S440 scanning electron microscope
The S440 Scanning Electron Microscope is a high-performance instrument designed for detailed surface analysis and imaging. It utilizes a focused electron beam to scan the surface of a sample, producing high-resolution images that reveal the topography and composition of the material under examination.
Lab products found in correlation
3 protocols using s440 scanning electron microscope
SEM Preparation of Candida albicans
Porifera Collection and Examination in the Antarctic
Dissociated Spicule Analysis Protocol
The type material was deposited at the Museo Nacional de Ciencias Naturales, Madrid, Spain (MNCN), Natural History Museum, London, United Kingdom (NHM) and Museum National d'Histoire Naturelle, Paris, France (MNHN).
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