X pert diffractometer

Transmission electron microscopy (TEM) images and energy dispersive X-ray analysis (EDX) were recorded using JEM-2000FX (JEOL, Japan) at accelerating voltage 200 kV. Drops of the material suspension were transferred to a carbon-coated Cu grid (3 mm) on a filter paper, which was dried using a Lamb 100 W for 30 min. Scanning electron microscopy (SEM) images and EDX were recorded using JSM-7000 (JEOL, Japan) at accelerating voltage 15 kV. The material suspension was dropped on a carbon-coated holder and dried as described for TEM. X-ray diffraction (XRD) of the bare magnetic nanoparticles was recorded using a PANalytical X’Pert diffractometer (Germany, accelerating voltage 45 mV, current 40 mA). Zeta potentials were estimated at 25 °C using Malvern Zetasizer Nano ZS particle analyzer (Malvern Instruments Ltd., Malvern) at a wavelength of 532 nm with a solid-state He–Ne laser at a scattering angle of 173°.

Powder X-ray diffraction (PXRD) was performed on a PANalytical X'pert diffractometer with a Cu Ka radiation. Transmission electron microscopy (TEM) was performed on a FEI tecnai G2 F30 microscope operated at 200 kV. The morphology of g-C₃N₄/MS was observed through scanning electron microscopy (SEM) on a ZEISS EVO MA15 microscopy. The Fourier transform infrared (FT-IR) spectra were measured using a Nicolet 6700 spectrometer on samples embedded in KBr pellets. UV-vis diffuse reflectance spectrum (DRS) data were recorded on a Shimadzu UV-2600 spectrophotometer. Photoluminescence spectra were recorded on F-7000 FL spectrofluorometer with an excitation wavelength at 320 nm. X-ray photoelectron spectroscopy (XPS) was performed by using a Thermo Scientific Escalab 250Xi spectrometer. The specific surface area (SSA) was determined via using methylene blue (MB) adsorption method on a UV-vis spectrophotometer (UV-5100, Anhui Wanyi; Tran et al., 2015 (link)), the SSA of g-C₃N₄ and g-C₃N₄/MS were calculated by the following equation:
Where N_A represents Avogadro's constant (6.02 × 10²³ mol⁻¹), A_MB represents the covered area of per MB molecule (typically assumed to be 1.35 nm²), C_o and C_e are the initial and equilibrium concentrations of MB, V is the volume of MB solution, M_MB is the relative molecular mass of MB, and m_s is the mass of the sample.

Surface analyses of the anodized alloy were performed as previously described (Masahashi et al., 2017 (link), 2019 (link); Masahashi et al., 2021 (link)). The microstructure of the samples was observed using scanning electron microscopy (SEM; VE-8900, Keyence, Japan), laser microscopy (VK-X 150, Keyence, Japan), and analyses by X-ray Diffraction (XRD; X’Pert diffractometer, PANalytical, Netherlands) with a thin-film geometry arrangement using a 0.5° glancing angle, and a rotating detector was also performed. The upper surface of the samples was analyzed by X-ray photoelectron spectroscopy (XPS) equipped with an electron spectrometer (Kratos AXIS-Ultra DLD, Shimadzu, Japan) with monochromated Al Kα radiation at a base pressure of 3.0 × 10^–7 Pa. The full width at half maximum intensity of the Ag 3d5/2 peak was 0.73 eV, and the base pressure of the spectrometer was 6.5 × 10^–8 Pa. The analysis of absorption spectrum was performed using a UV-vis spectrophotometer (V-550, Jasco, Japan).

The powder samples were analysed in an aluminium sample-holder 0.2 mm deep. The film samples were deposited on quartz plates by using the same conditions used for the preparation of the phenothiazine layers for hole-only devices. After the deposition, the film samples were thermally annealed in the same conditions used for the related devices. The XRD scans were performed in the interval 5–60° (2theta) with a PANalytical X’Pert diffractometer in reflection geometry equipped with a copper anode (λmean = 1.5418 Å) and a fast X’Celerator detector.

The samples were characterized by powder X-ray diffraction (XRD) performed on a Panalytical X’Pert diffractometer using Cu Kα radiation (λ = 0.154187 nm). All of the patterns within the 10–90° 2θ range were collected in a scanning mode with a step size of 0.02°. The morphology patterns of samples were obtained on a field emission scanning electron microscope (SEM JSM-6700F) equipped with an Energy Dispersive Spectrometer spectra (EDS) and transmission electron microscope (TEM JEOL-2010). Thermogravimetric (TG) testing was made by using a NETZSCH STA2500 Regulus TG analyser. The Sc₂(MoO₄)₃:20%Yb/1%Er phosphor was placed in an alumina TG crucible on a TG sample tray and heated from 298 to 773 K at a heating rate of 5 K/min and mass loss was monitored during the heating process. The samples were purged with N₂ at 50 mL/min and 100 mL/min blow/sweep gas during the test. Nociolet 6700 Fourier transform infrared spectrophotometer (FTIR) with an MCT detector with low temperature was used for in situ temperature-dependent FTIR spectroscopy measurements. Spectra were obtained over the 4000–650 cm⁻¹ range for both sample and background single beam measurements.