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Quanta 450 electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Quanta 450 is a high-performance scanning electron microscope designed for versatile imaging and analysis applications. It features a stable electron column, advanced detectors, and a user-friendly interface to enable high-resolution imaging of a wide range of samples.

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6 protocols using quanta 450 electron microscope

1

Scanning Electron Microscopy of Biomaterial Scaffolds

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A Quanta 450 electron microscope (FEI, Hillsboro, OR, USA) was used for the scanning electron microscopy (SEM) of the scaffold in the high vacuum mode. An ion sputter (Emitech K550X, Quorum Technologies, Kent, UK) was used for the coating of the samples with a thin layer of gold. The adsorption of various components from the blood plasma, SBF, and PBS following exposure was qualitatively characterized via energy-dispersive spectrometry (EDS) using a Quanta 450 scanning electron microscope (FEI, Hillsboro, OR, USA) equipped with an Apollo XL Silicon Drift Detector 1 EA EDS extension (EDAX Genesis system, Mahwah, NJ, USA) at a magnification of 1000× and an accelerating voltage of 12.5 kV. Prior to the EDS analysis, dried samples (n = 5) were sputter-coated with carbon in an ion sputter (Emitech K550X, Quorum Technologies, Kent, UK). The weight fractions of the chemical elements incorporated within the dried samples before and after exposure in the media were characterized.
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2

SEM Imaging of Samples with Gold Coating

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Scanning electron microscopy (SEM) was conducted in the high vacuum mode using a Quanta 450 electron microscope (FEI, USA). The samples were coated with a thin layer of gold in an ion sputter (Emitech K550X, Quorum Technologies, U.K.).
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3

Advanced Characterization of Nanomaterials

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XRD data were collected on a Rigaku MiniFlex 600 X-ray diffractometer. SEM images were obtained on a FEI QUANTA 450 electron microscope. The TEM images, aberration-corrected TEM images, HAADF-STEM imaging and EDS mapping were taken on a FEI Titan Themis 80-200 operating at 200 kV. X-ray photoelectron spectroscopy (XPS) analysis was carried out under ultrahigh vacuum (degree of vacuum about 5*10−9 m bar) on Thermo Scientific K-Alpha+ with mono Al Kα source in Voltage of 15 kV and energy of 1486.6 eV.
Synchrotron-based NEXAFS measurements were determined on the soft X-ray spectroscopy beamline at the Australian Synchrotron, which is equipped with a hemispherical electron analyzer and a microchannel plate detector to permit concurrent recording of the total electron, and partial electron yield. Calibration of XPS data was normalized to the photoelectron current of the photon beam, measured on an Au-grid. Raw XANES data were normalized using Igor Pro 8 software.
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4

Seed Surface Wettability and Morphology

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The determination of the wettability and morphology of the surface of the seeds was performed by measuring the water contact angle of the seeds surfaces using the drop method. A 1 µL pure water drop was placed on the surface of a seed, then a picture was taken and the water contact angle was determined using the drop snake plugin of imageJ software [60 ].
The surface of the seeds prior and after the treatments was imaged using Environmental Scanning Electron Microscopy (ESEM) with Quanta 450 electron microscope from FEI (Thermo Fisher Scientific, Hillsboro, OR, USA) in low vacuum mode. The seeds were put on aluminum stubs using double sided carbon tape. The device does not request covering the samples with a metallic layer, so they were analyzed as they were, using 15 kV accelerated electron beam, at different magnifications.
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5

Multi-Technique Structural Characterization of Catalysts

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X-ray powder diffraction (XRD) data were collected on a Rigaku MiniFlex 600 X-Ray diffractometer. Field-emission SEM imaging was determined on a FEI QUANTA 450 electron microscope. High-angle annular dark-field imaging, and EDS mapping, were determined on a FEI Titan Themis 80-200, operating at 200 kV.
The atomic ratio for Re over Ru was analyzed via ICP-MS, Agilent 7500cx instrument. The catalyst was dispersed and dissolved in aqua regia at temperature 25 °C prior to ICP-MS analysis. Dissolved Ru and Re in the electrolyte were analyzed via ICP-MS by diluting the electrolyte two times prior to measurement.
Synchrotron-based NEXAFS measurements were determined on the soft X-ray spectroscopy beamline at the Australian Synchrotron, which is equipped with a hemispherical electron analyzer and a microchannel plate detector to permit concurrent recording of the total electron, and partial electron, yield. Calibration of XPS data were normalized to the photoelectron current of the photon beam, measured on an Au-grid. Raw XANES data were normalized using Igor Pro 8 software.
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6

Large-Field SEM-EDS Analysis of Fossils

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The SEM-EDS analyses were performed in the Central Analítica at the Universidade Federal do Ceará (UFC). The large-field scan was carried out in a Quanta-450 electron microscope (FEI) with a field-emission gun (FEG) equipped with a gaseous analytical detector (GAD), 10 mm working distance and a X-ray detector (model 150, Oxford) for energy dispersive X-ray spectroscopy (EDS). Images were acquired at beam acceleration voltage of 20 kV, using a resolution of 1024 × 884 pixels per image. With the aim to maintain the integrity of the samples for future analysis we avoid to use a thin layer of gold-palladium on the fossil. Thus, the fossil material was inserted into the microscope chamber without previous preparation. The analyses were done in a low vacuum to avoid sample charging. To generate the large-field images, an overlapping of marginal areas (a border which contains 20% of the image area) of adjacent images acquired independently after translations of the microscope stage along the x and y axes was performed.
The images were processed and exported on AZtec software (version 3.0/Oxford).
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