Transmission electron microscopy (TEM) images and high resolution TEM (HRTEM) images were obtained by using a transmission electron microscope (TEM, JEM-2100F, Tokyo, Japan) operated at 200 kV on carbon-coated TEM grids. Scanning electron microscopy (SEM) images was recorded by HITACHI SU8020 (Tokyo, Japan) operated at 3 kV. Dynamic light scattering (DLS) measurement was performed by using a Zeta Sizer instrument (Nano ZS, Malvern Instruments Ltd., Malvern, UK) at 25 °C. X-ray Photoelectron Spectroscopy (XPS) measurement was performed by using a PREVAC XPS/UPS System (PREVAC, Upper Silesia, Poland, Etching of the Al NPs was performed by Ar plasmon). Gel permeation chromatography (GPC) measurement was performed by using an Agilent Technologies 1260 infinity (Agilent Technologies Co. Ltd., Santa Clara, CA, USA) at 35 °C. THF was used as the eluent with an elution rate of 1.0 mL min−1, and polystyrene standards were used for calibration. The transmittance spectra were measured by a PerkinElmer Lambda 950 UV-vis-NIR spectrometer with a data interval of 2 nm in the same quartz cell.
Lambda 950 uv vis nir spectrometer
Manufactured by PerkinElmer
Sourced in United States
The Lambda 950 UV-vis-NIR spectrometer is a high-performance instrument designed for a wide range of spectroscopic applications. It covers the ultraviolet, visible, and near-infrared regions of the electromagnetic spectrum, providing accurate and reliable data. The Lambda 950 is capable of measuring the absorbance, transmittance, and reflectance properties of various samples.
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Lab products found in correlation
Axs d8 advance cu k diffractometer, by Bruker (2 mentions)
Inca 400 x max detector, by Oxford Instruments (2 mentions)
1260 infinity, by Agilent Technologies (1 mentions)
Nano z, by Malvern Panalytical (1 mentions)
Su8020, by Hitachi (1 mentions)
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
Tensor 27 infrared spectrometer, by Bruker (1 mentions)
Smartlab se x ray diffractometer, by Rigaku (1 mentions)
Quanta 400f, by Thermo Fisher Scientific (1 mentions)
Amx 500, by Bruker (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
Av700 spectrometer, by Bruker (1 mentions)
Vsp 300 potentiostat galvanostat, by Bio-Logic (1 mentions)
Re 1cp, by Bio-Logic (1 mentions)
600 mhz spectrometer, by Bruker (1 mentions)
400 mhz spectrometer, by Bruker (1 mentions)
D8 focus powder x ray diffractometer, by Bruker (1 mentions)
Tristar 2, by Micromeritics (1 mentions)
Alpha 110, by Thermo Fisher Scientific (1 mentions)
P 2300 digital polarimeter, by Jasco (1 mentions)
22 protocols using lambda 950 uv vis nir spectrometer
1
Comprehensive Characterization of Al Nanoparticles
2
Characterization of Photovoltaic Materials
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The X-ray diffraction (XRD) with Cu Kα radiation (1.5418 Å) was performed on a Y-2000 Automated X-ray diffractometer or a Rigaku Smart Lab SE X-ray diffractometer. The Fourier transform infrared (FT-IR) spectra were recorded on a Bruker Tensor 27 infrared spectrometer. The surface chemical compositions of films were characterized by X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Fisher). The surface morphologies of films were obtained using a JSM-6700F field emission scanning electron microscope (SEM) and the surface roughness was measured with a NSK SPA-300HV atomic force microscope (AFM). The absorbance and transmittance spectra were recorded by a Perkin Elmer Lambda 950 UV-Vis-NIR spectrometer. The current density–voltage (J–V) characteristics of the devices were measured with a PVIV-3A solar cell measurement system including a solar simulator and a Keithley 2400 source meter at room temperature. The AM 1.5G illumination of 100 mW cm−2 was calibrated by using a standard Si reference cell certificated by the National Institute of Metrology, China. The effective area of cells was defined as 3 mm2.
3
Comprehensive Characterization of Thin Films
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A Lambda 950 UV/vis/NIR spectrometer was used to test optical characteristics in the range of 300 nm to 600 nm (PerkinElmer, USA). At room temperature, an AXS-D8 Advance Cu-K diffractometer was used to investigate the films' structural characteristics (Bruker Corp., USA). XRD patterns examined in a 2θ range, with a step size of 0.02°, which ranged between 10° and 80°, using the Cu-Kα radiation wavelength, λ, of 1.5408 Å. FEI Quanta 400F field emission scanning electron microscope (FESEM) equipped with Oxford-Instruments INCA 400 X-Max detector for energy-dispersive X-ray spectroscopy (EDX) measurement at ×300 magnification (spot size 1 mm × 1 mm) and an accelerating voltage of 20 kV. Finally, the electrical properties of films were measured using the HMS ECOPIA 3000 Hall Effect measuring device with a 0.57 T magnetic field and 45 nA probe current, Fig. 2 , showed the Hall effect device.
4
Optical, Structural, and Electrical Characterization of Films
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With the aid of a Lambda 950 UV /VIS /NIR spectrometer, optical characteristics were determined in the wavelength range of 400 to 700 nm (Perkin-Elmer, USA). At room temperature, the structural characteristics of the films were evaluated using an AXS-D8 Advance Cu-K diffractometer (Bruker Corp., USA). Using the Cu-K radiation wavelength,, of 1.5408, we also examined the XRD patterns in a 2 range with a step size of 0.02°, ranging 10° to 80°. FEI Quanta 400F field emission scanning electron microscope (FESEM) equipped with Oxford- Instruments INCA 400 X-Max detector for energy–dispersive x-ray spectroscopy (EDX) measurements at × 300 magnification (1 mm × 1 mm spot size) and 20 kV accelerating voltage. Finally, the electrical characteristics of films were examined using an HMS ECOPIA 3000 Hall Effect measuring instrument with a 0.57 T magnetic field and 45 nA probe current. We used the Ag paste method to form an ohmic contact by adding Ag dots to each sample's four corners, and then repeated each reading for each sample ten times to improve the reliability of our findings.
5
Characterization of Chemical Compounds
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1H NMR spectra were recorded on a Jeol ECX 400, Bruker AMX 500 or on a Bruker BioSpin AV 700 spectrometer (sample concentration: 5–20 mg in 0.5 mL CDCl3 or D2O). Chemical shifts are reported in ppm (δ units). For electrospray ionization (ESI) mass spectrometry measurements, a TSQ 7000 (Finnigan Mat) instrument was used. The ESI sample was dissolved in methanol at a concentration of 10–20 µM. Absorption spectra were recorded on a LAMBDA 950 UV-vis/NIR spectrometer (PerkinElmer, USA) using disposable PS cuvettes (minimum filling volume 2.5 mL). Dynamic light scattering (DLS) measurements were performed using a Malvern Zetasizer Nano-ZS 90 (Malvern Instruments), equipped with an integrated He–Ne laser (λ = 633 nm). Prior to the measurements (all done at 25 °C), all samples were filtered through a cellulose acetate (CA) membrane filter with 0.45 μm pore size. The samples were freshly prepared in Milli-Q water at a concentration of 1 mg/mL and were measured under a scattering angle of 173°, using quartz cells.
6
Electrical and Spectroscopic Characterization of MMM
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Electrical measurements: The impedance of the MMM was measured at open-circuit potential in the SC-ISE setup using a Bio-Logic VSP-300 potentiostat/galvanostat equipped with an impedance channel and a low-current option. A Ag/AgCl (sat. KCl) reference electrode (RE-1CP, Bio-Logic) and a Pt counter-electrode (Bio-Logic) were used. ISE potentials were measured in reference to the same reference electrode using a Burr-Brown INA116 instrumentation amplifier having an input impedance >1015 Ω. The gain was set at 10. The potential from the preamplifier was digitized using a Keysight U2351A USB data acquisition device at 10 kS/s and smoothed by averaging within a half-second window using National Instruments’ LabView programming environment. In order to minimize any hysteresis during the measurements, the ISE was rinsed thoroughly after each run.
UV-vis measurements: The UV-vis spectra were recorded using a dual-beam PerkinElmer Lambda 950 UV/VIS/NIR Spectrometer. Quartz cuvettes with 10 mm optical length were used.
UV-vis measurements: The UV-vis spectra were recorded using a dual-beam PerkinElmer Lambda 950 UV/VIS/NIR Spectrometer. Quartz cuvettes with 10 mm optical length were used.
7
Spectroscopic Analysis of Metallofullerene Derivatives
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Ultraviolet/visible–near-infrared spectra of purified metallofullerene derivatives (Supplementary Fig. 8 ) were collected on Lambda 950 UV/Vis/NIR Spectrometer (PerkinElmer Instruments). 1H NMR spectra of FSc3N@C80PNOH was measured in chloroform-d on a Bruker 600 MHz spectrometer (Supplementary Fig. 9 ).
8
Comprehensive Characterization of Material Powders
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Powder X-ray diffraction (XRD) patterns of the samples were characterized on a D8 Advance X-ray diffractometer (Bruker AXS, Karlsruhe, Germany) with Cu Kα radiation. The morphologies of the powders were analyzed by a Phenom Pro scanning electron microscope (Phenom Pro, Eindhoven, The Netherlands). The UV–vis spectra were measured by a Lambda 950 UV/vis/NIR spectrometer (Perkin Elmer, Waltham, MA, USA). The Fourier IR spectroscopy was performed by using a Nicolet-670 Fourier transform infrared spectrometer (ThermoFisher, Carlsbad, CA, USA).
9
Spectrophotometric Characterization of Dyes
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Due to the limited solubility of dyes in phosphate-buffered saline (PBS), 0.9% saline, and blood plasma, ICG and IR-820 were first dissolved in ultrapure water to obtain a dye concentration pf 0.5 mg/mL and then diluted further with PBS, 0.9% saline, or blood plasma to reach working solutions in the concentration range of 1–50 μg/mL. Measurements were performed using a Lambda950 UV/VIS/NIR spectrometer (PerkinElmer, Waltham, MA, USA), quartz cuvettes, and a microplate reader with 96-well plates. Absorption spectra were recorded in the wavelength range from 500 to 900 nm.
10
Comprehensive Materials Characterization Protocol
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Solid state Fourier 13C NMR spectra were measured on a Bruker 400 MHz spectrometer. Transform infrared (FT IR) spectra were recorded on a JASCO model FT IR-6100 infrared spectrometer. X-ray diffraction (XRD) data were recorded on a Bruker D8 Focus Powder X-ray Diffractometer by using powder on glass substrate, from 2θ = 2° up to 30° with 0.5° increment. TGA measurements were performed on a Discovery TGA under N2, by heating from 30 °C to 800 °C at a rate of 10 °C min−1. Nitrogen sorption isotherms were measured at 77 K with a TriStar II instrument (Micromeritics). The Brunauer–Emmett–Teller (BET) method was utilized to calculate the specific surface areas. By using the non-local density functional theory (NLDFT) model, the pore volume was derived from the sorption curve. Morphology images were characterized with a Zeiss Merlin Compact filed emission scanning electron microscope (FE-SEM) equipped with an energy-dispersive X-ray spectroscopy (EDS) system at an electric voltage of 5 KV. UV-vis spectra were recorded on a PerkinElmer Lambda 950 UV/VIS/NIR spectrometer.
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