D max 3c x ray diffractometer

The morphology and microstructure are measured on scanning electron microscope (SEM, 15 kV, JEOL 6500F). Moreover, 4-mercaptobenzoic acid (4-MBA) is purchased from Sigma-Aldrich Co Ltd. X-ray diffraction (XRD is performed on the Rigaku D/MAX 3C X-ray diffractometer with Cu Kα radiation (λ = 1.5418 Å)). The UV-Vis spectrum is obtained by Shimadzu UV-3600 spectrophotometer (Kyoto, Japan). The Raman spectrum is collected on Renishaw Raman with a spectral resolution of 1 cm⁻¹ (London, UK, 2000 confocal microscope spectrometer). The Raman laser wavelength is 785 nm, the power is 500 mw, and the single acquisition time is 1000 ms.

SEM characterizations were performed on a JEOL-6500F (JEOL LTD., Tokyo, Japan) scanning electron microscope with an acceleration voltage of 15 kV. X-ray diffraction (XRD) patterns were obtained using a Rigaku D/MAX 3C X-ray diffractometer (Rigaku Corporation, Tokyo, Japan) with Cu Kα radiation. Raman spectra were measured with a Renishaw Raman system at a laser wavelength of 633 nm. The laser beam was focused on the sample at 50 × long-range objective for characterization. The signal acquisition time was set to 10 s. Ultraviolet-visible (UV-Vis) spectra were measured by a SHIMADTU ultraviolet spectrophotometer (UV-3600).

The loading amounts of Ag and H₃PW₁₂O₄₀ in the composite films were determined by a Leeman Prodigy Spec inductively coupled plasma atomic emission spectrometer. X-ray diffraction (XRD) patterns were obtained on a Rigaku D/max-3c X-ray diffractometer (Cu Kα radiation, λ = 0.15405 nm). UV-Vis diffuse reflectance spectra (UV-Vis/DRS) were recorded on a Cary 500 UV-Vis-NIR spectrophotometer. X-ray photoelectron spectroscopy (XPS) was performed on a VG-ADES 400 instrument with Mg Kα-ADES source at a residual gas pressure lower than 10⁻⁸ Pa. Raman scattering spectra were recorded on a Jobin-Yvon HR 800 instrument with an Ar⁺ laser source of 488 nm wavelength in a macroscopic configuration. Field-emission scanning electron micrographs (FESEM) were obtained using a JEOL 6340 F scanning electron microscope. Nitrogen porosimetry was measured by a Micromeritics ASAP 2020. Surface areas were calculated by Brunauer-Emmett-Teller (BET) equation. Pore size distributions were calculated by BJH model based on the nitrogen desorption isotherm (samples were degassed for 1 h under vacuum at 363 K, and then for 12 h at 473 K). Transmission electron microscope (TEM) micrographs, high resolution TEM (HRTEM), and selected area electron diffraction (SAED) micrographs were recorded by a JEM-2100F HRTEM at an accelerating voltage of 200 kV.