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Silicon nitride np s20 tips

Manufactured by Veeco

The Silicon nitride NP-S20 tips are specialized lab equipment designed for use in various analytical and research applications. These tips are composed of silicon nitride material and are engineered to maintain a sharp profile for accurate measurements and high-resolution imaging. The core function of these tips is to provide a durable and precise tool for surface analysis and characterization.

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2 protocols using silicon nitride np s20 tips

1

Atomic Force Microscopy of Peptides

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Soluble and fibrillar peptides prepared as described above were solubilized in 0.01 M sodium phosphate buffer (pH 7.4) containing 0.01% (w/v) NaN3 to a concentration of 0.1–4 μM. Immediately, 10 μl of a sample was added to a freshly cleaved layer of mica (Ted Pella, Inc., Redding, CA.) and allowed to air dry. AFM measurements were carried out on dry peptide samples with silicon nitride NP-S20 tips (Veeco Metrology, Inc., Santa Barbara, CA) using a MultiMode Scanning Probe Microscope (MM SPM) with a NanoScope IV controller. A high resolution J-type scanner was used to scan the peptide surface. Images were collected by raster scanning across a 10 μm2 area at 1024 samples (pixels) per line at a rate of 3.70 Hz. Images were processed with NanoScope Software (Veeco Metrology, Inc.).
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2

Atomic Force Microscopy of Peptides

Check if the same lab product or an alternative is used in the 5 most similar protocols
Soluble and fibrillar peptides prepared as described above were solubilized in 0.01 M sodium phosphate buffer (pH 7.4) containing 0.01% (w/v) NaN3 to a concentration of 0.1–4 μM. Immediately, 10 μl of a sample was added to a freshly cleaved layer of mica (Ted Pella, Inc., Redding, CA.) and allowed to air dry. AFM measurements were carried out on dry peptide samples with silicon nitride NP-S20 tips (Veeco Metrology, Inc., Santa Barbara, CA) using a MultiMode Scanning Probe Microscope (MM SPM) with a NanoScope IV controller. A high resolution J-type scanner was used to scan the peptide surface. Images were collected by raster scanning across a 10 μm2 area at 1024 samples (pixels) per line at a rate of 3.70 Hz. Images were processed with NanoScope Software (Veeco Metrology, Inc.).
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