A thermogravimetry analysis/differential scanning calorimetry (TGA/DSC) system (Netzsch, STA 449C) was used to determine the suitable annealing temperature of the hydrolysis-obtained precipitate in air. The crystalline and morphology information was collected by X-ray diffraction (XRD, PANalytical X'Pert Pro X-ray diffractometer), transmission electron microscopy (TEM, FEI Tecnai G2F30, 300 kV), high-resolution TEM (HRTEM), selected area electron diffraction (SAED), and scanning electron microscopy (SEM, FEI Helios Nanolab 600i) examinations. X-ray photoelectron spectroscopy tests (XPS, PHI 5700ESCA System) and Raman spectra (JY Co. LABRAM-HR) were used to study chemical elements and bond characters. Nitrogen physisorption measurements were performed on a Quantachrome QDS-MP-30 analyzer (USA) at 77 K.
X pert pro x ray diffractometer
Manufactured by Thermo Fisher Scientific
Sourced in United States
The X'Pert Pro X-ray diffractometer is a versatile laboratory instrument designed for materials analysis. It utilizes X-ray diffraction technology to provide detailed information about the crystalline structure and composition of various materials. The core function of the X'Pert Pro is to perform non-destructive analysis of solid samples, enabling users to identify unknown materials, quantify phase compositions, and characterize thin films and coatings.
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Lab products found in correlation
Helios nanolab 600i, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f30, by Thermo Fisher Scientific (1 mentions)
Sta 449c, by Netzsch (1 mentions)
Asap 2420, by Micrometrics (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Tecnai tf20, by Thermo Fisher Scientific (1 mentions)
2 protocols using x pert pro x ray diffractometer
1
Characterization of Hydrolysis-Obtained Precipitate
2
Comprehensive Material Characterization Protocol
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Scanning electron microscopy (SEM) was carried out in a (NOVA NANOSEM 450, FEI company, USA) microscope operated at 12 mA and 5 kV. The samples were coated with a gold film prior to the observation. Transmission electron microscopy (TEM) measurements was carried out using a (Tecnai TF20, FEI company, USA) transmission electron microscope operated at an acceleration voltage of 60 kV. XRD analysis were carried out using (X'Pert PRO X-ray diffractometer, USA). The N 2 adsorption/desorption isotherms at 77 K was measured using a Nanometric instrument (Micrometrics ASAP 2420, USA). All samples were outgassed at 100°C for 6 h in vacuum prior to nitrogen adsorption/ desorption measurements.
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