Morphological characterization of the cryo-fractured surfaces of the films was performed using a JEOL JSM-840 microscope (Peabody, MA, USA) running at 10 kV. Samples were coated with gold under vacuum using an SCD 004 Balzers sputter coater (Bal Tec. AG, Fürstentum, Lichtenstein) prior to scanning.
Jsm 840 microscope
Manufactured by JEOL
Sourced in Japan, United States
The JEOL JSM-840 is a scanning electron microscope (SEM) that provides high-resolution imaging of samples. It is capable of producing detailed images of the surface structure and topography of a wide range of materials. The JSM-840 utilizes an electron beam to scan the sample surface, and the resulting signals are used to generate the final image.
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12 protocols using jsm 840 microscope
1
Cryofracture Surface Characterization
2
Detailed Photographic Analysis of Plant Specimens
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Plants were photographed with a Nikon digital camera (Coolpix 4500). Flower images were taken using an Olympus dissection microscope with an Olympus digital camera (BX51). Alexander solution was used as described[29 (link)]. Plant material for the semithin sections was prepared and embedded in Spurr’s resin, as previously described[55 ]. For SEM examination, fresh stamens and pollen grains were coated with 8 nm of gold and observed under a JSM-840 microscope (JEOL).
3
Fungal Isolation and Characterization
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For cultural characterization, isolates were grown for up to 30 d on OA , potato carrot agar (PCA ; grated potatoes, 20 g; grated carrot, 20 g; agar-agar, 20 g; L-chloramphenicol, 100 mg; distilled water, 1 L), and potato dextrose agar (PDA; Pronadisa, Madrid, Spain) at 5, 10, 15, 20, 25, 30, 35 and 40 °C. Color notations in parentheses are from Kornerup and Wanscher (1984) . Vegetative and reproductive structures were examined under an Olympus BH-1 brightfield microscope by direct mounting in lactic acid and water of the ascomata and/or microcultures grown on OA and PDA. Pictures were obtained with a Zeiss Axio Imager M1 brightfield microscope. The samples for scanning electron microscopy (SEM ) were processed according to Figueras and Guarro (1988) (link), and SEM micrographs were taken at 15 keV with a Jeol JSM 840 microscope.
4
Plasma Treatment Effects on PE-WPC Topography
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The changes produced by plasma treatments on the PE-WPC topography were assessed with a Jeol JSM-840 microscope (Jeol Ltd., Tokyo, Japan) working at 15 kV. To obtain micrographs with good contrast, prior to being introduced into the SEM chamber, the samples were gold coated in Au/Pd Balzers metallizer SCD 004 (Oerlikon Surface Solutions, Balzers, Liechtenstein, Germany).
5
SEM and TEM Analysis of Pollen Grains
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For SEM, fresh pollen grains (PGs) were coated with 8 nm of gold and observed under a JSM-840 microscope (JEOL, Japan). For TEM, the flower buds were fixed in 0.1 M phosphate buffer (pH 7.2) comprising 2.5% glutaraldehyde (v/v) and then washed several times before gradient dehydration. Finally, the samples were embedded in Spurr’s resin and polymerized for 48 h at 60°C. The resulting ultrathin sections were examined via transmission electron microscopy (JEOL, Japan).
6
Microparticle Morphology and Size Analysis
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Morphology of microparticles and particle size distribution were evaluated using scanning electron microscopy. The encapsulated powder was coated with carbon before sputtering with gold under an argon atmosphere (Emitech K550X, Ashford, UK), followed by viewing under a JSM-840 microscope (JEOL, Tokyo, Japan). The size of the microparticles was determined by comparing the scanning electron microscopy images with those of a scale bar of the same magnification. At least 50 microparticles of each treatment were measured.
7
Ultrastructural Analysis of Flower Buds
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For TEM examination, flower buds were fixed in 0.1 M phosphate buffer (pH 7.2) with 2.5% glutaraldehyde (v/v) and then washed several times with PBS (pH 7.4), followed by dehydration with ethyl alcohol and replacement by propylene epoxide. The samples were embedded in Spurr’s resin and polymerized for 48 h at 60 °C as described previously [23 (link), 30 (link)]. Then, TEM microscopy (JEOL, Japan) was used to observe the slides. For SEM observations, fresh pollen grains were coated with 8 nm of gold and observed under a JSM-840 microscope (JEOL) [23 (link)].
8
Characterizing Carbonized Sample Morphology
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Morphology of the original, carbonized and activated samples was characterized by Scanning Electron Microscopy (SEM) in a JSM-840 microscope (JEOL, Tokyo, Japan) with a scintillator–photomultiplier type secondary electron detector.
9
Pollen Grain Observation by SEM and TEM
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For SEM observation, pollen grains were applied by flicking the anthers of mature flowers over mounting tape on a stub. The pollen grains were allowed to air dry for about 30 min, sputter coated with gold, and observed with a JSM-840 microscope (JEOL, Japan). For TEM observation, the same-stage inflorescences of wild type and mutant were fixed in 0.1 M phosphate buffer (pH 7.2) with 2.5% (v/v) glutaraldehyde. After 7 d of fixation, the material was washed thoroughly with phosphate buffer (pH 7.2). After that, the material was gradient dehydrated to 100% (v/v) ethyl alcohol and the inflorescences were then embedded and polymerization was performed (65°C, 24 h). Finally, ultra-thin sections (70-100 nm thick) were made and observed using a TEM microscope (JEOL).
10
Scanning Electron Microscopy of Freeze-Dried BNC
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The surface morphology of BNC fibers was studied by scanning electron microscopy (SEM) on a JSM-840 scanning electron microscope (JEOL Ltd., Tokyo, Japan) after sputtering a Pt layer 1–5 nm thick. The BNC sample having dimensions of 5 cm × 5 cm was preliminarily held in aqueous ethanol solutions at different concentrations of 25%, 50%, 75% and 90% for 30 min in four steps for partial dehydration of the BNC sample; afterwards, the BNC sample was freeze-dried in an HR7000-M lyophilizer (Harvest Right, LLC, Salt Lake City, UT, USA).
Scanning electron microscopy (SEM) of freeze-dried BNC samples pre-dehydrated with ethanol was done using a JSM-840 microscope (JEOL Ltd., Tokyo, Japan) with a Link-860 series II X-ray microanalyzer. Repeats information given above
Scanning electron microscopy (SEM) of freeze-dried BNC samples pre-dehydrated with ethanol was done using a JSM-840 microscope (JEOL Ltd., Tokyo, Japan) with a Link-860 series II X-ray microanalyzer. Repeats information given above
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