Xtalab synergy i

Single crystals of compounds 1 and 2 were obtained by slow diffusion of less solubilizing solvent vapor (Et₂O) into more solubilizing solvent (CHCl₃) at 10 °C. Crystal data for these crystals are summarized in Table S1.† X-ray diffraction data were collected on a Rigaku XtaLAB Synergy-i diffractometer using CuKα radiation at 103.15 K.

The single-crystal X-ray analysis further verified the structure of the synthesized triazole derivatives 11a and 12d. Briefly, the crystals were formed via the slow evaporation solution technique with ethyl alcohol. Graphite monochromatized Cu Kα radiation (λ = 1.54184 Å) was used to measure the X-ray diffraction intensity data at 293 K using the X-ray scan method on a Rigaku XtaLAB Synergy-i single-crystal X-ray diffractometer with a CCD-detector (HyPix-Bantam). The structure of compounds 11a and 12d was established by the direct method using the Olex2-1.5 software.⁵² Then, it was refined using the full-matrix least-squares method on F2 by SHELXL.^{53 (link)}Fig. 9 and 10 show the thermal ellipsoid plot prepared using ORTEP III⁵⁴ of compounds 11a and 12d, which were crystallized in an orthorhombic and triclinic system with the Pbcn and P̄1 space group, respectively. Table 1 provides information about the single crystal X-ray crystallographic structures of compounds 11a and 12d.

All the chemicals and solvents used in the current study were purchased from E. Merck (India) and Sigma-Aldrich. The reactions during synthesis were monitored via thin layer chromatography (TLC) on precoated silica gel 60 F254 (mesh), and the spots were visualized using UV light. Silica gel (60–120 mesh) was employed for column chromatography. The melting points of all the synthesized compounds were determined using the open capillary method and may be uncorrected. The structural assignments of the synthesized products were based on ¹H NMR, ¹³C NMR, ¹⁹F NMR, HRMS, IR and single-crystal XRD. NMR data were collected using a 400 MHz, JEOL JNM-ECS spectrometer in DMSO-d₆ and CDCl₃ using TMS as the internal standard and Delta software to process the data. In the reported spectral data, abbreviations such as s = singlet, bs = broad singlet, d = doublet, dd = doublet of doublets, t = triplet, and m = multiple are used. Mass data was produced with the use of a Bruker Compass spectrometer. X-ray analysis was performed using a Rigaku XtaLAB Synergy-i single crystal X-ray diffractometer with a CCD detector (HyPix-Bantam) using graphite monochromatized Cu Kα radiation (λ = 1.54184 Å).