The elemental composition of the synthesized nanoparticles was determined with a scanning electron microscope (JSM-6010LA) operating with high vacuum, at an accelerating voltage of 20 kV and coupled to an energy-dispersive X-ray spectroscope (EDS, JEOL, JSM-6010LA).
Jsm 6010la
Manufactured by JEOL
Sourced in Japan, United States
The JSM-6010LA is a versatile scanning electron microscope (SEM) designed for high-performance imaging and analysis. It features a compact, user-friendly design and delivers high-quality images with excellent resolution and magnification capabilities. The JSM-6010LA is suitable for a wide range of applications in materials science, life sciences, and industrial research and development.
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Lab products found in correlation
Jfd 320, by JEOL (5 mentions)
Jfc 1600, by JEOL (5 mentions)
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Spectrum 100, by PerkinElmer (2 mentions)
Sempore, by JEOL (2 mentions)
T butyl alcohol, by Fujifilm (2 mentions)
Jem 2100, by JEOL (2 mentions)
Ems 150r es, by JEOL (2 mentions)
Axis ultra dld, by Shimadzu (2 mentions)
Quorum q150t es, by Quorum Technologies (2 mentions)
Spectrum two, by PerkinElmer (2 mentions)
Smartlab, by Rigaku (2 mentions)
D2 phaser, by Bruker (2 mentions)
Vertex 70v, by Bruker (1 mentions)
Dektak 150, by Veeco (1 mentions)
Nicolet is5, by Thermo Fisher Scientific (1 mentions)
Q150t sputter coater, by Quorum Technologies (1 mentions)
Jsm 7610f, by JEOL (1 mentions)
Jsm 6500f, by JEOL (1 mentions)
Oca40 micro, by Dataphysics (1 mentions)
134 protocols using jsm 6010la
1
Elemental Analysis of Nanoparticles
2
Detailed Characterization of Diatom Frustules
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For the preliminary determination of cell size, 100 cells of each strain were randomly measured using light microscope (Nikon, Japan) under 400-fold magnification. The detailed morphology characteristics were further determined using a scanning electron microscope (SEM, JSM-6010LA, JEOL, Japan), and the frustules were purified using the method same with our previous report [10 (link)]. The surface elements and functional groups were determined using energy dispersive X-ray spectroscopy (EDXS, SEM, JSM-6010LA, JEOL, Japan) and Fourier transform infrared spectroscopy (FTIR, 5700, Nicolet, USA). Zeta potential was measured by A Malvern Zetasizer (Zetasizer Nano, Malvern, England) in phosphate-buffered solution (PBS) at pH 7.4. The liquid absorption capability was tested using simulated body fluid (SBF) with the methods same with previous studies [13 (link)], and the absorption ratio (AR) was calculated using Eq. (2 ): which Wwet and Wdry represent the weights of the wet and dry frustules. N2 adsorption desorption isotherm was carried out using automatic gas adsorption analyzer (ASAP 2460, Micromeritics, USA) to calculate the BET, pore diameter, and pore volume of frustules.
3
Morphological Changes of BV4012 Bacteria under P22 Phage Treatment
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BV4012 samples were treated with P22 phage, and the morphology and surface microstructure of the bacteria observed using scanning electron microscopy. Untreated BV4012 served as control. Prior to microscopy, the specimens were dried in a vacuum, and sprayed with gold using EMS Quorum (EMS 150R ES) ion-sputtering instrument and observed through Analytical Scanning Electron Microscope (SEM) (JEOL JSM-6010LA, Japan) installed with IntouchScope software.
Sample preparation for SEM was carried out as described by Li et al., 2021 [41 ] with few modifications. In short, the specimens for SEM were fixed with 10% formaldehyde solution at room temperature for 10 min, washed with PBS solution thrice, and dehydrated serially in 50%, 70%, and 95% absolute ethanol solutions for 10 min each. Finally, the specimens were dried in a vacuum, and sprayed with gold using EMS Quorum (EMS 150R ES) ion-sputtering instrument and observed through Analytical Scanning Electron Microscope (SEM) (JEOL JSM-6010LA, Japan) installed with IntouchScope software.
Sample preparation for SEM was carried out as described by Li et al., 2021 [41 ] with few modifications. In short, the specimens for SEM were fixed with 10% formaldehyde solution at room temperature for 10 min, washed with PBS solution thrice, and dehydrated serially in 50%, 70%, and 95% absolute ethanol solutions for 10 min each. Finally, the specimens were dried in a vacuum, and sprayed with gold using EMS Quorum (EMS 150R ES) ion-sputtering instrument and observed through Analytical Scanning Electron Microscope (SEM) (JEOL JSM-6010LA, Japan) installed with IntouchScope software.
4
Morphological Changes of BV4012 Bacteria under P22 Phage Treatment
5
Characterization of Implant Surface Morphology and Composition
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Scanning electron microscopy (SEM, JEOL JSM-6010LA, Peabody, MA) was performed to analyze the surface morphology of AC- and PEO-textured implants, at baseline, and after removal of implants for reverse-torque biomechanical analysis. Energy dispersive spectroscopy (EDS, JEOL JSM-6010LA, Peabody, MA, USA) was used to evaluate the chemical composition of Ti-6Al-4V implants after treatments. Small-volume elemental chemical analyses (around 1 μm3) were performed using the EDS technique. The simultaneous observation of the entire X-ray spectrum facilitated rapid qualitative analysis (mapping) of the main constituent elements of the implant surfaces, thus allowing for a comparison of the chemical compositions of the analyzed surfaces. Image J software (National Institute of Health, USA) was used to determine the average pore size and/or compound diameter deposited for each treatment type. The phase composition of the PEO coating was investigated using the X-ray diffractometry (XRD - X’Pert3 PRO MRD; PANalytical, The Netherlands) with a θ–2θ configuration in the 20° to 90° range with a step size of 0.01° and CuKα (λ = 1.54056 Å) radiation.
6
Graphite-Enriched Bitumen Surface Analysis
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The influence of various proportions of spent graphite (e.g., 5, 10, and 10 wt.% SG) on the surface topography, morphology, as well as chemical composition of original base AP-5 bitumen was detailly investigated by means of JSM-6010LA Scanning electron microscopy (SEM) (JSM-6010LA, JEOL Ltd., Tokyo, Japan) combined with Energy-Dispersive X-ray Spectroscopy (EDXS). Before proceeding with SEM, the diverse bituminous specimens were fully submerged in a liquid nitrogen (LN2, −80 °C), and then were coated with a thin layer of gold (ca. 10 nm) using X sputter coater, to increase their electrical conductivities. The SEM micrographs were captured under the following conditions: accelerating voltage 5 kV, beam current 5 nA, working distance (WD) of 10 nm, and magnification (×3000).
7
Infrared and Electron Spectroscopic Analysis of Thin Films
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The chemical structure of films deposited on polished silicon plates was analyzed by infrared reflectance-absorbance spectroscopy (IRRAS) in a spectrometer Bruker Vertex 70v (Bruker, Billerica, MA, USA). Spectra were recorded with resolution of 4 cm−1 in the range from 4000 to 375 cm−1. Each presented spectrum is the average of 32 scans acquired with each sample. The chemical composition was determined by X-ray Energy Dispersive Spectroscopy (EDS) using an X-ray Dry SD Hyper (EX-94410T1L11, JEOL’s DrySDTM, Peabody, MA, USA detector coupled to a scanning electron microscope JEOL JSM 6010 LA (Tokyo, Japan) using 4 keV electron beams.
8
Microscopic Observation of Polymer Samples
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The specimens for microscopic
observations were prepared by permanganic etching according to the
procedure developed originally by Olley et al.(43 (link)) Typically, samples were etched for 1 h at room
temperature in the mixture containing 1 wt % of KMnO4,
dissolved in a 1:1 v/v mixture of concentrated sulfuric and phosphoric
acid. Details of the procedure are given in.44 (link) The etched samples, coated with 20 nm thick gold layer, were examined
with a scanning electron microscope JEOL JSM-6010 LA (JEOL, Japan).
observations were prepared by permanganic etching according to the
procedure developed originally by Olley et al.(43 (link)) Typically, samples were etched for 1 h at room
temperature in the mixture containing 1 wt % of KMnO4,
dissolved in a 1:1 v/v mixture of concentrated sulfuric and phosphoric
acid. Details of the procedure are given in.44 (link) The etched samples, coated with 20 nm thick gold layer, were examined
with a scanning electron microscope JEOL JSM-6010 LA (JEOL, Japan).
9
Microscopic Examination of Polymer Structure
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The specimens for microscopic observations were prepared from non-deformed and compressed CEPE-samples by permanganic etching, according to the procedure developed originally by Olley et al. [34 (link)]. Prior to etching, the bulk morphology of the sample was exposed by cutting the sample along the plane of interest (usually the plane parallel to the loading direction), with an ultramicrotome (Tesla, Brno, Czechia) equipped with a freshly prepared glass knife. The exposed surfaces were etched at room temperature in the fresh solution composed of 1 wt.% of KMnO4, dissolved in a 1:1 vol./vol. mixture of concentrated sulfuric and phosphoric acid. The time of etching was typically 60 min, based on a series of preliminary experiments. The etched samples, carefully washed and then coated with a fine gold layer (Edward Sputter Coater, Edward, Crawley, UK), were examined with a scanning electron microscope (JEOL JSM-6010 LA, JEOL, Tokyo, Japan) operating in a high vacuum mode. An accelerating voltage of 10kV was applied to capture SEM images.
10
Surface Characterization of Biomaterial Films
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Surface morphology and topography were determined by scanning electron microscopy (SEM) (JEOL JSM-6010LA; JEOL), whereas energy dispersive spectroscopy (EDS) was used to define surface chemical composition (n=10) [18] (link). Surfaces were sputtered with Au-Pd alloy and micrographs were obtained using secondary electrons detector and beam energy of 3.0 keV. A profilometer (Veeco, Dektak 150) was used to assess surface roughness (n=10) and film thickness (n=4) using a 500-μm scan for 15 s and a load of 3 mg.
Each specimen was scanned at least 5 times before and after film deposition. Four different parameters of surface roughness were obtained: average roughness (Ra), root mean-squareaverage (Rq), average maximum height of the profile (Rz), and maximum height (Rt). In order to measure film thickness, plasma was deposited onto a glass slide partially coated with a Kapton adhesive tape to create a step. Moreover, wettability and surface energy were determined by an automatic goniometer (Ramé-Hart 100-00; Ramé-Hart Instrument Co) (n=10). Two liquids were used (water as a polar component and diiodomethane as a dispersive component) and their contact angle with the surface was measured. The relation between contact angle and surface energy was evaluated by the Owens-Wendt method [19] (link).
Each specimen was scanned at least 5 times before and after film deposition. Four different parameters of surface roughness were obtained: average roughness (Ra), root mean-squareaverage (Rq), average maximum height of the profile (Rz), and maximum height (Rt). In order to measure film thickness, plasma was deposited onto a glass slide partially coated with a Kapton adhesive tape to create a step. Moreover, wettability and surface energy were determined by an automatic goniometer (Ramé-Hart 100-00; Ramé-Hart Instrument Co) (n=10). Two liquids were used (water as a polar component and diiodomethane as a dispersive component) and their contact angle with the surface was measured. The relation between contact angle and surface energy was evaluated by the Owens-Wendt method [19] (link).
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