Film structures were characterized using electron microscopy with FIB cross-sectioning preparation. An FEI Helios Nanolab 660 was primarily used for imaging. EDS composition measurements were also taken using this instrument at an e-beam accelerating potential of 10 kV. Some additional images, as well as EDS measurements, were taken using an FEI Quanta 250. Supplementary SEM images for film optimization were taken with a Hitachi S-4300 SEM. A lamella of the npMTFC membrane was prepared in the FEI Helios FIB–SEM using the J-cut technique for further imaging and analysis in TEM [56 ]. EDS was performed using an Oxford EDX detector. An FEI Talos F200X G2 TEM was used for imaging of this sample with Super-X EDS for compositional analysis. Surface chemical analysis was performed via XPS using a Thermo K-alpha XPS system.
Talos f200x g2 tem
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Talos F200X G2 TEM is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a field-emission electron source, advanced optics, and state-of-the-art detectors to provide detailed structural and compositional information about samples.
Automatically generated - may contain errors
Lab products found in correlation
K alpha xps system, by Thermo Fisher Scientific (3 mentions)
Quanta 250, by Thermo Fisher Scientific (1 mentions)
S 4300 sem, by Hitachi (1 mentions)
K alpha type, by Thermo Fisher Scientific (1 mentions)
Emxplus 6 1, by Bruker (1 mentions)
D8 advance, by Bruker (1 mentions)
Sta449f3, by Netzsch (1 mentions)
Nx10 atomic force microscope, by Park Systems (1 mentions)
Ph meter, by Mettler Toledo (1 mentions)
Empyrean series 2, by Malvern Panalytical (1 mentions)
5 protocols using talos f200x g2 tem
1
Film Characterization by Electron Microscopy
2
Comprehensive Characterization of Nanomaterials
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A model OTF-1200 tube furnace (Hefei, China) was used to calcine the required nanomaterials. Crystalline-phase identification was assessed using X-ray diffraction (XRD) with Cu Kα radiation (D8 Advance, Bruker, Germany). Morphology of the synthesized nanocomposites was observed using a Zeiss Merlin Sigma 300 SEM (Carl Zeiss SMT AG, Germany), as well as a Talos F200X G2 TEM (TEM; FEI, USA). Fourier transform infrared (FT-IR) spectra were recorded on a Nicolet iN 10 instrument (Thermo Fisher Scientific, USA) using a KBr matrix. Brunauer-Emmett-Teller (BET) surface area was determined by N 2 adsorption at 77K using a Quadrasorb SI system (USA). Additional characterization of physicochemical properties for the synthesized nanomaterials included X-ray photoelectron spectroscopy (K-Alpha + type; Thermo Scientific, USA), thermal analysis by DSC/DTA-TG (STA449 F3; NETZSCH, Germany), microscopic laser Raman spectroscopy (Renishaw inVia, UK), and electron paramagnetic resonance/ electron spin resonance (EPR/ESR) spectroscopy (EMXplus-6/1; Bruker, Germany).
3
Visualizing Amyloid Fibril Morphology
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Fibril morphology was analyzed by
TEM and AFM. For the TEM analysis, fibrils were diluted to 5–10
μM and incubated on carbon-coated copper grids for 3–4
min before washing with distilled water (dH2O) and staining
with uranyl acetate (2% w/v) for 2 min and then washed again with
dH2O. TEM images were taken on a Tecnai G2 80-200kv transmission
electron microscope (ThermoScientific, at the Cambridge Advanced Imaging
Centre (CAIC), University of Cambridge) with magnifications of 9–14
k. ImageJ was used for length analysis. The same protocol was applied
to protofibrils, and they were imaged on a Talos F200X G2 TEM (ThermoScientific,
Dept. of Chemistry, University of Cambridge).
AFM samples were
prepared following a method previously described (Flagmeier et al.,44 (link)). Fibrils were diluted to 1 μM in dH2O, and 50 μL was deposited onto freshly cleaved mica
and incubated for 45 min before washing with 50 μL of dH2O. All samples were imaged on a NX10 Atomic Force Microscope
(Park Systems, Suwon, South Korea) using non-contact mode. Areas of
4 μm × 4 μm were imaged in 1024 pixels at a speed
of 0.3–0.4 Hz. Images were analyzed by SPIP software (Image
Metrology, Hørsholm, Denmark) to determine the height and length
of aggregates.
TEM and AFM. For the TEM analysis, fibrils were diluted to 5–10
μM and incubated on carbon-coated copper grids for 3–4
min before washing with distilled water (dH2O) and staining
with uranyl acetate (2% w/v) for 2 min and then washed again with
dH2O. TEM images were taken on a Tecnai G2 80-200kv transmission
electron microscope (ThermoScientific, at the Cambridge Advanced Imaging
Centre (CAIC), University of Cambridge) with magnifications of 9–14
k. ImageJ was used for length analysis. The same protocol was applied
to protofibrils, and they were imaged on a Talos F200X G2 TEM (ThermoScientific,
Dept. of Chemistry, University of Cambridge).
AFM samples were
prepared following a method previously described (Flagmeier et al.,44 (link)). Fibrils were diluted to 1 μM in dH2O, and 50 μL was deposited onto freshly cleaved mica
and incubated for 45 min before washing with 50 μL of dH2O. All samples were imaged on a NX10 Atomic Force Microscope
(Park Systems, Suwon, South Korea) using non-contact mode. Areas of
4 μm × 4 μm were imaged in 1024 pixels at a speed
of 0.3–0.4 Hz. Images were analyzed by SPIP software (Image
Metrology, Hørsholm, Denmark) to determine the height and length
of aggregates.
4
Characterization of Quantum Dots
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The TEM image of the QDs was captured using a Transmission Electron Microscope (Talos F200X G2 TEM) (Thermo Fisher Scientific, USA) at 200 kV. A multifunctional enzyme spectrometer was used to measure UV–vis absorption and fluorescence spectra (Shimadzu, Japan). The infrared spectrum of the QDs was measured using a Fourier infrared spectrometer (FRIT) and the hydrated particle size was measured using a dynamic particle size scatterer (Nicomp N3000, USA). The pH was measured using a pH meter (Mettler-Toledo Instruments, China). All images were taken with a SONY digital camera (Alpha7 mark III, Japan) under 365 nm UV light.
5
TEM and XRD Analysis of Samples
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TEM was conducted on a Thermo
Scientific (FEI) Talos F200X G2 TEM. All samples were dropcast on
carbon-coated Cu grids (300 mesh). X-ray powder diffractometry was
conducted on a PANalytical Empyrean Series 2 instrument using Cu Kα
irradiation.
Scientific (FEI) Talos F200X G2 TEM. All samples were dropcast on
carbon-coated Cu grids (300 mesh). X-ray powder diffractometry was
conducted on a PANalytical Empyrean Series 2 instrument using Cu Kα
irradiation.
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