Ssx 550 field emission scanning electron microscope

Scanning electron microscope (SEM) images were taken on a Shimadzu SSX-550 field emission scanning electron microscope (Shimadzu, Co. Ltd., Kyoto, Japan) at 15.0 kV. The as-electrospun samples were dispersed in ethanol with the assistance of an ice-water ultrasonic bath at 35 kHz, and a drop of the well-dispersed sample was cast repeatedly onto a piece of silicon wafer and air-dried. A thin gold coating was utilized to avoid charging during scanning, and a thorough microscopic study was carried out. The detailed morphology and size were examined with a Hitachi H-8100 transmission electron microscope (TEM, Hitachi, Ltd., Tokyo, Japan). As for SEM measurement, the as-electrospun samples for TEM were dispersed in ethanol with the assistance of an ice-water ultrasonic bath at 35 kHz. A drop of the well-dispersed sample above was cast repeatedly onto a specimen holder and air-dried. Fourier transform infrared (FTIR) spectra were recorded on a Thermo Nicolet Avatar 370 FTIR spectrometer. UV–visible absorption spectra (UV–vis, Hitachi, Ltd., Tokyo, Japan) were collected with a Hitachi U-3900H spectrophotometer in the 300–700 nm wavelength range. X-ray photoelectron spectra (XPS) were recorded with Mg Kα radiation.

SEM (Shimadzu, Co. Ltd., Kyoto, Japan) was carried out on a Shimadzu SSX-550 field emission scanning electron microscope. A drop of the sample suspended in ethanol was placed on a piece of silicon wafer. After 10 min of air-drying, a thin gold coating was applied to prevent charging during scanning, then a thorough microscopic study was carried out. EDX spectroscopy was also used during the SEM measurements to examine the elemental composition of the samples. The detailed morphology, size, and inner state of the samples were surveyed using a Hitachi H-8100 transmission electron microscope (Hitachi, Ltd., Tokyo, Japan). For TEM imaging, the samples were suspended in ethanol with the assistance of sonication at 35 KHz, and the as-prepared suspensions were added onto a copper grid and air-dried at room temperature. FTIR spectrometry was performed on a Thermo Nicolet Avatar 370 FTIR spectrometer (Thermo Fisher Scientific Co. Ltd., Waltham, MA, USA). XPS was run on a PHI-5000CESCA system with Mg Kα radiation. The active chlorine content was quantified using an iodometric/thiosulfate assay.

¹H-NMR spectra were recorded on a Bruker AVANCE III-500 instrument (Bruker, Co. Ltd., Billeria, MA, USA) in D₂O solution. Fourier transform infrared (FTIR) spectrometry was recorded on a Thermo Nicolet Avatar 370 FTIR spectrometer (Thermo Fisher Scientific Co. Ltd., Waltham, MA, USA). X-ray photoelectron spectroscopy (XPS) was carried out on a PHI-5000CESCA system with Mg K radiation. Scanning electron microscopy (SEM) images (Shimadzu, Co. Ltd., Kyoto, Japan) were taken on a Shimadzu SSX-550 field emission scanning electron microscope at 15.0 kV. A drop of the well-dispersed sample in ethanol was cast onto a piece of silicon wafer and air dried. A thin gold coating was utilized to avoid charging during scanning, and a thorough microscopic study was carried out. Energy-dispersive X-ray (EDX) spectroscopy was also performed during the SEM measurements. The detailed morphology and size of the samples were observed with a Hitachi H-8100 transmission electron microscope (TEM, Hitachi, Ltd., Tokyo, Japan). The samples were well dispersed in ethanol with the assistance of sonication at 35 KHz, and the as-prepared dispersion was added dropwise onto the copper grid and dried at room temperature for TEM characterization.