Nanosem 50

An X-ray diffractometer
(D8/Advance) with Cu Kα radiation (λ = 1.5406 Å)
was used to obtain X-ray diffraction (XRD) patterns. Laser excitation
(532 nm wavelength) in a confocal Raman microscope instrument (Renishaw
in Via) was used to record the Raman spectra of the samples. An X-ray
photoelectron spectrometer (Thermo Scientific Escalab 250Xi) was used
to characterize the sample composition. A field emission scanning
electron microscope (Nova Nano SEM 50) and transmission electron microscope
(FEI Talos F200X) were used for microscopic morphological characterization.
An UV–vis spectrometer (Shimadzu UV-3600plus) was used to record
the UV–vis diffuse reflectance spectra (UV–vis DRS).
Room temperature photoluminescence (PL) spectra were recorded using
a Hitachi F-7000 fluorescence spectrophotometer. Electron spin resonance
(Bruker A300-10/12) was used for radical characterization. We have
used a traditional three-electrode system using a potentiostat (CH
Instruments, CHI 660) (with applied potential 0.2 V, Ag/AgCl reference
electrode, platinum counter electrode, and the working electrode prepared
with the synthesized samples. ) immersed in saturated KCl solution
beneath optical irradiation to perform the photocurrent measurement.^{22 (link)}