5600lv scanning electron microscope
The JEOL 5600LV is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a low-vacuum mode that allows for the examination of non-conductive specimens without the need for extensive sample preparation. The 5600LV provides a magnification range of up to 300,000x and a spatial resolution of up to 3.5 nm, making it a versatile tool for various applications in material science, nanotechnology, and other fields.
Lab products found in correlation
16 protocols using 5600lv scanning electron microscope
SEM Imaging of Ascomycete Ascospores
cryo-SEM Analysis of Rhizopus-Burkholderia Interaction
Scanning Electron Microscopy of Endothelial Cells
Cryogenic SEM of Fungal Colonies
Cryogenic SEM Imaging of Acremonium
SEM Microparticle Imaging Analysis
Cryo-SEM Visualization of Cladosporium
Scanning Electron Microscopy of Dried Mycelium
Preparation of Microbial Samples for SEM Analysis
Cryo-SEM Imaging of Agar Samples
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