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640 ft ir spectrometer

Manufactured by Agilent Technologies

The 640 FT-IR spectrometer is a laboratory instrument designed for infrared spectroscopy analysis. It utilizes Fourier transform infrared (FT-IR) technology to measure the absorption and emission characteristics of a sample within the infrared region of the electromagnetic spectrum.

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8 protocols using 640 ft ir spectrometer

1

Characterization of Catalytic Oxidation

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The L ligand and other reagents during experimental operation were purchased from commercial sources and used directly. FT-IR were measured on a Varian 640 FT-IR spectrometer (KBr pellets). The morphological characterization was analysed by using a Hitachi S-4800 scanning electron microscope (SEM). The powder X-ray diffraction (PXRD) data was collected by using a Rigaku Ultima IV diffractometer. The catalytic reaction of oxidation of thioether was monitored by utilizing a Shimadzu Techcomp GC-7900.
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2

Comprehensive Characterization of MWCNT Samples

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The morphology and structure of the MWCNT samples were characterized by scanning electron microscopy (SEM, Nova NanoSEM 430) and high-resolution transmission electron microscopy (HRTEM, JEOL2010 at 200 kV). Laser Raman spectroscopy (JY HR800) was used to estimate the diameter and quality of the MWCNTs. X-ray diffraction (XRD) patterns of the powdered samples were recorded at room temperature using a D/Max-2500PC diffractometer with a Cu Kα non-monochromatic radiation source (λ = 1.54056 Å). Infrared spectra were recorded with a Varian 640 FT-IR spectrometer with KBr pellets in the range of 4000–500 cm−1. X-ray photoelectron spectroscopy (XPS) was performed using an Escalab 250 system with Al Kα. The specific surface area and pore structure of the samples were investigated with an automatic volumetric sorption analyzer (ASAP 2020 M) using N2 as the adsorbate at −196 °C. The zeta potentials of the various samples were obtained on a Zetasizer Nano instrument (Malvern, UK) at 298 K. The UV-vis absorption spectra were obtained using a SP-1900 UV-vis spectrophotometer.
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3

Characterization of Synthesized Materials

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All reagents and solvents employed for this synthesis were purchased from commercial sources and used as received without further purification. The elemental analyses (C, H, and N) were determined with a PerkinElmer 240C elemental analyzer. Infrared spectra were recorded with a Varian 640 FT-IR spectrometer over the range of 500–4000 cm−1 with the use of KBr pellets as sample matrices. Powder X-ray diffraction (PXRD) data was collected using a Rigaku diffractometer with Cu Kα radiation. Thermogravimetric analysis (TGA) measurements were performed with a METTLER TOLEDO thermal analyzer at a heating rate of 5 °C min−1 under a N2 atmosphere. The morphology and structure of the sample was characterized via scanning electron microscopy (SEM, Nova Nano SEM 430) and high resolution transmission electron microscopy (HRTEM, JEOL 2010 at 200 kV). The specific surface area and pore structure of the sample was investigated with an automatic volumetric sorption analyzer (ASAP 2020 M) using N2 as the adsorbate at −196 °C. X-ray photoelectron spectroscopy (XPS) was performed using an Escalab 250 with an Al Kα radiation. UV-Vis absorption spectra were recorded with the use of an SP-1900 UV-Vis spectrophotometer.
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4

Synthesis and Characterization of Ligand L

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All chemicals and solvents were purchased from commercial sources, and used without further purification before the experiment. The synthesis method of ligand L was obtained according to previous literature.21 (link) The FT-IR spectra were collected on a Varian 640 FT-IR spectrometer. Powder X-ray diffraction (PXRD) data were taken on a D/teX Ultra diffractometer by Cu Kα radiation. The collection of fluorescence experimental data was obtained by using Hitachi F-4500 fluorescence spectrometer. A diffuse reflectivity spectrum were collected with a spectrophotometer (Lambda, Model 750). The UV-vis absorption spectra was measured by a SP-1901 UV-vis spectrophotometer.
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5

Structural and Thermal Analysis of Powder Compounds

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The powder
structure was characterized by XRD using a PANalytical X-ray diffractometer
equipped with CuKα radiation. Infrared spectra were recorded
on a Varian 640 FTIR spectrometer in KBr pellets within the range
of 500–4000 cm–1. Thermal analysis was run
on a Shimadzu thermogravimetric analyzer (TGA) at a heating rate of
10 °C min–1 in a nitrogen atmosphere. IR samples
were prepared as discs obtained from a 200 mg aliquot of the powder
mixture (KBr/CP I = 100:1) desiccated for 30 min. IR spectra were
obtained using a Nicolet Magna 550 II FT-IR spectrophotometer within
the wavelength range of 4000–400 cm–1. UV/vis
absorption spectroscopy was performed with a Hitachi U-3010 spectrophotometer.
For the electrochemical study, the cyclic voltammetry curves were
acquired with an electronic assembly of a potentiostat/galvanostat
Volta Lab PGZ301 assisted by a computer and a measuring cell.
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6

Synthesis and Characterization of 3-dpyb Ligand

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The 3-dpyb ligand was prepared according to the literature method.20 The reagents were commercially available and used directly without additional purification. The powder X-ray diffraction (PXRD) patterns were obtained at 40 kV, 40 mA with Cu Kα (λ = 1.5406 Å) radiation with a D/teX Ultra diffractometer and infrared spectra (IR) were acquired on a Varian 640 FTIR spectrometer with KBr discs. The thermogravimetric analysis (TGA) experiments were recorded on a Perkin-Elmer TGA analyzer. UV-vis absorption spectra were investigated through the Perkin Elmer Lambda 750. The fluorescence spectra were measured on a Hitachi F-4500 luminescence/phosphorescence spectrometer and the fluorescence lifetime curves were obtained on an FLS1000 Transient Steady-state Fluorescence Spectrometer.
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7

Optimized FTIR Spectral Data Preprocessing

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Non-polarized FTIR spectra were collected in air using a Varian 640 FTIR spectrometer equipped with a KBr beam splitter and a deuterated triglycene sulfate (DTGS) detector. For each sample, three measurements in perpendicular directions were conducted either using diffuse reflectance (DRIFT) or with transmitted light. For each measurement, a total of 64 scans with a resolution of 1 cm -1 to 4 cm -1 were collected and averaged. This was done for the wavenumber range of 200 cm -1 to 7000 cm -1 , with a background collected at regular intervals.
As the measurements had different intervals and offsets due to differences in software version and settings, we homogenized the data so that every spectrum had a step size of 1 cm -1 . This was done by a cubic spline interpolation on the available data. As not all data were collected over the range of 200 cm -1 to 7000 cm -1 , we padded the missing values with zeroes. Further, any spectra that had a measurement with a value smaller than -5 or greater than 10 were dropped as these values were extreme outliers and not in the expected range of the measurement. This filtering reduced the data set by less than 1%. The resulting spectral data consisted of 6801 data points per measurement.
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8

FTIR Spectroscopy of Thermally Induced Changes

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The FTIR spectra were acquired using a Varian 640 FTIR spectrometer in transmission configuration under a N2 atmosphere. The average of 64 scans were acquired from 1000 cm−1 to 4000 cm−1 with a resolution of 2 cm−1. The background was subtracted automatically. Samples were sandwiched and sealed between two CaF2 windows and the 6 μm sample thickness retained using a spacer. Measurements were carried out every 3 °C from 28 to 70 °C. The temperature was controlled by a Julabo thermal bath. For accurate control of sample temperature, an external thermocouple was placed next to the CaF2 windows where the sample was sandwiched. The samples were equilibrated for 30 min before measurement at each temperature.
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