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Ac160ts cantilever

Manufactured by Olympus
Sourced in Japan

The AC160TS cantilevers are designed for atomic force microscopy (AFM) applications. They feature a silicon tip with a typical radius of 7 nm and a spring constant of 26 N/m. The cantilevers have a length of 160 μm and a width of 50 μm.

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8 protocols using ac160ts cantilever

1

Characterizing Fibronectin Nanoscale Matrices

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Atomic force microscopy (AFM MFP3D–Bio, Asylum Research) was used to determine the thickness of the fibronectin lattice structure that comprises the NMBS. Alexa-555-FN NMBS (2 µm by 2 µm square lattice with 2 µm thick FN filaments) were patterned onto PIPAAm-coated glass coverslips. The FN-NMBS was scanned using AC mode with AC160TS cantilevers (Olympus Corporation) and the Asylum Research AFM Software version 14.23.153. A scan area of 20 µm by 20 µm was chosen to get a sufficient representation of the NMBS thickness. Line profiles of the height trace were obtained using the IGOR Pro 6.1 software (WaveMetrics) from the AFM height channel. Thickness was determined by calculating the difference between the minimum and maximum height from the line profiles. Peaks within the height trace denote the NMBS FN and the valleys represent the void space within the NMBS lattice. The spacing between the NMBS features also confirms the fabrication dimensions and accuracy.
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2

AFM Imaging of M13 DNA on HOPG

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All AFM images were collected using the RIBM HS-AFM 1.0 instrument. The AFM measurements were performed in the tapping mode using Olympus AC 160 TS cantilevers; the resonant frequency and the spring constant of the cantilevers were 300 kHz and 42 N/m, respectively, and the tip’s radius was 9±2 nm. Measurements in solution were performed in a liquid flow cell. AFM images were processed using the plane subtraction and row alignment by a median of differences methods within the Gwyddion package.51 Prior to each measurement, all HOPG samples were freshly cleaved using the scotch tape method.32 (link) In the case of AFM imaging in air, a 1 μl droplet of buffer solution was placed on top of the HOPG sample. The sample was incubated for 10 minutes, rinsed with DI water and blowdried with nitrogen gas. For AFM imaging in solution, the buffer solution was introduced into the liquid flow cell; the flow cell was placed on top of the freshly cleaved HOPG surface. The buffer solution containing 1 M KCl and 1 mM EDTA was prepared by mixing stock solutions of KCl and EDTA. The M13 DNA sample was first heated to 95 C, kept at that temperature for 20 minutes and then rapidly cooled on ice. The final sample was prepared by mixing DNA with the 1 KCl/1 mM EDTA buffer to achieve 0.1 ng/μl concentration of DNA.
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3

Atomic Force Microscopy of Coverslips

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Tapping-mode AFM images of clean coverslips were obtained in air with a multimode atomic force microscope driven by a NanoScope V controller and E scanner (Veeco/Bruker, Santa Barbara, CA), using AC160TS cantilevers (Olympus, Tokyo, Japan) with a typical resonance frequency of 300 kHz and a nominal spring constant of 42 N/m. Images were analyzed using NanoScope software (version 7).
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4

Characterization of Fibronectin Nanofiber Morphology

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AFM (MFP3D-Bio, Asylum Research) was used to analyze the nanostructure and quantify the morphology of FN nanofibers both pre-release and post-release. The FN nanofibers were scanned in air using AC mode with AC160TS cantilevers (Olympus Corporation). Nanofibers pre-release were scanned on the PIPAAm surface whereas post-release FN nanofibers were first allowed to adsorb back onto the glass coverslip, washed three times with ddH2O to remove the dissolved PIPAAm, and then dried in a 65 °C oven. FN nanofibers pre-release were scanned with a scan size of 512 × 512 lines over a scan area of ~52 μm × 52 μm and FN nanofibers post-release were scanned with a scan size of 512 × 512 lines over a scan area of ~15 μm × 15 μm. High-resolution AFM images were obtained using a scan size of 1024 × 1024 lines over a scan area of 3 μm × 3 μm for the nanofibers pre-release (zoomed in to a 500 × 500 nm area after acquisition) and 2 × 2 μm for nanofibers post-release.
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5

Atomic Force Microscopy of Coverslips

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Tapping-mode AFM images of clean coverslips were obtained in air with a multimode atomic force microscope driven by a NanoScope V controller and E scanner (Veeco/Bruker, Santa Barbara, CA), using AC160TS cantilevers (Olympus, Tokyo, Japan) with a typical resonance frequency of 300 kHz and a nominal spring constant of 42 N/m. Images were analyzed using NanoScope software (version 7).
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6

Atomic Force Microscopy of Cellulose Nanocrystals

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The CNCs were prepared for atomic force microscopy (AFM) by placing a drop of 0.5 mg mL–1 CNC solution on a piece of freshly cleaved mica. The drop was left for five minutes before the surface was rinsed with distilled water. Atomic force microscopy measurements were carried out on the Cypher S (Oxford Instruments Asylum Research, Santa Barbara, USA) in amplitude modulated ac mode (commonly known as tapping mode). The probe used was an AC160TS cantilever from Olympus, Japan.
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7

Adhesion Characterization of PDMS/PA Fiber Mats

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The study of adhesion characteristics at the macro level was done using a standard test method ASTM D6862. A peel resistance at 90° of peeling between PDMS/PA fiber mats and the PE or PU substrate was performed using a Peel Tester LF-Plus (Lloyd Instruments, West Sussex, UK) equipped with a 1 KN cell. The adhesion joints (19 mm width) were delaminated at 10 mm/min to ensure a steady peeling. Six independent measurements were performed to obtain average values for peel resistance.
AFM (MFP-3D (Asylum research, USA) was also used to analyze the adhesion characteristics of the prepared samples in the nano-scale using a force volume measurement technique. Adhesion force mapping was carried out in a contact mode using AC160TS cantilever (Al reflex coated Veeco model—OLTESPA, Olympus). Height and adhesion force mapping was done by the application of 32 × 32 contacts between AFM tip and the sample from the 20 µm x 20 µm surface area.
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8

Nanomechanical Characterization of Thin Films

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AFM measurements were performed in the ambient at 22 °C on Park Systems NX20 Atomic Force Microscope (Park Systems Co., Suwon, Korea). High resolution phase maps were acquired using a novel higher eigenmode approach [V. V. Korolkov et al., Nat. Commun. 10, 1537 (2019)] with Multi75Al-G (Budget Sensors, Bulgaria) cantilevers excited at the 3rd eigenmode. Nanomechanical data was collected with PinPoint Nanomechanical mode [S. Kim et al., Nanomaterials 11(6), 1593 (2021)] on the same instrument. PinPoint Nanomechanical mode allows simultaneous acquisition of high-resolution topographical maps and force-distance curves at every single pixel of an image. Further automated analysis of these force-distance curves provides with nanomechanical properties such as modulus, adhesion, deformation, stiffness, and energy dissipation. For all nanomechanical measurements we used an AC160TS cantilever (Olympus, Japan) with a nominal spring constant of 42 N/m. Each probe was calibrated prior to measurements to find the spring constant and optical sensitivity. The C16-IDTBT thin film sample investigated was “stabilized”, i.e., it was left to sweat out solvent molecules from its surface for a few weeks before the measurement could be reliably done.
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