Nova nanosem430
The Bruker Nova NanoSEM430 is a high-resolution field emission scanning electron microscope (FE-SEM) designed for advanced imaging and analysis of a wide range of samples. It offers a highly stable electron beam, exceptional resolution, and advanced features for versatile imaging and characterization applications.
Lab products found in correlation
3 protocols using nova nanosem430
Characterization of Graphene Oxide Membranes
Membrane Characterization by XPS, SEM, AFM, and Zeta Potential
The elemental contents of the membrane surface were obtained by XPS (PHI5000VersaProbe, Japan). The morphology of the membrane surface was investigated by SEM (Nova NanoSEM430, USA) and AFM (Bruker Dimension Icon, Germany). The wettabilities of the membranes were evaluated by a contact angle analyser (Data Physics Instruments GmbH, Germany). The zeta potentials of the membranes were evaluated by an electrokinetic analyser (Anton Paar GmbH, Austria).56,57 (link)
Characterization of Optoelectronic Sensor Array
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