The concentrations of P in the filtrates were determined by molybdenum blue spectrophotometric method with a UV-2600 UV/vise spectrometer (Shimadzu, Japan). Portions of CSB and Fe-CSB were digested with HNO3–HF–HClO4, and the contents of total Fe, Al, Mg, Ca and TP of the CSB and Fe-CSB were analyzed by ICP-AES (PerkinElmer, USA). The textural characteristics of the CSB and Fe-CSB were determined using a N2 adsorption–desorption test at 77 K (ASAP-3000, Micromeritics). Scanning electron microscope (Quanta 200, Holland) was applied to analyze the surface morphology and probe the surface elements of the CSB and Fe-CSB. X-ray diffraction (XRD) of randomly oriented powders of the samples was performed on a Phillips PW 3050/60 diffractometer using monochromated Cu Kα radiation, operating at 40 kV and 30 mA, from 10° to 80° (2θ), with a scanning step of 0.02° at 1° per minute. The analyses of four primary elements (C, H, O and N) in materials were conducted using an elemental analyzer (ThermoFinnigan, EA112 CHN, USA). The changes between the surface groups before and after phosphate were recorded by FTIR spectroscopy (Bruker, Vector 22, Germany). A B1-ZetaPlus (Brookhaven Instruments, USA) apparatus was used to measure the zeta potential of the CSBs before and after phosphate adsorption.
Asap 3000
Manufactured by Micromeritics
Sourced in United States
The ASAP-3000 is a surface area and porosity analyzer from Micromeritics. It is designed to accurately measure the surface area, pore volume, and pore size distribution of solid materials. The instrument uses adsorption and desorption isotherms to determine these properties.
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Lab products found in correlation
2 protocols using asap 3000
1
Characterization of Phosphate Adsorption on Chemically Modified Biochar
2
Comprehensive Catalyst Characterization Protocol
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The metal content was determined by ZSX PrimusⅡX-ray fluorescence (XRF) instrument produced by Japan Science and Technology Company (Tokyo). X-ray tube voltage is 50 kV, tube current is 50 mA, and diaphragm aperture is 20 mm.
The catalyst phase structure was determined by D/max-3C X-ray diffractometer (XRD) produced by Japan Science Corporation (Tokyo) with the following settings: Cu target, Kα radiation, tube voltage 40 kV, tube current 20 mA, scanning range: 5°–50°, and scanning speed 4°/min.
The specific surface area and pore volume of the catalyst were measured by Micromeritics ASAP 3000 automatic physical adsorption instrument produced by Micromeritics Instruments Corporation (Norcross, GA, USA). The surface area was deduced from the adsorption isotherms using the BET equation. The samples were degassed at 300°C for 4 h (residual pressure value was 0.13 Pa), and then nitrogen physical adsorption was determined at -196°C.
The catalyst surface morphology was observed by ULTRA PLUS thermal field emission scanning electron microscopy produced by Zeiss optical instruments (Oberkochen, Germany). Secondary electron resolution was 1.0 nm (15 kV) 1.9 nm (1 kV); electron gun: LaB6 thermal field emission electron gun; acceleration voltage: 0.1–30 kV; magnification: ×12 ∼ X10,000.
The catalyst phase structure was determined by D/max-3C X-ray diffractometer (XRD) produced by Japan Science Corporation (Tokyo) with the following settings: Cu target, Kα radiation, tube voltage 40 kV, tube current 20 mA, scanning range: 5°–50°, and scanning speed 4°/min.
The specific surface area and pore volume of the catalyst were measured by Micromeritics ASAP 3000 automatic physical adsorption instrument produced by Micromeritics Instruments Corporation (Norcross, GA, USA). The surface area was deduced from the adsorption isotherms using the BET equation. The samples were degassed at 300°C for 4 h (residual pressure value was 0.13 Pa), and then nitrogen physical adsorption was determined at -196°C.
The catalyst surface morphology was observed by ULTRA PLUS thermal field emission scanning electron microscopy produced by Zeiss optical instruments (Oberkochen, Germany). Secondary electron resolution was 1.0 nm (15 kV) 1.9 nm (1 kV); electron gun: LaB6 thermal field emission electron gun; acceleration voltage: 0.1–30 kV; magnification: ×12 ∼ X10,000.
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