The Raman spectra of the 11S and 7S fractions were determined according to the modified method of Zhu et al. (2018) (link). The 11S and 7S isolates were freeze-dried and spread on glass slides, followed by Raman experiments with an inVia Qontor Raman microscope (Renishaw, England). The samples were scanned in the measurement range of 400 cm−1 to 3,300 cm−1 under the following conditions: 3 scans, 3 s exposure time, 20× lens, and the use of a diaphragm with a 50 μm slit. The spectra were smoothed, and baselines were corrected and normalized against the phenylalanine band at 1003 cm−1.
Qontor raman microscope
Manufactured by Renishaw
Sourced in United Kingdom
The Qontor Raman microscope is a high-performance, compact, and versatile instrument designed for advanced Raman spectroscopy analysis. It features a unique optical design and a range of powerful features to deliver precise and reliable Raman spectra. The Qontor Raman microscope is capable of analyzing a wide variety of samples, including solids, liquids, and gases, across a broad spectral range.
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Lab products found in correlation
2 protocols using qontor raman microscope
1
Raman Spectroscopy of Soy Protein Fractions
2
Polyoxometalate Thin Film Deposition
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Chemicals were used as received. O 19 ] (Ta 6 ) were synthesised using microwave irradiation according to published procedures. 26, (link)56 Aqueous solutions (0. piranha solution and atmospheric-pressure plasma. See ESI † for details. In the typical experiment, 100 μl of polyoxometalate solution (0.2 M) was placed at the centre of the substrate, and spun at 2000 rpm for four minutes, before annealing in a furnace using a ramped temperature program (see ESI † for details). Raman spectra of bulk solutions of polyoxoniobates and of annealed powders were collected using a 532 nm laser on an Anton-Paar Cora 5600 spectrometer. Raman spectra of spin-deposited films were collected using a Renishaw Qontor Raman microscope, using a 405 nm laser. Powder X-ray diffraction measurements were done on a PANalytical X'Pert 3 diffractometer with a CuK α ¯source. Ellipsometry measurements were done using an Alpha-SE Ellipsometer (J.A. Woollam Co. Inc.). Atomic force microscopy imaging was done with a Bruker BioScope Catalyst instrument operating in peak force mode in air. See ESI † for additional details.
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