Sigma 300 vp field emission sem
The Sigma 300 VP field emission SEM is a scanning electron microscope designed for high-resolution imaging and analysis of various materials. It features a field emission electron source, which provides a stable and high-brightness electron beam for detailed topographical and compositional characterization. The instrument operates under variable pressure conditions, allowing for the examination of non-conductive samples without the need for extensive sample preparation.
Lab products found in correlation
2 protocols using sigma 300 vp field emission sem
Electrochemical Characterization of CNT/CNC/AgNP
Crosslinked Hydrogel Scaffold Characterization
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