The largest database of trusted experimental protocols

93 protocols using 208hr sputter coater

1

Ultrastructural Analysis of Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
The ultramicrostructure was examined using a field-emission scanning electron microscope (FE-SEM-II; JSM-7900F, JEOL Ltd., Seoul, Republic of Korea). Samples prepared under each condition were sliced and placed in 2.5% glutaraldehyde with 0.1 M phosphate-buffered saline (PBS; pH 7.4) for 36 h. Subsequently, the samples were rinsed three times, using 0.1 M PBS (pH 7.4), and dehydrated using a gradient of ethanol solutions (30, 50, 70, 90, and 100%) before being frozen at −20 °C. After that, the samples were lyophilized and sputter-coated with platinum, using a Cressington sputter coater 208HR (Cressington Scientific Instruments Ltd., Watford, UK) at 20 MA. The FE-SEM controlled by PC-SEM software version 4.0, with an ×1000 magnification was used to view the microstructure.
+ Open protocol
+ Expand
2

Morphological Analysis of Empty Prints

Check if the same lab product or an alternative is used in the 5 most similar protocols
The empty hollow prints were used for imaging using an FEI Quanta 650 ESEM to observe the surface morphology of the empty prints. Briefly, the samples were mounted on aluminum stubs with double-sided carbon tape and sputter-coated for 1 min using Pt/Pd in a Cressington sputter coater 208 HR (Cressington Scientific Instruments Ltd., Watford, UK)), and then observed using the Quanta SEM. The images were captured at a 52× to 53× magnification at an acceleration voltage of 15.00 kV.
+ Open protocol
+ Expand
3

Morphological and Surface Analysis of Electrode Coatings

Check if the same lab product or an alternative is used in the 5 most similar protocols
Field emission scanning electron microscopy (SEM) was used to analyze the morphology from the best brush deposition condition based on the electrochemical experiments. After coating the electrode modified with ALG-thiomer/Pt brushes was with a 5-nm thick layer of platinum [Cressington sputter coater 208 HR (Watford, United Kingdom)], SEM images were taken by a FEI Quanta 600 FEG (Hillsboro, OR). Magnification of 10,000 and 16,000 times with accelerating voltage of 10 kV were used for the surface imaging.
The surface chemistry of the electrodes coated using the selected optimized brush deposition was analyzed by X-ray photoelectron spectroscopy (XPS), performed in an Omicron ESCA + (Scienta Omicron, Sweden) with CN10 electron gun and Mg/Al dual X-ray gun.
+ Open protocol
+ Expand
4

Microstructural Analysis of Hydrogel Formulations

Check if the same lab product or an alternative is used in the 5 most similar protocols
After preparing 23% (w/w) MBPI, CTL, MTM4, and MTM8 solution with buffer in a glass vial, the mixture was heated at 90 °C for 30 min with the glass vial lid closed. After heating, the mixture was cooled at RT for 1 h and stored at 4 °C overnight. The gels were then lyophilized and crushed. The dried samples were then sputter-coated with platinum (Cressington sputter coater 208HR, Cressington Scientific Instruments Ltd., Watford, UK) and the microstructure was observed using FE-SEM (JSM-7900F, JEOL Ltd., Akishima, Tokyo, Japan) at ×300 magnification.
+ Open protocol
+ Expand
5

Preparing Leaf and Stalk Samples for SEM Imaging

Check if the same lab product or an alternative is used in the 5 most similar protocols
Samples
were prepared
for image acquisition by selecting leaves and stalk pieces for analysis
and cutting them to fit onto SEM stubs (15–30 mm squares).
The leaf and stalk fractions were further divided and oriented as
either leaf top, leaf bottom, stalk exterior, or stalk interior so
that there were 10 samples of each for the mildly, moderately, and
severely degraded group as well as the control. The samples were mounted
onto aluminum stubs using double sided adhesive. The samples were
sputter coated with 12 nm iridium using a Cressington sputter coater
208 HR (Cressington Scientific Instruments, Ltd., Watford, UK). The
sputter coating was to prevent charging during SEM imaging and was
used to normalize the differences in color among the three groups
as the mild group was light tan while the moderate and severe groups
were darker brown. This was to minimize the possibility that textural
differences found would be influenced by color differences.
+ Open protocol
+ Expand
6

Cellulose and DAC Morphology Analysis by FE-SEM

Check if the same lab product or an alternative is used in the 5 most similar protocols
Morphological analysis of cellulose and DAC was performed by FE-SEM analysis using a Hitachi S-4800 (Spectral Solutions, Solna, Sweden), equipped with an EDX (energy dispersive X-ray) detector for chemical analysis, and an EBSD (electron backscattered diffraction) detector for grain orientation and texture analysis. The samples were coated with a thin layer of gold (4 nm) using a Cressington sputter coater 208HR (Cressington Scientific Instruments Ltd., Watford, U.K.) and analysis was performed with SE In-Lens, under a high vacuum and with an operating voltage of 0.1–30 kV and a probe current of 10 nA.
+ Open protocol
+ Expand
7

Scanning Electron Microscopy Analysis

Check if the same lab product or an alternative is used in the 5 most similar protocols
A scanning electron microscope (JEOL-7800F, JEOL, Tokyo, Japan) was used for qualitative analysis. Three specimens were sonically cleaned with DW and coated with platinum (Cressington sputter coater 208HR, Cressington Scientific Instruments, Watford, UK) for 60 s. 50× and 10000× magnification images were obtained at an operating voltage of 15.00 kV and a working distance of 34.7 mm.
+ Open protocol
+ Expand
8

Characterization of HbNPs and PLGA-NPs

Check if the same lab product or an alternative is used in the 5 most similar protocols
SEM images were obtained by using a FEI Quanta FEG 250 ESEM (FEI Company, Hillsboro, OR, USA) operating at 15 kV. Either 3 µL of HbNPs or bare PLGA-NPs were deposited on a glass slide, mounted on a metal stub, followed by drying of the NPs and subsequent gold sputtering under vacuum (Sputter Coater 208 HR, Cressington Scientific, Ted Pella, Redding , CA, USA).
+ Open protocol
+ Expand
9

Scanning Electron Microscopy of Thin Films

Check if the same lab product or an alternative is used in the 5 most similar protocols
Scanning electron micrographs (SEM) of the films with different amounts of LO were acquired using a focused ion beam scanning electron microscope (LYRA3 XMU, Tescan, USA) to examine surface and cross-section morphologies. Each film was coated with platinum using a Cressington Scientific Instruments sputter coater 208HR (USA) for 2 min, and measurements were performed at an accelerating voltage of 5 kV.
+ Open protocol
+ Expand
10

Scanning Electron Microscopy of Filaments

Check if the same lab product or an alternative is used in the 5 most similar protocols
A Nova NanoSEM 450 scanning electron microscope was employed to detect any changes in the filaments’ surface. The samples were sputtered with a 10 µm coat of gold by means of a Cressington Sputter Coater 208 HR to increase their conductivity.
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!