYS medium supplemented with 20 g/L glycerol for 24 h for TEM observation. The strains cultivated in TYS medium without an additional carbon source were used as the control group. The cell culture was centrifuged to collect the bacterial pellet, washed 1–2 times with PBS and mixed with a pre-cooled fixative solution, and stored at 4 °C for at least 12 h. The fixative solution was poured out, then the samples were rinsed 3 times with a 0.1 M, pH7.0 phosphate buffer. Then, the samples were fixed with a 1% osmium acid solution for 2 h, rinsed 3 times with 0.1 M, pH7.0 phosphate buffer, and dehydrated with graded ethanol solutions and acetone. The samples were then embedded in a mixture of embedding agent and acetone, sliced using a Leica Ultracut S ultramicrotome, and stained with a lead citrate solution and a uranyl acetate 50% ethanol saturated solution. The prepared sample was visualized using a JEM-2100F transmission electron microscope (JEOL Ltd., Tokyo, Japan).
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10

Characterization of Mb-Cu Nanoconjugates

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FTIR spectroscopy was carried out on a Spectrum Two Spectrometer operating at a resolution of 4 cm−1 over 4000–450 cm−1; the sample for FTIR spectroscopy was lyophilized and ground with KBr to prepare KBr pellets.
TEM was performed on a JEOL JEM-2100F transmission electron microscope. The suspension was spotted on formvar-coated Ni or Cu grids, and the samples on Ni or Cu grids were then dried under vacuum.
XPS was performed using K-Alpha X-ray photoelectron spectroscopy (Thermo Fisher Scientific, USA). Binding energies were referenced to the C 1s line at 284.8 eV from adventitious carbon. The samples for XPS were re-dissolved with deionized water three times to get rid of the unattached Mb–Cu molecules.
ICP-AES was performed on an Agilent ICP-OES 730 Spectrometer operating with a plasma gas flow of 15 L/min, an auxiliary gas flow of 1.5 L/min, and an atomizing gas pressure of 200 kPa. The sample for ICP-AES was dissolved in double-distilled water and lyophilized.
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