Talos f200s transmission electron microscope

The powder X-ray diffraction (XRD) patterns were performed on a Panaco X′ Pert PRO X-ray diffractometer with Cu Kα radiation (l = 0.15406 nm) with the operation voltage and current maintained at 45 kV and 40 mA. Scanning speed: 1° min⁻¹, test range: 10° ≤ 2θ ≤ 70°. Fourier transform infrared spectroscopy (FT-IR) analysis was carried out on a PerkinElmer FT-IR spectrometer. The scanning electron microscope (SEM) images were determined by Zeiss MERLIN Compact SEM-EDX microanalysis. TEM images and elemental mapping analysis of the samples were obtained on a FEI Talos F200S transmission electron microscope operating at 200 kV. The chemical states of different elements were determined by Thermo ESCALAB 250XI X-ray photoelectron spectroscopy (XPS). The UV-vis absorption spectra of the samples were measured on Shimadzu UV-1780 UV-vis-NIR spectrophotometer. The absorbance of the solution during the reaction was monitored by a 722N visible spectrophotometer.

The morphology of the samples was observed by a scanning electron microscope with an operating voltage of 10 kV (SEM, Apreo S LoV ac, Thermo Fisher Scientific, Waltham, MA, USA).
The X-ray diffraction data were taken using an X-ray diffractometer with CuK radiation and a measurement range of 20–80°, (XRD, Miniflex 600, Akishima, Rigaku, Tokyo, Japan).
The transmission electron microscopy and selected area electron diffraction images were obtained from an FEI Talos F200s transmission electron microscope, operated at 200 kV (TEM, SAED, Thermo Fisher Scientific, Waltham, MA, USA).
High-resolution transmission electron microscopy was carried out on an FEI Titan Themis Z G3 30–300 spherical aberration-corrected transmission electron microscope, operated at 300 kV, equipped with both image and probe aberration (HRTEM, Thermo Fisher Scientific, Waltham, MA, USA).
X-ray photoelectron spectroscopy was used to characterize the atomic composition and state at the surface of the samples, using Al Ka rays as the excitation source (XPS, Thermo Scientific K-Alpha, Waltham, MA, USA).
The UV-Vis absorbance spectra were collected by a Cary 5000 spectrophotometer, (UV-Vis, Agilent, Santa Clara, CA, USA).
The photoluminescence spectra were acquired using a fluorescence spectroscopy test system (PL, FLS980, Edinburgh Instruments Ltd., Livingston, UK).

Photoluminescence (PL) and stability tests were acquired on an Ideaoptics FX2000-EX PL-spectrometer. Transmission electron spectroscopy (TEM) and high-angle annular dark-field scanning transmission electron microscope (HAADF-STEM) micrographs was performed on a FEI TalosF200s transmission electron microscope operating at 100 kV. Scanning electron microscopy (SEM) experiments were performed on FEI Nova NanoSEM 450. Fourier transform infrared spectroscopy (FTIR) measurements were carried out on a Thermo-Nicolet iS50 FTIR-spectrometer. The quantum efficiency (QE) measurements were carried out on an Ocean Optics QEpro QY test system under 390 nm blue laser irradiation. The infrared thermal images were recorded on an Optris PI200. The luminous efficiency and optical power were recorded on an EVERFINE ATA-1000 LED automatic temperature control photoelectric analysis and measurement system. Ultraviolet visible (UV-Vis) absorption spectra were tested on a Persee T6 UV-Vis spectrometer. Thermal gravimetric (TG) analysis was performed on a Beijing lasting Scientific Instrument Factory HCT-3 Microcomputer Differential Thermal Balance. The luminous efficiency and optical power were recorded on an EVERFINE ATA-1000 LED automatic temperature control photoelectric analysis and measurement system. The fluorescent thermal quenching was tested on an EVERFINE EX-1000 test system.