After freeze-drying, the C-CS and C-CS-Cys hydrogels were characterized by FT-IR and XPS using a Nicolet-5700 Fourier Infrared Spectrometer and a PHI-5400 Perkin Elmer X-ray photoelectron spectrometer, respectively. C-CS-Tris sample was re-dried after dissolution in Tris-base solution.
Phi 5400
The PHI-5400 is a X-ray photoelectron spectroscopy (XPS) system manufactured by PerkinElmer. It is used for the analysis of the elemental composition and chemical state of a material's surface. The PHI-5400 provides high-resolution data on the surface properties of samples.
Lab products found in correlation
7 protocols using phi 5400
Catechol-chitosan hydrogel synthesis
After freeze-drying, the C-CS and C-CS-Cys hydrogels were characterized by FT-IR and XPS using a Nicolet-5700 Fourier Infrared Spectrometer and a PHI-5400 Perkin Elmer X-ray photoelectron spectrometer, respectively. C-CS-Tris sample was re-dried after dissolution in Tris-base solution.
Quantification of Drug-loaded Coatings
Material Characterization via ATR-FTIR, XPS, and Contact Angle
Characterization of Magnetic Nanocomposites
Comprehensive Characterization of Graphene Oxide
Scanning electron microscopy (SEM, Ultra-55 FESEM, ZEISS) images were taken for the surface of the Nylon substrate before and after the GO coating. Cross-sectional images were obtained to evaluate the thickness of the GO coating. The zeta potential of GO sheets in the aqueous solutions were measured using a Zetasizer Nano-ZSP analyzer (Malvern, Westborough, MA). The interlayer spacing of GO in the dry state and solvents were characterized by X-ray diffraction (XRD, Bruker D8 Discover GADDS) with a graphite-monochromated Co Ka radiation (λ = 0.179 nm).
X-ray Photoelectron Spectroscopy Analysis of Dentin
Comprehensive Characterization of Nanostructures
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