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Jsm 7001f field emission scanning electron microscope

Manufactured by JEOL
Sourced in Japan

The JEOL JSM-7001F is a field emission scanning electron microscope (FESEM) designed for high-resolution imaging of samples. It features a Schottky field emission gun that provides a stable electron beam for improved image quality and resolution. The JSM-7001F is capable of capturing detailed images of a wide range of materials and samples at magnifications up to 100,000x.

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7 protocols using jsm 7001f field emission scanning electron microscope

1

Comprehensive Materials Characterization Protocol

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SEM imaging was performed in a JSM-7001F field emission scanning electron microscope (JEOL, Peabody, MA) operating at an accelerating voltage of 5–15 kV. XRD patterns were recorded by a Rigaku diffractometer with Cu Kα radiation (λ = 1.542 Å) operating at 70 kV and 50 mA with a step size of 0.02°, at a scanning rate of 0.1°/sec in the 2θ range 10–60°. TEM images were obtained on a JEOL JEM-2100 microscope using an accelerating voltage of 200 kV. CD spectropolarimetry was performed using a J-815 spectropolarimeter (JASCO, Easton, MD). The spectra were recorded between 190 and 260 nm with a step size of 0.5 nm and a scan rate of 50 nm/min. AFM images were obtained by using a NanoScopeIIIa scanning probe microscope system (Digital Instruments, Tonawanda, NY) with a tapping mode etched silicon probe (model OTESPA-10) in air at scanning rates of 0.5–1.0 Hz for different resolutions. FTIR spectra were acquired from a Nicolet 4700 Spectrometer with a Gladi-ATR diamond crystal accessory. Thermogravimetry (TGA) analysis was performed on a Q5000 IR (TA Instruments, New Castle, DE) with a heating rate of 50 °C/min, under an air flow of 20 mL/min from 30 to 900 °C. The hardness and elastic modulus were measured at 25 test points in each sample (n = 3) using a nanoindenter (Agilent-MTS XP) with a Berkovich tip.
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2

Scanning Electron Microscopy of SNCs

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The morphologies (deformation) of SNCs were observed by scanning electron microscopy (SEM) using a JEOL JSM-7001F field emission scanning electron microscope (JEOL, Tokyo, Japan) with a hot (Schottky) electron gun. SNC suspension (20 μl) was placed on a clean coverglass and air-dried. The coverglass was then mounted onto a SEM stub and coated with a thin layer (~10 nm) of iridium using a Quorum Q150T metal coater (Quorum Technologies, Lewes, UK), followed by plasma cleaning using an Evactron 25 plasma cleaner (XEI Scientific, Redwood City, CA, USA).
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3

Nematode SEM Preparation Protocol

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Some nematodes (three males and six females) were preserved for scanning electron microscopy (SEM) examination. Initially, they were fixed in 70% ethanol in the field; later in the laboratory, they were dehydrated in an ethanol series and critical-point dried with carbon dioxide (Emitech K850X, Quorum Technologies Ltd., Laughton, East Sussex, UK). Finally, the worms were mounted on stubs with conductive adhesive tape and colloidal silver, coated with carbon in an Emitech K950X evaporator (Quorum Technologies Ltd.), and examined using a JSM-7001F field emission scanning electron microscope (JEOL Ltd., Tokyo, Japan) operated at an accelerating voltage of 10 kV in the “Centres Científics i Tecnològics de la Universitat de Barcelona (CCiTUB)”.
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4

Nanoparticle Characterization by SEM

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The nanoparticle suspension was diluted to 0.02 mg/mL and ultra-sonicated for 30 minutes. A small droplet of suspension was placed on a silicon wafer and dried in a vacuum oven for at least 7 hours at 70°C. The sample was then splutter coated with platinum at 15 mA for 50 seconds (Bal-Tec MED 020; Leica Microsystems, North Ryde, NSW, Australia). Images were obtained using a JSM-7001F Field Emission scanning electron microscope (JEOL, Tokyo, Japan) at different accelerating voltages.
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5

Morphological and Structural Analysis of Rice Straw

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The morphologies of untreated and pretreated rice straw were performed using JSM-7001F Field-Emission Scanning Electron Microscope (JEOL, Tokyo, Japan). The samples were fixed with conductive tape on brass sample stubs and then coated with Au before observation. Images were acquired at a 15-KV acceleration voltage and magnification × 500.
The untreated and pretreated samples for Fourier Transform Infrared (FTIR) spectroscopic analysis were determined using a Nicolet 6700 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) over a wavenumber range from 500–4000 cm−1 with 20 scans and a resolution of 4 cm−1. The samples were dispersed of spectroscopic grade potassium bromide (KBr) and pressed into disks to determined.
X-ray diffraction analysis was tested using an Ultima X-ray diffractometer of Rigaku Corporation (40 KV, 20 mA, Tokyo, Japan) with Cu Kα radiation. The 2θ range was from 5° to 40° in steps of 0.02° at a rate of 8° min−1 [24 (link)]. The crystallinity index (CrI) of untreated and pretreated samples was calculated according to Equation (1) [25 (link)].
CrI%=I002IamI002×100%
where I002 is the intensity of the crystalline regions (2θ = 22.5°) and Iam is the intensity of amorphous portion (2θ = 18.7°).
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6

Mechanical and Microstructural Characterization of C17200 and QBe2.0 Alloys

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C17200 (imported) and QBe2.0 (domestic) alloys were selected as the materials for this experimental study, and their alloy compositions are shown in Table 1. The initial state of QBe2.0 alloy is Y2 state and that of C17200 alloy is 1/2H state, and they are both subjected to 21% cold deformation after solution treatment. Then, the initial state alloys were annealed in a chamber annealing furnace for 2 h at both 280 °C and 300 °C, to select the optimal heat treatment regime. The Vickers hardness was conducted on a WILSON VH1150 test instrument (Chicago, IL, USA) with an indentation load of 5 kg and a holding time of 15 s. Tensile specimens were measured on an MTS-WD 3100 tensile test machine (Eden Prairie, MN, USA) with a constant strain rate of 10−3 s−1. The microstructures of the alloys in the peak-aged states were observed using a Zeiss Axiovert 200 MAT metallurgical microscope (Zeiss, Jena, Germany). A JEOL JSM 7001F field emission scanning electron microscope (JEOL, Tokyo, Japan) was used to observe the fracture morphologies of the samples, and its EBSD probe was used to analyze the grain organization, twinning, and grain boundaries. A JEOL JEM-2010 high-resolution electron microscope (Hillsboro, OR, USA) was also used to observe and analyze the precipitation phases of the two alloys with an operating voltage of 200 KV.
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7

Ultrastructure Analysis of UFMG

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UFMG were fixed for 24 h at 4 °C in 2.5% glutaraldehyde solution first, then dehydrated in incremental concentrations of ethanol [21 (link)]. The dried specimens were sputter-coated with gold and examined under a JSM-7001F field emission scanning electron microscope (JEOL Ltd., Tokyo, Japan) at an acceleration voltage of 30 kV.
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