measurements were performed on an Edinburgh Instruments FLS920 spectrometer
equipped with a TMS300 monochromator, 450 W Xe lamp, thermoelectrically
cooled Hamamatsu R928 PMT detector, and a liquid N2 cooled
R5509-72 NIR PMT for wavelengths beyond 825 nm. The recorded emission
spectra were corrected for the spectral responsivity of the detectors
and monochromators. Photoluminescence decay curves were recorded with
a pulsed Coherent 45 mW OBIS LX 445 nm laser (modulated with an Agilent
function generator) and an R5509-72 NIR PMT. Cryogenic measurements
were performed in a continuous-flow liquid helium cryostat from Oxford
Instruments. UV/Vis absorption spectra were measured on a PerkinElmer
950 UV/vis/NIR spectrophotometer. Transmission electron microscopy
(TEM) samples were made by drop-casting a diluted dispersion of NCs
on carbon-coated TEM copper grids. Bright-field (BF-TEM) and high-angle
annular dark-field scanning transmission electron microscopy (HAADF-STEM)
images were taken on a Talos F200X from FEI operating at 200 keV.
High-resolution HAADF-STEM imaging was performed on an aberration-corrected
Titan electron microscope from Thermofisher operating at 300 keV.
To minimize structural changes of NCs during imaging, a low beam current
of ∼5 pA was used with relatively low magnifications.