80 v spectrometer

The adsorbents (solid ZIF-8) were characterized by XRD (SIMADU XRD 6000) with Cu Kα radiation (0.1542, nm, 40 kV and 400 mA) at a scanning rate of 2 °C per minute. The morphologies and energy dispersive X-ray spectroscopy measurements were obtained using a FEI Quanta 200F scanning electron microscope. Fourier transform infrared spectra were obtained using a Bruker 80v spectrometer. Fourier transform Raman spectra were obtained using a HORIBA XploRA spectrometer. The thermogravimetric measurements were carried out at a NETZSCH STA 409 PC/PG instrument.

Analysis of RBCs was performed using FTIR microspectroscopy in transmission mode with a Bruker Hyperion 3000 IR microscope with a FPA detector attached to the Vertex 80 v spectrometer. Since cells were placed on a CaF₂ window, a location adjacent to the sample at a clear, clean spot on that window was used for background signal collection.
An IR objective lens with 15× magnification was used that provides a pixel size equal to 2.7 μm² (with 128 by 128 pixels in each direction of the FPA detector). The number of co-added scans were tested in order to ensure sufficient signal-to-noise ratio. 1024 scans provided a balance between good quality spectra within a reasonable amount of time (32 mins).
A spectral range of 3845 to 900 cm⁻¹ was set with a spectral resolution of 8 cm⁻¹. The zero filling factor was set to 2 and a Blackman-Harris 3-Term apodization function with phase resolution of 32 and power phase correction mode was selected for converting measured interferograms to final spectra.
From a single experiment, 16,384 spectra were collected from an area of approximately 345 × 345 µm².

A Nd:YAG laser fundamental(1064 nm, 10 Hz repetition rate with 10 ns pulse width and 20−50 mJ/pulse) was focused on a rotating silicon target (Alfa Aesar), generating a bright plume. The laser-ablated silicon atoms reacting with H₂, D₂, HD, and H₂ + D₂ mixtures in solid N₂ and ¹⁵N₂, were condensed at 4 K using a closed-cycle helium refrigerator (Sumitomo Heavy Industries Model SRDK-408D2). Infrared spectra were recorded on a Bruker 80 v spectrometer at 0.5 cm⁻¹ resolution between 4000 and 400 cm⁻¹ using a HgCdTe range B detector. Further experimental details are provided in the Supplementary Information.