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Jxa 8200 electron probe microanalyzer

Manufactured by JEOL

The JXA 8200 is an electron probe microanalyzer manufactured by JEOL. It is designed to perform quantitative elemental analysis and mapping of solid samples at the microscopic level. The instrument uses an electron beam to interact with the sample, generating characteristic X-rays that are detected and analyzed to determine the elemental composition of the material.

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3 protocols using jxa 8200 electron probe microanalyzer

1

Garnet-biotite thermobarometry of retrograde metamorphism

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Garnet-biotite thermobarometry was applied to establish P-T conditions during retrograde metamorphism. Garnet and biotite major element chemistry spot analyses were collected using a JEOL JXA 8200 electron probe microanalyzer (EPMA) housed at the Advanced Analytical Centre, James Cook University, Townsville. Measurement conditions included a 15-kV acceleration voltage, a 20-nA probe current, and a 5-μm probe diameter. Calibration standards are presented in table S1. Garnet major element maps were acquired using the same instrumentation and processed using ImageJ software to better establish chemical zonation patterns. Garnet and biotite major element data used for thermobarometry calculations are presented in tables S3 to S10. The data are presented in weight % oxide and atoms per formula unit.
The same electron microprobe facility was used in the analysis of Zr in rutile from garnet mantle and rim zones. This technique was applied to constrain metamorphic temperatures during garnet mantle and rim growth. Measurement conditions included a 20-kV acceleration voltage, a 100-nA probe current, and a 1-μm probe diameter. Experiment standards are presented in table S2. Rutile major element data used for thermobarometry calculations are presented in tables S11 and S12. The data are presented in weight % oxide, and Zr concentrations are given in parts per million.
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2

Multimodal Microscopic Imaging of Coral Colonies

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A Leica MZ12.5 stereomicroscope with a maximum magnification of 120-x was used for choosing suitable colony fragments for SEM imaging.
SEM images of uncoated fragments were produced using a Tescan Vega 3 scanning electron microscope equipped with a low-vacuum chamber at the Senckenberg am Meer (SMW) in Wilhelmshaven, Germany (Fig. 1d). Specimens imaged at the SGN (Fig. 4, Supplementary Fig. S3) were coated in gold/palladium (20/80) and using a Camscan CS 24 SEM producing secondary-electron images. BSE images of sectioned and polished colonies were obtained using a JEOL JXA 8200 electron probe microanalyzer (EPMA) at the University of Mainz, Germany. Specimens were imaged using 15 kV acceleration voltage, 8 nA beam current at a working distance of 11 mm. BSE images were merged using Photoshop CS5 and skeleton thickness was measured using ImageJ. For NanoSIMS mapping, colonies were embedded in epoxy resin, sectioned and polished at Max-Planck Institute for Chemistry, Mainz, Germany following routine methods.
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3

Synthesis and Characterization of Fe-Mg-Al-Si Oxides

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Fe0.5Mg0.5Al0.5Si0.5O3 and FeMg0.5Si0.5O3 single crystals were synthesized using the Kawai-type multi-anvil press with the Osugi-type module (Ishii et al., 2019 (link)) at Bayerisches Geoinstitut, IRIS-15 (Ishii et al., 2016 (link)). A detailed description of the sample synthesis procedure can be found in Liu et al. (2019) (link). The chemical composition of the recovered samples was determined using a JEOL JXA-8200 Electron Probe Microanalyzer (EPMA). The oxidation state of iron was determined by Mössbauer spectroscopy. Within the detection limits of the measurements, all the iron in FeMg0.5Si0.5O3 is represented as Fe3+. Approximately 16(4)% of iron in Fe0.5Mg0.5Al0.5Si0.5O3 is represented as Fe2+ (Supplementary Figure S1).
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