X pert pro pw3040 60

The X-ray
diffraction (XRD) Panalytical X’pert PRO PW3040/60 equipped
with radiation source Cu/Kα (λ = 1.5405 Å) was utilized
to evaluate structural properties of the pure and 1Co–In₂O₃, 1Ni–In₂O₃, and
1Cu–In₂O₃ products. The morphological
and microstructural features were examined by a ZEISS-AURIGA field
emission-scanning electron microscope (FE-SEM) and JEOL HR-TEM-2100
high-resolution transmission electron microscope, respectively. The
surface area and pore diameter analyses were performed utilizing the
Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda
(BJH) methods on a Micromeritics TRISTAR 300 surface area analyzer.
The Horiba Quantamaster spectrometer was used to obtain photoluminescence
(PL) spectra under an excitation wavelength of 325 nm.

Structural characterization of the nanoparticles was done using FTIR and XRD. For FTIR, particles were analysed using Frontier™ IR/NIR FTIR (Perkin Elmer) spectrophotometer within the spectral region from 500–4000 cm⁻¹ with a resolution of 4 cm⁻¹ and 32 scans per spectra. Persistence of the structural properties i.e. presence of amide I, amide II and amide III bonds was checked which is crucial for retaining the biological properties of the SFNps. Amorphous and crystalline nature of the SFNps were measured by using XRD. X-ray diffraction facility (PANalytical, X'PertPRO PW3040/60) instrument was used with CuKα radiation (λ = 1.54 Å) having a 2θ range within angles 5–40° with a voltage of 40 kV and 40 mA current.
Thermal stability of the AA-SFNps was determined by using Perkin Elmer, DSC 6000 (USA) instrument under a dry nitrogen gas flow of 50 ml min⁻¹. The samples were heated at 5 °C min⁻¹ from 30 to 400 °C. The percentage weight loss of the SFNps was determined by TGA, using a TGA 4000 (Perkin Elmer, USA) system. Samples were heated from 30 to 800 °C with a gradual increase of 2 °C min⁻¹ under inert nitrogen atmosphere. In all the above cases, a comparative study was done with BM-SFNps under similar conditions.