Cm20 microscope

Manufactured by Philips

The CM20 microscope is an advanced laboratory instrument designed for high-resolution imaging. It features a compact, ergonomic design and delivers exceptional optical performance. The CM20 is capable of providing detailed visual analysis of a wide range of samples.

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Lab products found in correlation

Pw 1710 x ray diffractometer, by Philips (1 mentions) Asap 2010, by Micromeritics (1 mentions) Jsm 5610lv, by JEOL (1 mentions) Empyrean instrument, by Malvern Panalytical (1 mentions) Spectrum one spectrometer, by PerkinElmer (1 mentions) Asap 2020, by Micrometrics (1 mentions) Fls920p, by Edinburgh Instruments (1 mentions) Escalab mkii 250, by Thermo Fisher Scientific (1 mentions) Spectrum 100 ftir spectrometer, by PerkinElmer (1 mentions) Precision ion polishing system, by Ametek (1 mentions)

Spelling variants of this product

CM20 transmission electron microscope (8 citations) CM20 electron microscope (4 citations) CM20 TEM microscope (2 citations) Model CM20 microscope (2 citations)

7 protocols using cm20 microscope

Microstructural Characterization of Ti-64 SLM

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Light optical microscopy (LOM) and scanning electron microscopy (SEM) of Ti-64 SLM samples prepared by grinding and polishing—including a 3-µm diamond suspension and SiO₂-H₂O-H₂O₂ for the last two steps—was carried out employing a ZEISS LSM 700 and a dual beam FEI Helios Nanolab 600i (electron and Ga⁺) setup with an integrated SEM unit, respectively. A solution of H₂O + 4.5 mol/L KOH + 2.5 mol/L H₂O₂ with a soaking time of 80 s was used to etch the samples for LOM examination. SEM analysis was operated in backscattered electron mode (BSE).
Thin-foil specimens were prepared for transmission electron microscopy (TEM) from 3-mm discs by mechanical grinding to a thickness of 100 µm and subsequent electro-polishing using an electrolyte containing 59% methanol, 35% ethylene glycol monobutyl ether and 6% perchloric acid at −20 °C and 25 V. The samples were examined using a Philips CM20 microscope operated at 200 kV.

Barriobero-Vila P., Gussone J., Haubrich J., Sandlöbes S., Da Silva J.C., Cloetens P., Schell N, & Requena G. (2017). Inducing Stable α + β Microstructures during Selective Laser Melting of Ti-6Al-4V Using Intensified Intrinsic Heat Treatments. Materials, 10(3), 268.

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Nanomaterial Characterization Techniques

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Characterization of the nanomaterials involved various techniques. Scanning electron microscopy (SEM) images were obtained using a ZEISS FE-SEM ULTRA Plus microscope equipped with an EDX analyzer and a Philips CM20 microscope, operating at an accelerating voltage of 200 kV. Sample dispersion was deposited onto an aluminium pin stub and left to evaporate at room temperature³³. X-ray diffraction (XRD) measurements were conducted using a Philips PW1710 X-ray diffractometer with Cu Ka radiation (k = 1.54186 A°). The XRD patterns were recorded within the 20° to 70°2Ɵ range with a step size of 0.020°2Ɵ and a collection time of 10 s per step. FT-IR spectra were recorded using a Nicolet 6700 infrared spectrophotometer to identify specific functional groups present on the surface. Based on the Brunauer–Emmett–Teller (BET) model, the precise surface area and pore volume were calculated using Micromeritics ASAP 2010 to collect N₂ sorption isotherms. The samples were first outgassed under vacuum at 60 °C overnight, before being examined at 77 K.

Attia Y.A., Ezet A.E., Saeed S, & Galmed A.H. (2024). Nano carbon-modified air purification filters for removal and detection of particulate matters from ambient air. Scientific Reports, 14, 621.

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Microstructural Analysis of Interstitial TWIP-TRIP-HEA

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The microstructures of the alloy in homogenized (coarse-grained) and recrystallized (grain-refined) states were analyzed using various methods. X-ray diffraction (XRD) measurements were performed using an X-Ray equipment ISO-DEBYEFLEX 3003 equipped with Co Kα (λ = 1.788965 Å) radiation operated at 40 kV and 30 mA. Electron backscatter diffraction (EBSD) measurements were carried out by a Zeiss-Crossbeam XB 1540 FIB scanning electron microscope (SEM) with a Hikari camera and the TSL OIM data collection software. Back-scattered electron imaging (BSEI) and electron channeling contrast imaging (ECCI, ref. 23 ) analyses were performed on a Zeiss-Merlin instrument. The bulk chemical composition of the interstitial TWIP-TRIP-HEA was measured by wet-chemical analysis. The elemental distributions in homogenized and recrystallized alloys were investigated using energy-dispersive X-ray spectroscopy (EDS) and atom probe tomography (APT) (LEAP 3000X HR, Cameca Inc.). Transmission Electron Microscopy (TEM) investigations were conducted on electrochemically prepared samples using a Philips CM20 microscope operated at 200 kV.

Li Z., Tasan C.C., Springer H., Gault B, & Raabe D. (2017). Interstitial atoms enable joint twinning and transformation induced plasticity in strong and ductile high-entropy alloys. Scientific Reports, 7, 40704.

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Comprehensive Materials Characterization

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All chemicals used in this project were purchased from Sigma-Aldrich. The chemicals were utilized as such, however, when necessitated, were purified by common techniques, that is, recrystallization and distillation. FTIR spectra were traced on the PerkinElmer Spectrum One spectrometer. By exploiting the Vario EL cube, elemental analyses were obtained. Using the Empyrean instrument from PANalytical, the PXRD (X-ray powder diffraction) patterns were collected by engaging monochromatic Cu Kα under ambient conditions. SEM (scanning electron microscopy) images were executed on the JEOL (0.5–35°KV, JSM-5610LV). HRTEM (transmission electron microscopy) studies were performed using the Philips CM20 microscope functioned at 200°KV. On behalf of the PerkinElmer PHI (5000C ESCA), the XPS (X-ray photoelectron spectroscopy) analysis was completed. With the help of N₂ adsorption/desorption isotherms collected on to the Micrometrics instrument (ASAP 2020) at 77°K temperature, the pore size and BET surface area measurements were perceived. Although prior to BET analysis, the prepared materials were thoroughly degassed overnight by providing 150 °C temperature.

Ahmed Malik W.M., Afaq S., Mahmood A., Niu L., Yousaf ur Rehman M., Ibrahim M., Mohyuddin A., Qureshi A.M., Ashiq M.N, & Chughtai A.H. (2022). A facile synthesis of CeO2 from the GO@Ce-MOF precursor and its efficient performance in the oxygen evolution reaction. Frontiers in Chemistry, 10, 996560.

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Microstructural Characterization of Mg-1Y-0.5Zn Alloy

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An Mg-1Y-0.5Zn (wt. %) alloy was molten and cast in an induction furnace under 20 bar pressure Ar atmosphere. The cast material was solution-treated at 500 °C for 10 h, followed by air cooling. Further aging was carried out at 300 °C for 10 h, followed by water quenching. The samples for TEM were cut into discs with a diameter of 3 mm and a height of 1 mm using electric discharge machining. The discs were ground to a thickness of 150–200 µm, then twin-jet electro-polished in a solution of 5.3 g lithium chloride, 11.2 g magnesium perchlorate, 500 ml methanol and 100 ml 2-butoxy-ethanol at −30 °C. The bright-field TEM images and related selected-area diffraction patterns were obtained with a Philips CM20 microscope. High-angle annular dark-field (HAADF) imaging and energy dispersive x-ray spectroscopy (EDXS) mapping were performed on an FEI Titan G2 80–200 and a ChemiSTEM microscope equipped with a high-brightness field emission gun, a probe spherical aberration corrector and a super-X EDXS system^{36 (link)}. The microscopes were operated at 200 kV. The EDXS data were processed using the software Esprit.

Kim J.K., Jin L., Sandlöbes S, & Raabe D. (2017). Diffusional-displacive transformation enables formation of long-period stacking order in magnesium. Scientific Reports, 7, 4046.

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Comprehensive Characterization of Copper Nanocrystals

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UV-visible and PL spectra were collected using a Varian Cary 50 UV-visible spectrophotometer and a Varian Cary Eclipse fluorescence spectrometer, respectively. TEM images were recorded on a Philips CM 20 microscope. XPS measurements of Cu NCs were conducted on an ESCALAB-MKII 250 photoelectron spectrometer (Thermo, USA). MALDI-TOF MS spectra were recorded using a mass spectrometer (Bruker Daltonics, USA). FTIR spectra of GSH and Cu NCs were recorded on a Perkin-Elmer Spectrum 100 FTIR spectrometer. Time-resolved PL decay curves were collected on a time-correlated single-photon counting setup under excitation with a 320 nm laser. PL decay curves were fitted with two-exponential functions in the form of eqn (1): where τ₁ and τ₂ represent the decay constants, and B₁ and B₂ represent the normalized amplitudes of each component. The amplitude-weighted average lifetime of the entire photoluminescence decay process was calculated using eqn (2):
Absolute PL QY was determined using a spectrofluorometer (FLS920P, Edinburgh Instruments) equipped with an integrating sphere. The LED parameters, including CIE color coordinates, CRI, and color temperature, were recorded using a high-accuracy array rapid spectroradiometer (Haas-2000, Everfine Co., Ltd., China) equipped with an integrating sphere.

Wang Y., Shi Y.E., Li T., Wang H., Li Y., Xiong Y., Peng S, & Wang Z. (2018). Ligand-assisted reduction and reprecipitation synthesis of highly luminescent metal nanoclusters. Nanoscale Advances, 1(2), 834-839.

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Thin Foil Preparation for TEM

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The thin foil for TEM observations was cut at 45° from the compression axis and prepared by slow mechanical polishing and dimpling down to a few microns. Subsequently the thin foil was glued on molybdenum grid and thinned down to electron transparency in a Precision Ion Polishing System (PIPS from Gatan). TEM observations were performed on a Phillips CM20 microscope operating at 200 kV.

Guitton A., Joulain A., Thilly L, & Tromas C. (2014). Evidence of dislocation cross-slip in MAX phase deformed at high temperature. Scientific Reports, 4, 6358.

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