Film morphology images were tested by field‐emission scanning electron microscopy (SU8100, Hitachi). The matter phase was recorded by an X‐ray diffractometer (D/MAX‐III‐B‐40KV, Cu Kα radiation, λ = 0.15 418 nm). Fourier transform infrared (FTIR) spectroscopy was carried out using a Fourier infrared spectrometer (NICOLET 6700, BRUKER). The light absorption curve was measured by using a UV–visible spectrophotometer (Thermo Scientific, Escalab 250Xi). XPS was carried out using an Escalab 250Xi. The photoelectric properties of the samples were measured using a Keithley 4200 Source Meter with a monochromator (Zolix, Omni‐λ 3009) to generate monochromatic light. The light intensity was calibrated by using a standard Si cell. The bright‐field optical microscope (BFOM) image was recorded by an optical microscope (PSM 1000, Motic). The photoluminescence (PL) was measured using an Edinburgh instrument (LifeSpec II).
Nicolet 6700
Manufactured by Bruker
Sourced in Germany, United States
The NICOLET 6700 is a Fourier Transform Infrared (FTIR) spectrometer manufactured by Bruker. It is a versatile laboratory instrument designed for a wide range of analytical and research applications. The NICOLET 6700 provides high-performance infrared spectroscopy capabilities, enabling the identification and characterization of a variety of materials and samples.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
Su8100, by Hitachi (1 mentions)
Psm 1000, by Motic (1 mentions)
Omni λ 3009, by Zolix (1 mentions)
Mpd bm 3, by Sanyo (1 mentions)
S 4800, by Hitachi (1 mentions)
Uv 2550, by Shimadzu (1 mentions)
Regulus 8100, by Hitachi (1 mentions)
Su8010, by Hitachi (1 mentions)
Axs d8 focus, by Bruker (1 mentions)
5 protocols using nicolet 6700
1
Comprehensive Material Characterization Protocol
2
Spectroscopic Characterization of Compounds
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The analytical grade reagents, solvents and other required chemicals were purchased from Sigma Aldrich and Merck (Germany). For melting point determination, a digitalized Gallenkamp (SANYO) model MPD BM 3.5 instrument was used. The characterization of compounds was carried out using, a NICOLET 6700 acquired by thermo scientific and the attenuated total reflectance (ATR), for FTR, and Bruker AM-300 spectrophotometer (300 and 75 MHz) was used for the determination of 1H NMR and 13C NMR.
3
Comprehensive Characterization of Quercetin Derivatives
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The FT-IR spectra of DOX, Quercetin, QC, QCD and QCDA were obtained using a Fourier transform infrared spectrometer (FTIR, Nicolet 6700, Bruker, Karlsruhe, Germany). The UV−vis spectral data of Quercetin, QC, QCD and QCDA were captured using a spectrophotometer (UV-2550, SHIMADZU, Kyoto, Japan). The surface chemistry of QCDA was investigated by energy-dispersive X-ray spectroscopy (EDS, S-4800, Hitachi, Tokyo Met., Japan). The hydrodynamic size and zeta potential of QC, QCD and QCDA were measured by dynamic light scattering (DLS, Zetasizer Nano ZS, Malvern Ltd., Worcestershire, UK). The morphology of QC, QCD and QCDA were obtained using scanning electron microscopy (SEM, Regulus8100, Hitachi, Tokyo Met., Japan).
4
Spectroscopic Characterization of Compounds
5
Comprehensive Characterization of SDS-LDH and Inorganic LDH Composites
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The SDS-LDH composites and inorganic LDH composites were characterized using different physicochemical techniques. SEM images were captured using a SU8010 (Hitachi Co., Japan) instrument at a voltage of 1 kV and a resolution of up to 1.3 nm. Elemental chemical analysis was conducted through atomic absorption spectrometry on an APOLLO XP (Ametek Co., USA) instrument. EDX spectroscopy revealed the main elementals analysis results, including the weight (%) and atomic ratio of the SDS-LDH and inorganic LDH composites. FT-IR was performed using a Nicolet6700 (Bruker, USA) instrument. The XRD diagrams were collected at room temperature under air conditions by using a Bruker AXS D8-Focus X-ray diffractometer instrument with Cu Kα radiation (λ = 0.154050 nm) and quartz as the external standard. The interlamellar pacing was calculated using the following equation: where d (nm) is the interlamellar spacing, n (n = 1) is the diffraction series, λ (λ = 0.154050 nm) is the wavelength of the X-ray, and θ represents the half of the diffraction angle.
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