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Oxford diffraction supernova diffractometer

Manufactured by Rigaku
Sourced in United Kingdom

The Oxford Diffraction SuperNova diffractometer is a versatile X-ray diffraction instrument designed for single-crystal analysis. It provides high-quality data collection and analysis capabilities for a wide range of sample types and research applications.

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9 protocols using oxford diffraction supernova diffractometer

1

Single-crystal X-ray Diffraction Analysis

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X-ray single-crystal diffraction data were collected on a Rigaku Oxford Diffraction SuperNova diffractometer equipped with Atlas CCD detector and micro-focus Cu-Kα radiation (λ = 1.54184Å) for BTI and molecule T3. For molecules T1 and T2, crystal data were collected on a BRUKER KappaCCD diffractometer, equipped with a graphite monochromator utilizing MoKα radiation (λ = 0.71073Å). The structures were solved by direct methods and refined on F2 by full matrix least-squares techniques using SHELX programs (G. M. Sheldrick 2014–2016, SHELXT 2014/5 and SHELXL 2016/4). All non-H atoms were refined anisotropically and multiscan empirical absorption was corrected using CrysAlisPro program (CrysAlisPro, Agilent Technologies, V1.171.40.45, 2019) for BTI and molecule T3 and using SADABS program (Sheldrick, Bruker, 2008) for molecules T1 and T2. The H atoms were included in the calculation without refinement. CCDC 2083265 (BTI), 2116980 (T1), 2116981 (T2) and 2116982 (T3) contains the supplementary crystallographic data for this paper.
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2

X-ray Crystallographic Structure Analysis

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X-ray data were collected at 120 K
on a Rigaku Oxford Diffraction Supernova diffractometer by using Cu
Kα radiation (λ = 1.5418 Å). The structure was solved
by direct methods using ShelXT and refined using a full-matrix least-squares
refinement using ShelXL, both within the Olex2 (v1.5) software. Crystallographic
data are presented in Supporting Information, Tables S3 and S4.
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3

Single-Crystal X-Ray Structural Analysis

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Single-crystal X-ray data for complexes 2a–2f were collected at 173 K with Mo Kα radiation (λ = 0.71073 Å) on a Rigaku Saturn 724/724+ CCD diffractometer or Cu Kα radiation (λ = 1.54178 Å) on a Rigaku Oxford Diffraction SuperNova diffractometer. The selected crystal was mounted onto a nylon loop in polyisobutene and immersed in a low-temperature (173 K) stream of dry nitrogen gas during data collection. All structures were solved by direct methods, and non-hydrogen atoms were located from difference Fourier maps. Non-hydrogen atoms, otherwise noticed, were subjected to anisotropic refinement by full-matrix least-squares on F2 by using the SHELXTL program29 and Olex2 program.30 All figures were drawn by using X-seed program.31 CCDC numbers for reported complexes are ; 1558954 (2a in space group Cmcm), ; 1558955 (2a in space group P1), ; 1558956 (2b), ; 1558958 (2c), ; 1558960 (2d), ; 1558959 (2e) and ; 1558963 (2f). The refinement details and crystal data for 2a–2f are summarized in the ESI.
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4

Single-crystal X-ray Diffraction of Compound 1-2

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Diffraction data for compound 1-2 were collected using a Rigaku Oxford Diffraction SuperNova diffractometer with MoK α radiation (Table 1). An Oxford Cryosystems Cryostream 700+ low temperature device was used to maintain a crystal temperature of 120 K. The structures were solved using ShelXT and refined with ShelXL interfaced through Olex2. 12, 13 All nonhydrogen atoms were refined using anisotropic displacement parameters. H atoms were placed in calculated positions geometrically and refined using the riding model. CCDC: 1847956 and 1847957. † Powder XRD measurements were performed using a Bruker D2 PHASER spectrometer, and are shown in Fig. S1. †
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5

Structural Characterization of Organic Compounds

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Diffraction data for samples 1-9 were collected using a Rigaku Oxford Diffraction SuperNova diffractometer with MoK α (1-4, 6-9) and CuK α (5) radiation, and are given in Tables S1 andS2. † An Oxford Cryosystems Cryostream 700+ low temperature device was used to maintain a crystal temperature of 120 K. The structures were solved using ShelXT or ShelXS by direct (2-7, 9) or intrinsic phasing solution methods (1, 8) and refined with version 2016/6 of ShelXL interfaced with Olex2. 25, 26 All non-hydrogen atoms were refined using anisotropic displacement parameters. C-bound H atoms were placed in calculated positions geometrically and refined using the riding model. In structures 1, 2, 4, 6 and 9, O-bound H atoms were identified from a difference Fourier map and refined freely. In 3, 5, 7 and 8, O-bound H atoms were identified from a difference Fourier map and refined as riding, with geometric restraints. CCDC 1579642-1579645 & 1579647-1579651. †
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6

Structural Determination of Halide Complexes

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Details about data collection and solution refinement are given in Table S1. Data collections were performed on a Rigaku Oxford Diffraction SuperNova diffractometer equipped with an Atlas CCD detector and micro-focus Cu-Kα radiation (λ = 1.54184 Å). The structures were solved by intrinsic phasing and refined on F² by full matrix least-squares techniques with SHELX programs (SHELXT 2018/2 and SHELXL 2018/3) [50, 51] using the ShelXle and the Olex2 graphical user interfaces. [52, 53] All non-H atoms were refined anisotropically and absorption was corrected by multiscan empirical absorption using spherical harmonics with CrysAlisPro program for 1-CuCl2, 1-ZnCl2, 1-CdCl2 and 1-HgCl2. The H atoms were placed at calculated positions and refined using a riding model. Crystallographic data for the five structures have been deposited with the Cambridge Crystallographic Data Centre, deposition numbers CCDC for 1-CuCl2 : 2203496; 1-ZnCl2 : 2203494 ; 1-CdCl2: 2203493; 1-HgCl2: 2203497; 1-CdCl2-I3 : 2203495.These data can be obtained free of charge from CCDC, 12 Union road, Cambridge CB2 1EZ, UK (e-mail: deposit@ccdc.cam.ac.uk or http://www.ccdc.cam.ac.uk).
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7

Synthesis and Characterization of Isatin Derivatives

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Isatin derivatives 2ad and thioproline 1 are commercially available (Sigma-Aldrich Chemie GmbH, Riedstr, Germany; and Alfa Aesar GmbH & Co KG, Karlsruhe, Germany). 1H-NMR and 13C-NMR spectra were recorded in DMSO-d6 (Jeol Spectrometer (400 MHz), (Jeol, Tokyo, Japan). X-ray diffraction data were collected on a Rigaku Oxford Diffraction Supernova diffractometer and processed with CrysAlisPro software v. 1.171.41.93a (Rigaku Oxford Diffraction, Yarnton, UK, 2020) using Cu Kα radiation.
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8

Single Crystal X-ray Diffraction of 14

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Low temperature single crystal X-ray diffraction data of 14 were collected using a (Rigaku) Oxford Diffraction SuperNova diffractometer. Raw frame data were reduced using CrysAlisPro, and the structures were solved using ‘Superflip’[55 ] before refinement with CRYSTALS[56 (link)] as per the SI (CIF). Crystallographic data have been deposited with the Cambridge Crystallographic Data Centre as supplementary publication no. CCDC 2169044 and is accessible via www.ccdc.cam.ac.uk/data_request/cif.
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9

X-Ray Crystallographic Structure Determination

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A suitable crystal was selected and mounted on a Rigaku Oxford Diffraction Supernova diffractometer. Data were collected using Cu Kα radiation at 100 K. Structures were solved with the ShelXT [37 ] or ShelXS structure solution programs via Direct Methods and refined with ShelXL [37 ] on Least Squares minimisation. Olex2 [38 (link)] was used as an interface to all ShelX programs. CCDC deposition numbers for those structures shown in Figure 4, Figure 5, Figure 6 = 1997431−1997433.
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