Oxford diffraction supernova diffractometer
The Oxford Diffraction SuperNova diffractometer is a versatile X-ray diffraction instrument designed for single-crystal analysis. It provides high-quality data collection and analysis capabilities for a wide range of sample types and research applications.
9 protocols using oxford diffraction supernova diffractometer
Single-crystal X-ray Diffraction Analysis
X-ray Crystallographic Structure Analysis
on a Rigaku Oxford Diffraction Supernova diffractometer by using Cu
Kα radiation (λ = 1.5418 Å). The structure was solved
by direct methods using ShelXT and refined using a full-matrix least-squares
refinement using ShelXL, both within the Olex2 (v1.5) software. Crystallographic
data are presented in Supporting Information,
Single-Crystal X-Ray Structural Analysis
Single-crystal X-ray Diffraction of Compound 1-2
Structural Characterization of Organic Compounds
Structural Determination of Halide Complexes
Synthesis and Characterization of Isatin Derivatives
Single Crystal X-ray Diffraction of 14
X-Ray Crystallographic Structure Determination
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