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Leica scd500

Manufactured by Leica Microsystems
Sourced in Germany

The Leica SCD500 is a sputter coater designed for sample preparation in electron microscopy. It is used to apply a thin conductive coating on non-conductive samples to enhance their surface conductivity, enabling high-quality imaging and analysis in scanning electron microscopes.

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5 protocols using leica scd500

1

Visualizing AuNP and C-CPE-AuNP Binding on Cells

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To examine the binding of AuNPs and C-CPE-AuNPs on cell surfaces, the 0846 and transfected 0846-FusionRed cell lines were analyzed with SEM. Confluent cells were treated with AuNPs and C-CPE-AuNPs for 3 h in a cell culture incubator to allow complex adhesion to the cells. The cells were exposed to a pulsed laser with 60 mJ/cm² at a scanning speed of 0.5 cm/s. Subsequently, the cells were fixed with 4% formaldehyde, washed with PBS, and stored for further processing. For SEM preparation, the coverslips were dehydrated with a graded series of ethanol completed with an acetone step prior to critical point drying with CO2 as an intermedium (Emitech K850 critical point dryer, Emitech/Quorum Technologies Ltd., Laughton, UK). The coverslips were flat-mounted on SEM-stubs with adhesive carbon tape (Plano, Wetzlar, Germany) and coated with a carbon layer (Leica SCD500, Leica Microsystems, Wetzlar Germany). Specimens were analyzed in a field-emission SEM (Zeiss Merlin VP compact, Carl Zeiss Microscopy, Oberkochen, Germany) equipped with HE-SE and in-lens-Duo detectors operated at 5 kV and images with a size of 1024 × 768 pixels were recorded at different steps of magnification.
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2

Scanning Electron Microscopy of Wing Basal Complex

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The basal complex of the wings was examined with SEM. Prior to the SEM, air-dried wings of the male specimen were sputter coated with a 10 nm gold-palladium layer using a high vacuum sputter coater (Leica SCD 500, Leica Microsystems GmbH, Wetzlar, Germany). For the SEM, a Hitachi TM3000 Tabletop Microscope (Hitachi High-Tech. Corp., Tokyo, Japan) at an accelerating voltage of 15 kV and a magnification of 100X–600X was used.
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3

Cryogenic Scanning Electron Microscopy

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Specimens were air-dried or freeze dried. For freeze drying specimens were rapidly frozen on a liquid nitrogen precooled polished copper block, immediately transferred to a liquid nitrogen precooled exsiccator and freeze dried under vacuum (5 × 10−2 mbar) with subsequent warming to room temperature. Membrane fracturing was performed on rapidly frozen samples under liquid nitrogen with a pair of precooled forceps. Specimens were mounted on SEM stubs with adhesive carbon tape (Plano, Wetzlar, Germany) and coated with a carbon layer of ~15–20 nm (Leica SCD500, Leica Microsystems, Wetzlar Germany). Specimens were viewed in a field-emission SEM (Zeiss Merlin VP compact, Carl Zeiss Microscopy, Oberkochen, Germany) equipped with HE-SE and in-lens-Duo detectors. Images with a size of 1024 × 768 pixels were recorded at different steps of magnification. Measurements of distances were performed using the SmartSEM measurement tools (Carl Zeiss Microscopy).
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4

Visualizing AuNPs and C-CPE-AuNPs Binding

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To examine the binding of AuNPs and C-CPE-AuNPs on cell surfaces, the DT0846 and transfected DT0846-FusionRed cell lines were analyzed with scanning electron microscopy (SEM). Con uent cells were treated with AuNPs and C-CPE-AuNPs for 3 h in cell culture incubator to allow complex adhesion to the cells. The cells were exposed to a pulsed laser with 60 mJ/cm² at a scanning speed of 0.5 cm/s. Subsequently, the cells were xed with 4% formaldehyde, washed with PBS, and stored for further processing. For SEM preparation, the coverslips were dehydrated with a graded series of ethanol completed with an acetone step prior to critical point drying with CO2 as an intermedium (Emitech K850 critical point dryer, Emitech/Quorum Technologies Ltd., Laughton, UK). The coverslips were at mounted on SEM-stubs with adhesive carbon tape (Plano, Wetzlar, Germany) and coated with a carbon layer (Leica SCD500, Leica Microsystems, Wetzlar Germany). Specimens were analyzed in a eld-emission SEM (Zeiss Merlin VP compact, Carl Zeiss Microscopy, Oberkochen, Germany) equipped with HE-SE and inlens-Duo detectors operated at 5 kV and images with a size of 1024 × 768 pixels were recorded at different steps of magni cation.
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5

Scanning Electron Microscopy of Haemonchus contortus

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H. contortus adult females treated with 800 µg/mL TA or thymol for a period of 24 hours were subsequently fixed in a 2.5% glutaraldehyde solution and in a sodium cacodylate buffer 0.1 M (CACO) for 72 h. After three washes in the same buffer, the worms were placed in 2% osmium, and posteriorly in CACO 0.1 M (pH 7.4) buffer fixative for 1 h. Samples were washed two times with CACO and distilled water and were dehydrated in a graded acetone series (30%, 50%, 70%, 90% and 100%). Critical point drying was completed using a CPD 030 (Bal-Tec, Liechtenstein), and samples on metal stubs were coated with a 10 nm layer of gold in a sputter coating machine (Leica SCD 500, Leica Microsystems, Wetzlar, Germany). Parasites were then observed with a scanning electron microscope (FEI QUANTA 200 FEG ESEM, FEI Company, USA) at an accelerating voltage of 20 kV (ANDRE et al., 2016) (link).
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