Labram hr800
The LabRAM HR800 is a high-resolution Raman spectrometer designed for advanced materials analysis. It features a high-performance optical system, a sensitive CCD detector, and a range of laser excitation sources for versatile sample analysis.
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267 protocols using labram hr800
Electrochemical Impedance Measurement for Solid Oxide Fuel Cells
Structural and Surface Characterization of Scaffolds
Surface characteristics of the scaffolds were recorded using an FTIR spectrometer (Thermo Scientific, Nicolet iS50R, Waltham, America) and a Raman spectrometer (LabRAM, HR800, Horiba JobinYvon, France). FTIR was measured at a resolution of 4 cm−1 in the frequency range of 400–5000 cm−1, while the Raman spectra analysis was performed using a scanning range of 100–4000 cm−1. The excitation source was a 30 mW diode laser with a 532 nm wavelength. The X-ray diffraction (XRD) analysis was determined using an X-ray diffractometer (XRD, Empyrean, Netherlands) with Cu-Kα radiation in the range of 5°–90° (2θ).
Raman Spectroscopy of Material Composition
The acquisitions were made on the spectral range of 350 cm À1 e 1750 cm À1 , with an integration time of 30 s and one accumulation. Three spectra were acquired for each point, and six points were analyzed in all samples. The spectra were de-spiked, and the background was subtracted using a user-defined baseline correction routine in Matlab (The MathWorks Inc., Natick, Massachusetts, USA). Next, three spectra per point were averaged, and the resulting spectrum was smoothed using a sliding average over seven points algorithm in a Matlab routine. Finally, spectra were normalized to the phenylalanine ring breathing band intensity at 1004 cm À1 , which is distinct and constant between samples 28 .
Comprehensive Graphene Characterization
Comprehensive Biochar Characterization Protocol
Thermal and Spectroscopic Characterization of CMO Polymorph Mixture
Raman Spectroscopy Analysis Procedure
Characterization of Surface Topography and Material Properties
Characterization of Ni/MWCNTs Nanocomposite
Characterization of TiO2 Thin Films
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