The largest database of trusted experimental protocols

Nanoscope 3 atomic force microscope

Manufactured by Veeco
Sourced in United States

The Nanoscope III is an atomic force microscope (AFM) developed by Veeco. It is designed to provide high-resolution imaging and analysis of surface topography at the nanoscale level. The Nanoscope III uses a sharp probe to scan the surface of a sample, allowing it to measure surface features with exceptional detail.

Automatically generated - may contain errors

Lab products found in correlation

3 protocols using nanoscope 3 atomic force microscope

1

Atomic Force Microscopy of Fibrils

Check if the same lab product or an alternative is used in the 5 most similar protocols
Samples were diluted 60-times with deionized water. A small droplet (8 μl) of fibrils suspension was swiftly deposited onto freshly cleaved mica and left to dry overnight. AFM tapping-mode measurements were carried out using a Nanoscope III atomic force microscope from Veeco, U.S.A., and TAP300-Al sensors (res. frequency 300 kHz) from BudgetSensors, Bulgaria. Other experimental parameters were the same as in earlier studies24 (link).
+ Open protocol
+ Expand
2

AFM Imaging of Diluted Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
Collected samples for atomic force microscopy (AFM) imaging were diluted 60 times with deionized water. A small droplet (8 μl) of thus obtained solution was swiftly deposited onto freshly cleaved mica and left to dry overnight. AFM tapping-mode measurements were carried out using Nanoscope III atomic force microscope (Veeco, USA) and TAP300-Al sensors, resonance frequency 300 kHz (BudgetSensors, Bulgaria).
+ Open protocol
+ Expand
3

PLGA Nanoparticle Characterization by AFM

Check if the same lab product or an alternative is used in the 5 most similar protocols
Samples of isopropanol-precipitated PLGA (washed with excess of isopropanol several times) or of β 2 -PLGA aggregates were diluted approximately 100 times with excess of isopropanol or acidified H 2 O (pH 4.1), respectively. A small droplet of 8 µl of either PLGA sample was deposited onto freshly cleaved mica and left to dry for 24 hours. AFM tappingmode measurements were carried out using Nanoscope III atomic force microscope (Veeco, USA) and TAP300-Al sensors with cantilever resonance frequency of 300 kHz (BudgetSensors, Bulgaria).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!