The α-synuclein PFF solution was deposited on freshly cleaved mica (The Nilaco Corporation, Tokyo, Japan) and incubated for 10 min. After washing the mica with distilled water, sample imaging was performed under ambient conditions at room temperature using a NanoScope IIIa Tapping Mode AFM (Veeco, Plainview, NY, USA) and microcantilever OMCLAC160TS-R3 (Olympus, Tokyo, Japan).
Nanoscope iiia tapping mode afm
Manufactured by Veeco
Sourced in Japan
The NanoScope IIIa is a Tapping Mode Atomic Force Microscope (AFM) designed for high-resolution imaging of surfaces at the nanoscale. It utilizes a vibrating cantilever to gently tap the sample surface, enabling non-destructive imaging of delicate samples. The NanoScope IIIa provides high-quality topographical data and surface property information, making it a valuable tool for a wide range of applications in nanotechnology, materials science, and surface analysis.
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3 protocols using nanoscope iiia tapping mode afm
1
Atomic Force Microscopy of α-Synuclein
2
Atomic Force Microscopy Imaging Protocol
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AFM was performed as previously described25 (link). Briefly, samples were deposited on freshly cleaved mica, and AFM images were obtained under ambient conditions at room temperature using a NanoScope® IIIa Tapping mode AFM (Veeco, Plainview, NY) and a micro cantilever OMCL-AC160TS-R3 (Olympus, Tokyo, Japan).
3
Fibril Characterization via AFM Imaging
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For AFM analysis, 10 mL of each fibril solution (30 mmol/L) in 10 mmol/L PBS was diluted with 45 mL of distilled water and spotted on freshly cleaved mica (Nilaco Corp., Tokyo, Japan).
After the mica was washed with 20 mL of distilled water, sample images were obtained under ambient conditions at room temperature via NanoScope IIIa Tapping Mode AFM (Veeco Instrument, Plainview, NY) and a single-crystal microcantilever OMCLAC160TS-R3 (Olympus, Tokyo, Japan) at a scan rate of 0.5 Hz in tapping mode.
After the mica was washed with 20 mL of distilled water, sample images were obtained under ambient conditions at room temperature via NanoScope IIIa Tapping Mode AFM (Veeco Instrument, Plainview, NY) and a single-crystal microcantilever OMCLAC160TS-R3 (Olympus, Tokyo, Japan) at a scan rate of 0.5 Hz in tapping mode.
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