The XRD patterns were recorded on a Bruker AXS D8 X-ray Diffractometer operated at 40 mA and 40 kV using a Cu Kα source. Field emission scanning electron microscopy (FESEM) was carried out using a JEOL JSM-7610F Plus Field Emission SEM. The diameter distributions of the particles in the samples were measured using Image J software. The atomic composition of the samples was analysed using energy dispersive X-ray (EDAX) analysis (Peltier cooled, Octane plus model (30 mm2 and 127 eV resolution)). The Brunauer–Emmett–Teller (BET) surface area analysis was carried out using a BET Surface Area Analyzer Model/Supplier: Autosorb I; Quantachrome Corp. The photoluminescence (PL) lifetime was calculated using FLS920, Edinburgh Instruments, Scotland.
Jsm 7610f plus field emission sem
Manufactured by JEOL
Sourced in Japan
The JSM-7610F Plus is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of materials. The JSM-7610F Plus features a field emission electron source, which allows for the generation of a high-brightness, small-diameter electron beam. This, in turn, enables the instrument to achieve high resolution and excellent imaging performance.
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2 protocols using jsm 7610f plus field emission sem
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Characterization of Nanoparticle Synthesis
2
Nanostructure Surface Morphology via FESEM
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The morphology of the gels was observed via scanning electron microscopy on a field emission scanning electron microscope (FESEM). The JEOL JSM-7610FPlus Field Emission SEM (Tokyo, Japan) combines two proven technologies—a semi-in-lens detector with integrated electron energy filter (r-filter) and an in-the-lens Schottky field emission gun—to deliver ultrahigh spatial resolution with a wide range of probe currents for all applications (1 pA to more than 200 nA). The JSM-7610FPlus offers true 1,000,000× magnification with 0.8 nm resolution at 15 kV (1.0 nm at 1 kV) and unmatched beam stability, making it possible to observe the fine surface morphology of nanostructures. The JSM-7610FPlus successfully integrates a full set of detectors for secondary electrons, backscattered electrons, energy dispersive X-ray spectroscopy (EDS), WDS, STEM, EBSD, and CL. The samples were freeze-dried before analysis and visualized without any sputtering process.
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