Precise reconstruction of the relief is carried out on NT-MDT NTEGRA Prima system in the tapping mode using custom sharpened vertical probes. The measurements of the metasurface after FIB patterning include flat unprocessed SOS areas and the obtained height profiles are normalized with respect to them. Calibrated 300 nm thickness of the SOS layer is used to recalculate the heights from the bottom Si/Al2O3 interface. The height map of the top of the annealed metasurface is normalized according to the FIB 3D reconstruction data. All obtained AFM images are processed with a specific numerical routine that includes a subtraction of the tip curvature radius, noise reduction, and a two-step averaging over all unit cells and their 4-fold rotations42 (link),51 (link).
Ntegra prima system
Manufactured by NT-MDT
The NTEGRA Prima system is a high-performance scanning probe microscope (SPM) designed for advanced materials characterization. It offers a versatile platform that can accommodate a range of SPM techniques, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and near-field scanning optical microscopy (NSOM). The NTEGRA Prima system provides researchers and scientists with a powerful tool for investigating the topography, mechanical, electrical, and optical properties of materials at the nanoscale.
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Lab products found in correlation
4 protocols using ntegra prima system
1
Quantitative Topographic Analysis of Metasurfaces
2
Thin Film Surface Characterization by AFM
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By means of an AFM NTEGRA Prima System
(NT-MDT (Russia)), semicontact or intermitent contact (tapping) measurements
were made with a standard 300 kHz silicon probe. The sample preparation
of the thin films used for AFM has been explained in detail in the
previous part of this section.
(NT-MDT (Russia)), semicontact or intermitent contact (tapping) measurements
were made with a standard 300 kHz silicon probe. The sample preparation
of the thin films used for AFM has been explained in detail in the
previous part of this section.
3
Morphological Examination of Cells by AFM
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In order to perform morphological examination by AFM, the samples were fixed onto the surface of a coverslip by incubation with 2.5% glutaraldehyde in PBS for 1 h. The samples were further fixed with osmium tetroxide (0.1%) in PBS for 1 h. Osmium tetroxide was removed by washing twice in PBS. The drying of samples was performed with an increasing concentrations of ethanol (10%, 30%, 50%, 70%, 95% and 100%) and finally in acetone. Topographic AFM measurements were performed in the semi-contact mode under ambient conditions using the NTEGRA Prima system from NT-MDT (NT-MDT Co. Moscow, Russia). NSG01 probes from NT-MDT with a typical tip curvature radius of about 6 nm and a typical force constant of 5 N/m were used. Topographic images were processed using the instrument-equipped software by the plane subtraction or by the fitting with the first order lines. For the calculation of the root-mean-square (RMS) of the surface roughness, only cell surfaces were selected from AFM images and then RMS was directly generated by the instrument software, using a total of 10 cell measurements for each ghost preparations.
4
AFM Characterization of Anti-OVA Immobilization
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The immobilisation of the pAb anti-OVA on the gold impedimetric surface was characterised by AFM. The AFM images were acquired using a Ntegra Prima system (NT-MDT Spectrum Instruments, Zelenograd Russia) equipped with an AFM silicon tip (NSG01, NT-MDT) having a spring constant of 5 N/m and a nominal resonance frequency of 160 KHz in air. AFM measurements were carried out in tapping mode and in the PBS buffer to preserve the structure and function of the biological components. For each sample, random 1 μm × 1 μm maps were scanned throughout the working area of the gold electrode with a resolution of 200 pixels per line and a scan rate of 2 Hz. From the topographic images, the root-mean-squared roughness (RMS) was calculated and averaged on ten AFM scans after image processing with the open-source software Gwyddion 2.62.
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