Jsm 7001f field emission scanning electron microscope
The JEOL JSM-7001F is a field emission scanning electron microscope (FESEM) designed for high-resolution imaging of samples. It features a Schottky field emission gun that provides a stable electron beam for improved image quality and resolution. The JSM-7001F is capable of capturing detailed images of a wide range of materials and samples at magnifications up to 100,000x.
Lab products found in correlation
7 protocols using jsm 7001f field emission scanning electron microscope
Comprehensive Materials Characterization Protocol
Scanning Electron Microscopy of SNCs
Nematode SEM Preparation Protocol
Nanoparticle Characterization by SEM
Morphological and Structural Analysis of Rice Straw
The untreated and pretreated samples for Fourier Transform Infrared (FTIR) spectroscopic analysis were determined using a Nicolet 6700 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA) over a wavenumber range from 500–4000 cm−1 with 20 scans and a resolution of 4 cm−1. The samples were dispersed of spectroscopic grade potassium bromide (KBr) and pressed into disks to determined.
X-ray diffraction analysis was tested using an Ultima X-ray diffractometer of Rigaku Corporation (40 KV, 20 mA, Tokyo, Japan) with Cu Kα radiation. The 2θ range was from 5° to 40° in steps of 0.02° at a rate of 8° min−1 [24 (link)]. The crystallinity index (CrI) of untreated and pretreated samples was calculated according to Equation (1) [25 (link)].
where is the intensity of the crystalline regions (2θ = 22.5°) and is the intensity of amorphous portion (2θ = 18.7°).
Mechanical and Microstructural Characterization of C17200 and QBe2.0 Alloys
Ultrastructure Analysis of UFMG
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