X pert highscore software 2.2b

X-Ray Diffraction analysis (XRD; 2θ within 10–70°) was performed on both as-quenched glass and crushed sintered scaffolds to detect the presence of crystalline phases. A X’Pert Pro PW3040/60 diffractometer (PANalytical, Eindhoven, The Netherlands) was used; parameters used for the measurement were: operating voltage 40 kV, filament current 30 mA, Bragg-Brentano camera geometry with Cu Kα incident radiation (wavelength λ = 0.15405 nm), step size 0.02°, and a fixed counting time per step of 1 s. Identification of crystalline phase was carried out by using X’Pert HighScore software 2.2b (PANalytical, Eindhoven, The Netherlands) equipped with the PCPDFWIN database (http://pcpdfwin.updatestar.com).

X-ray diffraction analysis (XRD; X’Pert Pro PW3040/60 diffractometer, PANalytical, Eindhoven, Netherlands) was performed on MD-47.5B, DG-120, SG-625 and SG-800 powders to assess the microstructural features of the various materials and identify the presence of crystalline phases deriving from the thermal treatment. The analysis was performed using a Bragg–Brentano camera geometry with a Cu Kα incident radiation (wavelength λ = 0.15405 nm). The 2θ angle was varied in a range of 10°–70°; voltage and current were fixed at 40 kV and 30 mA, respectively. Step counting time for data acquisition was set at 1 s with a step size of 0.02°. Powder size for SG-625 and SG-800 was below 32 µm. Crystalline phases were identified by using X’Pert HighScore software 2.2b (PANalytical, Eindhoven, The Netherlands) equipped with the PCPDFWIN database.