Extender module

AFM images were acquired in the tapping mode using a Nanoscope IIId scanning probe microscope with Extender Module (Bruker, Billerica, MA, USA) in the dynamic modus. An active vibration isolation platform was applied. Olympus etched silicon cantilevers were used with a typical resonance frequency in the range of 200–400 kHz and a spring constant of 42 N/m. The set-point amplitude of the cantilever was maintained by the feedback circuitry to 80% of the free oscillation amplitude of the cantilever. All samples were measured at room temperature in air. The sample was first adjusted with an optical light microscope (Nanoscope, Optical Viewing System).
For this study, mica plates (Nanowords) were coated by undoped and Photolon doped sol–gel matrices, as well as undoped and Protoporphyrin IX (PPIX) doped sol–gel layers. The distribution of PS molecules on the coating surface was analyzed.

AFM images were recorded in air with a Nanoscope IIId scanning probe microscope with Extender Module (Bruker). Standard tapping mode AFM probes (NanoAndMore, Watsonville, California, USA) were used with a resonance frequency in the range of 200–400 kHz, with a typical spring constant of 42 N/m and with a nominal apex radius of silicon tip curvature around 7 nm. The samples with dendrimers were placed on freshly cleaved ultra-clean mica (Nano and More) and incubated at room temperature for 60 sec. The mica discs were then rinsed with purified 18.2 MΩ deionized water and dried using gentle nitrogen gas flow. All samples were measured at room temperature in air. Structural analysis and height measurements of acquired images were performed with Nanoscope v.6.13 software (Watsonville, California, USA).

The measurements were carried out using a Nanoscope IIId scanning probe microscope with Extender Module (Bruker, Billerica, MA, USA) in an air atmosphere at room temperature using the tapping mode. Silicon scanning probes with a resonance frequency in the range of 183–192 kHz, elastic constant of 43 N/m and tip diameter of 10 nm were used for the measurements. The set value of the probes’ vibration amplitude was maintained, by the feedback system, up to 80% of the free oscillation amplitude of the probe. The scanning frequency was between 0.500 and 1.500 Hz, the scanning angle was 0°.