Ac160ts cantilever
The AC160TS cantilevers are designed for atomic force microscopy (AFM) applications. They feature a silicon tip with a typical radius of 7 nm and a spring constant of 26 N/m. The cantilevers have a length of 160 μm and a width of 50 μm.
8 protocols using ac160ts cantilever
Characterizing Fibronectin Nanoscale Matrices
AFM Imaging of M13 DNA on HOPG
Atomic Force Microscopy of Coverslips
Characterization of Fibronectin Nanofiber Morphology
Atomic Force Microscopy of Coverslips
Atomic Force Microscopy of Cellulose Nanocrystals
Adhesion Characterization of PDMS/PA Fiber Mats
AFM (MFP-3D (Asylum research, USA) was also used to analyze the adhesion characteristics of the prepared samples in the nano-scale using a force volume measurement technique. Adhesion force mapping was carried out in a contact mode using AC160TS cantilever (Al reflex coated Veeco model—OLTESPA, Olympus). Height and adhesion force mapping was done by the application of 32 × 32 contacts between AFM tip and the sample from the 20 µm x 20 µm surface area.
Nanomechanical Characterization of Thin Films
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