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267 protocols using labram hr800

1

Electrochemical Impedance Measurement for Solid Oxide Fuel Cells

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For the electrochemical impedance measurement, Pt (Sino-Platinum Metals Co., Ltd) was used as the counter and reference electrode prepared by baking screen-printed Pt paste on the other side of the BZCYYb substrate (symmetrically opposite to the prepared anode) in air at 750°C for 0.5 h. The gap between the round-shaped counter and ring-shaped reference electrode was 4.8 mm. Pt mesh and wire were used as the current collector and measuring lead. The anode was sealed onto the cell holder (Al2O3 tube) by a Ceramabond® glass sealant (Aremco Product, Inc.). Wet (3 mol.% H2O) H2 or CH4 was fed to the anodes at a constant flow rate of 100 ml min−1; and ambient air was supplied to the cathode at 250 ml min−1. Electrochemical impedance spectra (EIS) were obtained at open circuit with voltage amplitude of 20 mV in the frequency range from 106 to 10−1 Hz by using an impedance/gain phase analyzer (Solartron 1260) and an electrochemical interface (Solartron 1287). The full cell test was conducted at 200 mA cm−2. The anodes exposed to wet and dry CH4 for various time at 750°C were subjected to SEM examination and Ramann spectroscopy (RS, LabRAM HR800, Horiba JobinYvon) for carbon detection.
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2

Structural and Surface Characterization of Scaffolds

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The scaffolds were coated with platinum before observation. The microstructure of scaffolds was then observed by a field emission scanning electron microscope (FESEM, Nova NanoSEM, Netherlands) at an accelerating voltage of 10 kV. The diameter of nanofibers was calculated using representative images in OriginPro 9 Software.
Surface characteristics of the scaffolds were recorded using an FTIR spectrometer (Thermo Scientific, Nicolet iS50R, Waltham, America) and a Raman spectrometer (LabRAM, HR800, Horiba JobinYvon, France). FTIR was measured at a resolution of 4 cm−1 in the frequency range of 400–5000 cm−1, while the Raman spectra analysis was performed using a scanning range of 100–4000 cm−1. The excitation source was a 30 mW diode laser with a 532 nm wavelength. The X-ray diffraction (XRD) analysis was determined using an X-ray diffractometer (XRD, Empyrean, Netherlands) with Cu-Kα radiation in the range of 5°–90° (2θ).
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3

Raman Spectroscopy of Material Composition

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RM (LabRAM HR 800, Horiba Jobin Yvon, Villeneuve d'Ascq, France) was used in wet conditions on the radial plane. This technique uses Raman inelastic scattering to obtain information on the chemical composition of the material 27 . A 532-nm laser was used to excite the electrons within the material. The 40X immersion objective (LUMPLFLN 40XW, Olympus) and numerical aperture (NA) of 0.8 produced a laser spot approximately 0.8 mm in diameter.
The acquisitions were made on the spectral range of 350 cm À1 e 1750 cm À1 , with an integration time of 30 s and one accumulation. Three spectra were acquired for each point, and six points were analyzed in all samples. The spectra were de-spiked, and the background was subtracted using a user-defined baseline correction routine in Matlab (The MathWorks Inc., Natick, Massachusetts, USA). Next, three spectra per point were averaged, and the resulting spectrum was smoothed using a sliding average over seven points algorithm in a Matlab routine. Finally, spectra were normalized to the phenylalanine ring breathing band intensity at 1004 cm À1 , which is distinct and constant between samples 28 .
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4

Comprehensive Graphene Characterization

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Raman spectra were obtained with Horiba LabRAM HR-800 with 532 nm and 633 nm laser. AFM (Bruker dimension icon) was used to characterize the morphology of the graphene samples. The element analysis was performed by XPS (Kratos Analytical AXIS-Ultra with monochromatic Al Kα X-ray). The roughness of as-transferred graphene and the thickness of OVMs and Polymer films were measured by using the white light interferometer (BW-S501). The optical transmittance of graphene was measured using a UV-VIS-NIR Spetrometer (Perkin-Elmer Lambda 950)
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5

Comprehensive Biochar Characterization Protocol

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Scanning electron microscopy (SEM, Hitachi Limited SU-70, Tokyo, Japan) was used to be examined the appearance and morphology of biochar samples. The specific surface areas (SSAs), total pore volume (Vt), and porosity were measured by an N2 absorption and desorption analyzer (Quantachrome, QI3, Boynton Beach, FL, USA) at 77 K. The surface organic functional groups were characterized using Fourier transform infrared spectroscopy (FTIR, Thermo Fisher Nicolet iS50, Waltham, MA, USA). Raman spectroscopy (Raman, HORIBA Jobin Yvon LabRAM HR800, Montpellier, French) recorded the degree of defects and graphitization. X-ray diffraction (XRD, PANalytical X’Pert Pro MPD, Heracles Almelo, The Netherlands) was used to characterize the crystalline structure of biochar. The surface composition and chemical valence of biochar was analyzed by X-ray photoelectron spectroscopy (XPS, Scientific Thermo Fisher K-Alpha, Waltham, MA, USA). Hydrophilic properties were calculated using the contact angle gauges. The zeta potential of biochar was determined using the laser particle sizer (Zeta, Malvern nano ZS & Mastersizer, Malvern, UK). A vibrating sample magnetometer (VSM, Lake Shore Lake Shore 7404, Westerville, OH, USA) was used to detect the magnetization of biochar.
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6

Thermal and Spectroscopic Characterization of CMO Polymorph Mixture

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Temperature variable X-ray di raction of the CMO polymorph mixture was examined by X-ray the obtained CMO polymorph mixture and its temperature derivatives was studied using field emission scanning electron microscopy (Zeiss Ultra Plus, Germany) and high resolution transmission electron microscopy (JEOL Ltd. Tokyo Japan, JEM-2200FS). The thermal analysis was done using differential scanning calorimetric (DSC) measurement/thermogravimetric analysis (Netzsch 404 F3, Selb). The Raman spectra of the of the nominal CMO polymorph mixture and its temperature derivative compounds were recorded using a spectrometer (LabRam HR800, Horiba Jobin-Yvon, Villeneuve-88 nm Ar + laser. Fisher Scientific, ESCALAB -ray source was used for XPS analysis with the spectrometer calibrated with reference energies of Au 4f5/2 (83.9±0.1 eV) and Cu 2p3/2 (932.7±0.1 eV). A take-off angle of 90° was maintained between the surface and the analyser for the measurement. For the sample charging correction, the C 1s peak with a binding energy at 284.8 eV corresponding to the surface contamination was used for binding energy calibration. 42 The reflectance spectrum was recorded using a UV-Vis spectrophotometer (Shimadzu UV-2600 spectrophotometer) with a Shimadzu integrating sphere ISR-2600Plus (covering wavelength range 220-1400 nm).
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7

Raman Spectroscopy Analysis Procedure

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Raman spectroscopy measurements were performed using a LabRam HR800 (Horiba-Jobin Yvon, Ltd., Kyoto, Japan) instrument characterized by a focal length of 800 mm and edge filters. The analyses were done using the 458 nm excitation wavelength of a water-cooled Ar+ laser and a 600 lines/mm grating. The detector is a CCD camera with a Peltier effect cooling system. The spectral resolution was around 2 cm−1, and calibration was checked with respect to the 520 cm−1 silicon band. The spectrometer is coupled to an Olympus microscope equipped with a 50× Olympus objective, which allows a ~3 µm diameter spot size. The laser power was adjusted depending on the analyzed sample (nearly 12 mW at the sample for most of them), and the counting time was between 30 s to 1 min.
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8

Characterization of Surface Topography and Material Properties

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Surface topography was observed by Dimension FastScan Bio (atomic force microscopy (AFM)) (Bruker Corp., Billerica, Germany) using tapping mode, and Nova Nano SEM 450 (FEI Company, Hillsboro, OR, USA). Raman spectroscopy measurements were performed using Lab Ram HR800 (Horiba, Ltd., Kyoto, Japan) with a 514 nm laser. The binding energy was measured by ESCALAB 250XI (XPS) (Thermo Fisher Scientific Inc., Waltham, MA, USA). The measurements of electrical characterizations were performed by a Keithley 2602 source meter (Keithley Instruments LLC., Solon, OH, USA).
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9

Characterization of Ni/MWCNTs Nanocomposite

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The crystalline structure of the Ni/MWCNTs was characterized using X-ray powder diffraction (XRD) on a Rigaku Dmax 2200 diffractometer with Cu Kα radiation (λ = 1.5416 Å). The morphology and microstructures were analyzed by a scanning electron microscope (SEM, Quanta 250 FEG) a field emission scanning electron microscope (FESEM, JEOL JSM-7500F), and a transmission electron microscope (TEM, JEOL JEM-2100F). Raman spectroscopy (Horiba Jobin Yvon, LabRAM HR800) was used to record the properties of samples in the range of 200–2,000 cm−1 with an excitation wavelength of 514.5 nm. The chemical composition of the samples was examined by X-ray photoelectron spectroscopy (XPS) using ESCA Lab MKII X-ray photoelectron spectrometer. The magnetic properties were carried out on a Lakeshore Vibrating Sample Magnetometer (VSM, Riken Denshi Co. Ltd, Japan).
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10

Characterization of TiO2 Thin Films

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Contact profilometry (Dektak XT, Bruker, MA, USA) was used for the measurements of the film thickness. The TiO2 thin films structure was determined by micro-Raman spectroscopy (Horiba Jobin-Yvon LabRam HR800, Horiba, Kyoto, Japan) in the visible range. The surface morphology and surface roughness were obtained by atomic force microscopy (Dimension Fast Scan, Bruker, MA, USA). A Lambda 900 (Bruker) UV–vis–nIR spectrophotometer was used for recording the UV-vis transmittance spectra (300 nm–800 nm) of the deposited TiO2 thin films. TiO2 thin films wettability was characterized right after the deposition and during prolonged storage of the films in dark ambient conditions. The static contact angle of 2 μL deionized water drops was measured under room temperature and RH 55–60%, using a commercial contact angle goniometer (Kruss, DSA100, Kruss Scientific, Hamburg, Germany). The photoinduced conversion to superhydrophilicity was evaluated by discrete measurements of the sessile drop in time intervals (2–3 min) under exposure in UV radiation [23 (link)].
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