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Xrd 7000

Manufactured by Rigaku

The XRD-7000 is a X-ray diffractometer designed for laboratory analysis. It is capable of performing X-ray diffraction measurements to identify and characterize crystalline materials.

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2 protocols using xrd 7000

1

Comprehensive Material Characterization Protocol

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X-ray diffraction (XRD) patterns were recorded on a Rigaku diffractometer (Maxima XRD-7000) using Cu Ka irradiation. Scanning electron microscope (SEM) images and EDS results were taken with scanning electron microscopy (JEOL-6701F). Transmission electron microscope (TEM) images, EDS results, and SAED were taken with transmission electron microscopy (JEOL-2100F). The UV–visible absorption spectrum of catalysts was obtained by using a UV–visible spectrophotometer (UV-2550, Shimadzu, Japan), and the UV–visible–NIR absorption spectrum was taken with a PerkinElmer Lamda 950. BaSO4 was used as a reflectance standard. IR and Raman spectra were obtained on a Nicolet iN10 MX FT-IR microscope. XPS and Raman scattering investigations were carried out on the ESCALab220i-XL photoelectron spectroscope and Thermo Scientific DXR Raman microscope using a 532 nm laser, respectively.
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2

Characterization of Calcined Banana Flour

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The WBP was collected from a banana flour plant in Yogyakarta, Indonesia, washed several times, dried in an oven at 110 °C overnight and then crushed and sieved using a 100 mesh sieve. The WBP powder was calcined in a furnace at 600 °C for 2 hours. The calcined WBP was characterized by thermogravimetric analysis (TGA), X-ray diffraction (XRD), scanning electron microscopy (SEM), and X-ray fluorescence (XRF). The TGA thermogram was recorded using a Shimadzu DTG-60, while XRD and XRF patterns were acquired using a Shimadzu XRD-7000 and a Rigaku Supermini-200, respectively. The surface morphology of the calcined WBP was observed using a SEM equipped with a JEOL JSM-6510LA energy-dispersive X-ray (EDX) spectrometer.
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